IN2015DN02935A - - Google Patents

Info

Publication number
IN2015DN02935A
IN2015DN02935A IN2935DEN2015A IN2015DN02935A IN 2015DN02935 A IN2015DN02935 A IN 2015DN02935A IN 2935DEN2015 A IN2935DEN2015 A IN 2935DEN2015A IN 2015DN02935 A IN2015DN02935 A IN 2015DN02935A
Authority
IN
India
Prior art keywords
address space
memory
data elements
accesses
memory controller
Prior art date
Application number
Other languages
English (en)
Inventor
Gabriel H Loh
Vilas K Sridharan
Original Assignee
Advanced Micro Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advanced Micro Devices Inc filed Critical Advanced Micro Devices Inc
Publication of IN2015DN02935A publication Critical patent/IN2015DN02935A/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1044—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices with specific ECC/EDC distribution

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
IN2935DEN2015 2012-10-11 2013-10-08 IN2015DN02935A (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/649,745 US8984368B2 (en) 2012-10-11 2012-10-11 High reliability memory controller
PCT/US2013/063881 WO2014058879A1 (fr) 2012-10-11 2013-10-08 Unité de gestionnaire de mémoire à haute fiabilité

Publications (1)

Publication Number Publication Date
IN2015DN02935A true IN2015DN02935A (fr) 2015-09-18

Family

ID=49510512

Family Applications (1)

Application Number Title Priority Date Filing Date
IN2935DEN2015 IN2015DN02935A (fr) 2012-10-11 2013-10-08

Country Status (7)

Country Link
US (1) US8984368B2 (fr)
EP (1) EP2907030A1 (fr)
JP (1) JP6101807B2 (fr)
KR (1) KR101626040B1 (fr)
CN (1) CN104871137B (fr)
IN (1) IN2015DN02935A (fr)
WO (1) WO2014058879A1 (fr)

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US9800271B2 (en) * 2015-09-14 2017-10-24 Qualcomm Incorporated Error correction and decoding
US10013212B2 (en) * 2015-11-30 2018-07-03 Samsung Electronics Co., Ltd. System architecture with memory channel DRAM FPGA module
US10031801B2 (en) * 2015-12-01 2018-07-24 Microsoft Technology Licensing, Llc Configurable reliability for memory devices
WO2018220849A1 (fr) * 2017-06-02 2018-12-06 ウルトラメモリ株式会社 Module semi-conducteur
US11494087B2 (en) * 2018-10-31 2022-11-08 Advanced Micro Devices, Inc. Tolerating memory stack failures in multi-stack systems
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KR20240045345A (ko) 2019-04-15 2024-04-05 양쯔 메모리 테크놀로지스 씨오., 엘티디. 프로세서 및 동적 랜덤 액세스 메모리를 갖는 본디드 반도체 장치 및 이를 형성하는 방법
CN115413367A (zh) 2020-02-07 2022-11-29 日升存储公司 具有低有效延迟的高容量存储器电路
WO2021158994A1 (fr) * 2020-02-07 2021-08-12 Sunrise Memory Corporation Mémoire quasi volatile de niveau système
US11656937B2 (en) * 2020-08-25 2023-05-23 Micron Technology, Inc. Techniques for error detection and correction in a memory system

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Also Published As

Publication number Publication date
US20140108885A1 (en) 2014-04-17
KR20150070252A (ko) 2015-06-24
JP2015535101A (ja) 2015-12-07
EP2907030A1 (fr) 2015-08-19
WO2014058879A1 (fr) 2014-04-17
JP6101807B2 (ja) 2017-03-22
US8984368B2 (en) 2015-03-17
CN104871137B (zh) 2019-02-01
CN104871137A (zh) 2015-08-26
KR101626040B1 (ko) 2016-06-13

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