IN2015DN02848A - - Google Patents

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Publication number
IN2015DN02848A
IN2015DN02848A IN2848DEN2015A IN2015DN02848A IN 2015DN02848 A IN2015DN02848 A IN 2015DN02848A IN 2848DEN2015 A IN2848DEN2015 A IN 2848DEN2015A IN 2015DN02848 A IN2015DN02848 A IN 2015DN02848A
Authority
IN
India
Prior art keywords
equipment
calculating
time period
thermal mass
temperature
Prior art date
Application number
Other languages
English (en)
Inventor
James William Vangilder
Christopher M Healey
Xuanhang Zhang
Zack Pardey
Original Assignee
Schneider Electric It Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Schneider Electric It Corp filed Critical Schneider Electric It Corp
Publication of IN2015DN02848A publication Critical patent/IN2015DN02848A/en

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D23/00—Control of temperature
    • G05D23/19—Control of temperature characterised by the use of electric means
    • G05D23/1917—Control of temperature characterised by the use of electric means using digital means
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B13/00—Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion
    • G05B13/02—Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric
    • G05B13/04—Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric involving the use of models or simulators
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/3058—Monitoring arrangements for monitoring environmental properties or parameters of the computing system or of the computing system component, e.g. monitoring of power, currents, temperature, humidity, position, vibrations
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/20—Design optimisation, verification or simulation
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00—Constructional details common to different types of electric apparatus
    • H05K7/20—Modifications to facilitate cooling, ventilating, or heating
    • H05K7/20709—Modifications to facilitate cooling, ventilating, or heating for server racks or cabinets; for data centers, e.g. 19-inch computer racks
    • H05K7/20836—Thermal management, e.g. server temperature control

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Automation & Control Theory (AREA)
  • Evolutionary Computation (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Thermal Sciences (AREA)
  • Artificial Intelligence (AREA)
  • Software Systems (AREA)
  • Medical Informatics (AREA)
  • Computing Systems (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Health & Medical Sciences (AREA)
  • Geometry (AREA)
  • Cooling Or The Like Of Electrical Apparatus (AREA)
  • Air Conditioning Control Device (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
IN2848DEN2015 2012-09-21 2012-09-21 IN2015DN02848A (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2012/056763 WO2014046677A1 (en) 2012-09-21 2012-09-21 Method and apparatus for characterizing thermal transient performance

Publications (1)

Publication Number Publication Date
IN2015DN02848A true IN2015DN02848A (zh) 2015-09-11

Family

ID=50341811

Family Applications (1)

Application Number Title Priority Date Filing Date
IN2848DEN2015 IN2015DN02848A (zh) 2012-09-21 2012-09-21

Country Status (6)

Country Link
US (1) US10025330B2 (zh)
EP (2) EP2898376A4 (zh)
CN (1) CN104797990B (zh)
AU (1) AU2012390299B2 (zh)
IN (1) IN2015DN02848A (zh)
WO (1) WO2014046677A1 (zh)

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US11256967B2 (en) * 2020-01-27 2022-02-22 Kla Corporation Characterization system and method with guided defect discovery

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Also Published As

Publication number Publication date
AU2012390299B2 (en) 2017-06-01
CN104797990A (zh) 2015-07-22
WO2014046677A1 (en) 2014-03-27
AU2012390299A1 (en) 2015-04-30
CN104797990B (zh) 2017-10-24
EP3902383B1 (en) 2024-05-08
US10025330B2 (en) 2018-07-17
EP2898376A4 (en) 2016-05-18
US20150234397A1 (en) 2015-08-20
EP3902383A1 (en) 2021-10-27
EP2898376A1 (en) 2015-07-29
EP3902383C0 (en) 2024-05-08

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