IN2015DE00209A - - Google Patents
Info
- Publication number
- IN2015DE00209A IN2015DE00209A IN209DE2015A IN2015DE00209A IN 2015DE00209 A IN2015DE00209 A IN 2015DE00209A IN 209DE2015 A IN209DE2015 A IN 209DE2015A IN 2015DE00209 A IN2015DE00209 A IN 2015DE00209A
- Authority
- IN
- India
- Prior art keywords
- measuring
- monitoring
- sequence
- sequences
- monitoring data
- Prior art date
Links
- 238000012544 monitoring process Methods 0.000 abstract 7
- 238000000034 method Methods 0.000 abstract 3
- 238000005259 measurement Methods 0.000 abstract 2
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/047—Accessories, e.g. for positioning, for tool-setting, for measuring probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8803—Visual inspection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
- G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by quality surveillance of production
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/001—Industrial image inspection using an image reference approach
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/60—Analysis of geometric attributes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/061—Sources
- G01N2201/06113—Coherent sources; lasers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/10—Scanning
- G01N2201/102—Video camera
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/12—Circuits of general importance; Signal processing
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10016—Video; Image sequence
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Quality & Reliability (AREA)
- Theoretical Computer Science (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Automation & Control Theory (AREA)
- General Engineering & Computer Science (AREA)
- Geometry (AREA)
- Signal Processing (AREA)
- Image Analysis (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Image Processing (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP14157229.7A EP2913148B8 (fr) | 2014-02-28 | 2014-02-28 | Procédé et système d'analyse de données de supervision de procédé |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| IN2015DE00209A true IN2015DE00209A (fr) | 2015-09-04 |
Family
ID=50184807
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IN209DE2015 IN2015DE00209A (fr) | 2014-02-28 | 2015-01-23 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9582870B2 (fr) |
| EP (1) | EP2913148B8 (fr) |
| CN (1) | CN104881863B (fr) |
| BR (1) | BR102015004272A2 (fr) |
| IN (1) | IN2015DE00209A (fr) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10197394B2 (en) * | 2013-11-06 | 2019-02-05 | Hexagon Metrology (Israel) Ltd. | Method and system for analyzing spatial measuring data |
| JP6628539B2 (ja) * | 2015-10-06 | 2020-01-08 | 株式会社日立製作所 | 生産計画指示装置、生産計画指示システム、及び生産計画指示方法 |
| US20170228440A1 (en) * | 2016-02-10 | 2017-08-10 | Virdree BURNS | Method of facilitating pattern recognition through organizing data based on their sequencing relationship |
| US10783397B2 (en) | 2016-06-29 | 2020-09-22 | Intel Corporation | Network edge device with image thresholding |
| US10666909B2 (en) | 2016-06-29 | 2020-05-26 | Intel Corporation | Methods and apparatus to perform remote monitoring |
| EP3339801B1 (fr) * | 2016-12-20 | 2021-11-24 | Hexagon Technology Center GmbH | Système de fabrication auto-contrôlé, unité de suivi de la production et utilisation de l'unité de suivi |
| EP3364374A1 (fr) * | 2017-02-20 | 2018-08-22 | My Virtual Reality Software AS | Procédé pour visualiser des données tridimensionnelles |
| GB201708730D0 (en) | 2017-06-01 | 2017-07-19 | Renishaw Plc | Production and measurement of work workpieces |
| EP3459713A1 (fr) * | 2017-09-26 | 2019-03-27 | Siemens Aktiengesellschaft | Procédé de traitement assisté par ordinateur d'informations sur la qualité d'un objet et appareil d'assistance respectif |
| EP3467430B1 (fr) * | 2017-10-06 | 2023-02-15 | Bayerische Motoren Werke Aktiengesellschaft | Procédé et système pour balayer et mesurer optiquement des objets |
| JP7025266B2 (ja) * | 2018-03-29 | 2022-02-24 | パナソニック デバイスＳｕｎｘ株式会社 | 画像検査システム |
| CN109003326B (zh) * | 2018-06-05 | 2021-07-23 | 湖北亿咖通科技有限公司 | 一种基于虚拟世界的虚拟激光雷达数据生成方法 |
| FR3090088B1 (fr) * | 2018-12-12 | 2021-06-18 | Saint Gobain | Procédé de mesure des écarts géométriques entre les surfaces incurvées d'une pluralité de matériaux à évaluer et une surface incurvée d’un matériau de référence |
| EP4290322A1 (fr) * | 2022-06-07 | 2023-12-13 | Dassault Systèmes | Inférence de problèmes émergents dans la fabrication de produits |
| CN117723550A (zh) * | 2024-02-18 | 2024-03-19 | 宁德时代新能源科技股份有限公司 | 产品质量检测设备的检测方法、装置和电子设备 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5105183A (en) * | 1989-04-27 | 1992-04-14 | Digital Equipment Corporation | System for displaying video from a plurality of sources on a display |
| DE19544240A1 (de) | 1994-12-01 | 1996-06-05 | Volkswagen Ag | Verfahren und Vorrichtung zur Ermittlung der räumlichen Koordinaten von Objektpunkten und Verfahren zur Herstellung einer Karosserie |
| JP3295733B2 (ja) * | 1996-11-14 | 2002-06-24 | 松下電工株式会社 | 制御動作の解析方法及びこれを用いた解析装置 |
| JP4096533B2 (ja) * | 2001-08-31 | 2008-06-04 | 松下電工株式会社 | 画像処理検査システム |
| US7672500B2 (en) * | 2003-07-24 | 2010-03-02 | Cognitens Ltd. | System and method for monitoring and visualizing the output of a production process |
| WO2005124317A2 (fr) * | 2004-06-09 | 2005-12-29 | Cognex Technology And Investment Corporation | Procede et appareil de detection et d'inspection visuelles des objets |
| US9052294B2 (en) * | 2006-05-31 | 2015-06-09 | The Boeing Company | Method and system for two-dimensional and three-dimensional inspection of a workpiece |
| EP2535781A1 (fr) * | 2011-06-17 | 2012-12-19 | ABB Research Ltd. | Collecte de données dans une installation industrielle |
| EP2700570A1 (fr) | 2012-08-20 | 2014-02-26 | Hexagon Metrology S.p.A. | Dispositif et procédé de positionnement mécanique |
-
2014
- 2014-02-28 EP EP14157229.7A patent/EP2913148B8/fr active Active
-
2015
- 2015-01-23 IN IN209DE2015 patent/IN2015DE00209A/en unknown
- 2015-02-12 CN CN201510172277.7A patent/CN104881863B/zh not_active Expired - Fee Related
- 2015-02-26 BR BR102015004272A patent/BR102015004272A2/pt not_active Application Discontinuation
- 2015-02-27 US US14/634,544 patent/US9582870B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US20150248755A1 (en) | 2015-09-03 |
| EP2913148A1 (fr) | 2015-09-02 |
| EP2913148B1 (fr) | 2020-02-12 |
| CN104881863A (zh) | 2015-09-02 |
| US9582870B2 (en) | 2017-02-28 |
| CN104881863B (zh) | 2019-04-30 |
| EP2913148B8 (fr) | 2020-03-25 |
| BR102015004272A2 (pt) | 2015-12-22 |
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