IT1017127B - LAYER SYSTEM FOR THE ABSORPTION OF X-RAYS - Google Patents

LAYER SYSTEM FOR THE ABSORPTION OF X-RAYS

Info

Publication number
IT1017127B
IT1017127B IT25123/74A IT2512374A IT1017127B IT 1017127 B IT1017127 B IT 1017127B IT 25123/74 A IT25123/74 A IT 25123/74A IT 2512374 A IT2512374 A IT 2512374A IT 1017127 B IT1017127 B IT 1017127B
Authority
IT
Italy
Prior art keywords
rays
absorption
layer system
layer
Prior art date
Application number
IT25123/74A
Other languages
Italian (it)
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Application granted granted Critical
Publication of IT1017127B publication Critical patent/IT1017127B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21F—PROTECTION AGAINST X-RADIATION, GAMMA RADIATION, CORPUSCULAR RADIATION OR PARTICLE BOMBARDMENT; TREATING RADIOACTIVELY CONTAMINATED MATERIAL; DECONTAMINATION ARRANGEMENTS THEREFOR
    • G21F1/00—Shielding characterised by the composition of the materials
    • G21F1/02—Selection of uniform shielding materials
    • G21F1/08—Metals; Alloys; Cermets, i.e. sintered mixtures of ceramics and metals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Ceramic Engineering (AREA)
  • Metallurgy (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
IT25123/74A 1973-07-18 1974-07-12 LAYER SYSTEM FOR THE ABSORPTION OF X-RAYS IT1017127B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19732336652 DE2336652A1 (en) 1973-07-18 1973-07-18 LAYER SYSTEM FOR THE ABSORPTION OF X-RAYS

Publications (1)

Publication Number Publication Date
IT1017127B true IT1017127B (en) 1977-07-20

Family

ID=5887354

Family Applications (1)

Application Number Title Priority Date Filing Date
IT25123/74A IT1017127B (en) 1973-07-18 1974-07-12 LAYER SYSTEM FOR THE ABSORPTION OF X-RAYS

Country Status (9)

Country Link
US (1) US3925678A (en)
JP (1) JPS5044882A (en)
BE (1) BE817811A (en)
DE (1) DE2336652A1 (en)
DK (1) DK385174A (en)
FR (1) FR2238218B3 (en)
IT (1) IT1017127B (en)
LU (1) LU70538A1 (en)
NL (1) NL7409479A (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4626688A (en) 1982-11-26 1986-12-02 Barnes Gary T Split energy level radiation detection
US4764945A (en) * 1984-10-05 1988-08-16 Kawasaki Steel Corp. Method of measuring layer thickness and composition of alloy plating
US4821301A (en) * 1986-02-28 1989-04-11 Duke University X-ray reflection method and apparatus for chemical analysis of thin surface layers
US6677162B1 (en) 2000-07-18 2004-01-13 Uop Llc Process of parallel sample preparation
US6806093B2 (en) * 2000-07-18 2004-10-19 Uop Llc Process of parallel sample preparation
EP1319175A2 (en) * 2000-07-18 2003-06-18 Uop Llc Process of parallel sample preparation
US7341414B2 (en) * 2005-05-02 2008-03-11 Cummins Inc. Fastener and method for reducing stress failure in an engine component
DE102011109822B4 (en) * 2011-08-09 2019-10-10 Ketek Gmbh Device for a radiation detector and radiation detector with the device
US20230251214A1 (en) * 2020-07-14 2023-08-10 Shimadzu Corporation X ray fluorescence analyzer

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3644736A (en) * 1968-11-05 1972-02-22 Giken Kogyo Kk Back-scattering absorber materials for gamma-rays

Also Published As

Publication number Publication date
LU70538A1 (en) 1974-11-28
FR2238218A1 (en) 1975-02-14
NL7409479A (en) 1975-01-21
US3925678A (en) 1975-12-09
BE817811A (en) 1974-11-18
DK385174A (en) 1975-03-10
FR2238218B3 (en) 1977-05-06
JPS5044882A (en) 1975-04-22
DE2336652A1 (en) 1975-01-30

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