IT1006824B - Procedimento ed apparecchiatura par ticolarmente per la rivelazione di un segno ottico su un materiale ad alta temperatura - Google Patents

Procedimento ed apparecchiatura par ticolarmente per la rivelazione di un segno ottico su un materiale ad alta temperatura

Info

Publication number
IT1006824B
IT1006824B IT1923774A IT1923774A IT1006824B IT 1006824 B IT1006824 B IT 1006824B IT 1923774 A IT1923774 A IT 1923774A IT 1923774 A IT1923774 A IT 1923774A IT 1006824 B IT1006824 B IT 1006824B
Authority
IT
Italy
Prior art keywords
procedure
detection
high temperature
temperature material
par ticularly
Prior art date
Application number
IT1923774A
Other languages
English (en)
Italian (it)
Original Assignee
Nippon Kokan Kk
Fuji Toyuki Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Kokan Kk, Fuji Toyuki Kk filed Critical Nippon Kokan Kk
Application granted granted Critical
Publication of IT1006824B publication Critical patent/IT1006824B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/04—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
    • G01B11/046—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving for measuring width

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Optical Transform (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
IT1923774A 1973-01-10 1974-01-09 Procedimento ed apparecchiatura par ticolarmente per la rivelazione di un segno ottico su un materiale ad alta temperatura IT1006824B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP48005140A JPS4994386A (enrdf_load_stackoverflow) 1973-01-10 1973-01-10

Publications (1)

Publication Number Publication Date
IT1006824B true IT1006824B (it) 1976-10-20

Family

ID=11602990

Family Applications (1)

Application Number Title Priority Date Filing Date
IT1923774A IT1006824B (it) 1973-01-10 1974-01-09 Procedimento ed apparecchiatura par ticolarmente per la rivelazione di un segno ottico su un materiale ad alta temperatura

Country Status (4)

Country Link
JP (1) JPS4994386A (enrdf_load_stackoverflow)
FR (1) FR2213510B1 (enrdf_load_stackoverflow)
GB (1) GB1441211A (enrdf_load_stackoverflow)
IT (1) IT1006824B (enrdf_load_stackoverflow)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50104046A (enrdf_load_stackoverflow) * 1974-01-18 1975-08-16
JPS5245361A (en) * 1975-10-07 1977-04-09 Nippon Kokan Kk <Nkk> Method of detecting position of molten metal stream
JPS61243391A (ja) * 1985-04-19 1986-10-29 Kiiensu:Kk 半導体レ−ザ光電スイツチのレ−ザ光照射位置確認方法
US5517861A (en) * 1994-10-11 1996-05-21 United Technologies Corporation High temperature crack monitoring apparatus
US5539656A (en) * 1994-10-11 1996-07-23 United Technologies Corporation Crack monitoring apparatus
JPH09210622A (ja) * 1996-02-07 1997-08-12 Kobe Steel Ltd 高温物体の距離測定方法及び装置
US6859285B1 (en) 1999-08-31 2005-02-22 Og Technologies, Inc. Optical observation device and method for observing articles at elevated temperatures

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3187185A (en) * 1960-12-22 1965-06-01 United States Steel Corp Apparatus for determining surface contour
JPS5340343B2 (enrdf_load_stackoverflow) * 1972-09-05 1978-10-26

Also Published As

Publication number Publication date
DE2401105B2 (de) 1976-03-25
FR2213510B1 (enrdf_load_stackoverflow) 1976-10-08
FR2213510A1 (enrdf_load_stackoverflow) 1974-08-02
GB1441211A (en) 1976-06-30
DE2401105A1 (de) 1974-07-18
JPS4994386A (enrdf_load_stackoverflow) 1974-09-07

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