IN2015DE00209A - - Google Patents

Info

Publication number
IN2015DE00209A
IN2015DE00209A IN209DE2015A IN2015DE00209A IN 2015DE00209 A IN2015DE00209 A IN 2015DE00209A IN 209DE2015 A IN209DE2015 A IN 209DE2015A IN 2015DE00209 A IN2015DE00209 A IN 2015DE00209A
Authority
IN
India
Prior art keywords
measuring
monitoring
sequence
sequences
monitoring data
Prior art date
Application number
Inventor
Tal Vagman
Jordi Edo Abella
Original Assignee
Hexagon Metrology Israel Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hexagon Metrology Israel Ltd filed Critical Hexagon Metrology Israel Ltd
Publication of IN2015DE00209A publication Critical patent/IN2015DE00209A/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/047—Accessories, e.g. for positioning, for tool-setting, for measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8803—Visual inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM]
    • G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM] characterised by quality surveillance of production
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/10—Scanning
    • G01N2201/102—Video camera
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10016—Video; Image sequence
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

Abstract

The invention pertains to a method for capturing and analyzing monitoring data of a measuring system (20), the measuring system (20) comprising one or more sensors (21, 22) and being adapted for a measuring operation of a series of identical objects (10), the measuring operation comprising a multitude of measuring sequences, each measuring sequence comprising the measuring of values of features of an object (10) of the series, the method comprising a multitude of monitoring operations, wherein each monitoring operation comprises capturing monitoring data during a measuring sequence, the monitoring data of each measuring sequence including at least one image comprising the measuring system (20) and/or a measurement environment, characterized by selecting a subset of measuring sequences from the multitude of measuring sequences; and visualizing an image sequence comprising the images of the monitoring data of the measuring sequences of the subset, wherein the order of the images in the image sequence is optimized for determining changes occurring in the measuring system (20) and/or in the measurement environment. The invention furthermore pertains to a monitoring system (1) for execution of said method.
IN209DE2015 2014-02-28 2015-01-23 IN2015DE00209A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP14157229.7A EP2913148B8 (en) 2014-02-28 2014-02-28 Method and system for analyzing process monitoring data

Publications (1)

Publication Number Publication Date
IN2015DE00209A true IN2015DE00209A (en) 2015-09-04

Family

ID=50184807

Family Applications (1)

Application Number Title Priority Date Filing Date
IN209DE2015 IN2015DE00209A (en) 2014-02-28 2015-01-23

Country Status (5)

Country Link
US (1) US9582870B2 (en)
EP (1) EP2913148B8 (en)
CN (1) CN104881863B (en)
BR (1) BR102015004272A2 (en)
IN (1) IN2015DE00209A (en)

Families Citing this family (15)

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Publication number Priority date Publication date Assignee Title
US10197394B2 (en) * 2013-11-06 2019-02-05 Hexagon Metrology (Israel) Ltd. Method and system for analyzing spatial measuring data
JP6628539B2 (en) * 2015-10-06 2020-01-08 株式会社日立製作所 Production plan instruction device, production plan instruction system, and production plan instruction method
US20170228440A1 (en) * 2016-02-10 2017-08-10 Virdree BURNS Method of facilitating pattern recognition through organizing data based on their sequencing relationship
US10783397B2 (en) 2016-06-29 2020-09-22 Intel Corporation Network edge device with image thresholding
US10666909B2 (en) 2016-06-29 2020-05-26 Intel Corporation Methods and apparatus to perform remote monitoring
EP3339801B1 (en) * 2016-12-20 2021-11-24 Hexagon Technology Center GmbH Self-monitoring manufacturing system, production monitoring unit and use of production monitoring unit
EP3364374A1 (en) 2017-02-20 2018-08-22 My Virtual Reality Software AS Method for visualizing three-dimensional data
GB201708730D0 (en) 2017-06-01 2017-07-19 Renishaw Plc Production and measurement of work workpieces
EP3459713A1 (en) * 2017-09-26 2019-03-27 Siemens Aktiengesellschaft Method for computer-aided processing of quality information of an object and a respective assistance apparatus
EP3467430B1 (en) * 2017-10-06 2023-02-15 Bayerische Motoren Werke Aktiengesellschaft Method and system for optically scanning and measuring objects
JP7025266B2 (en) * 2018-03-29 2022-02-24 パナソニック デバイスＳｕｎｘ株式会社 Image inspection system
CN109003326B (en) * 2018-06-05 2021-07-23 湖北亿咖通科技有限公司 Virtual laser radar data generation method based on virtual world
FR3090088B1 (en) * 2018-12-12 2021-06-18 Saint Gobain Method of measuring geometric deviations between the curved surfaces of a plurality of materials to be evaluated and a curved surface of a reference material
EP4290322A1 (en) * 2022-06-07 2023-12-13 Dassault Systèmes Inference of emerging problems in product manufacturing
CN117723550A (en) * 2024-02-18 2024-03-19 宁德时代新能源科技股份有限公司 Detection method and device of product quality detection equipment and electronic equipment

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5105183A (en) * 1989-04-27 1992-04-14 Digital Equipment Corporation System for displaying video from a plurality of sources on a display
DE19544240A1 (en) 1994-12-01 1996-06-05 Volkswagen Ag Repeatable accurate measurements in car body production
JP3295733B2 (en) * 1996-11-14 2002-06-24 松下電工株式会社 Control operation analysis method and analysis apparatus using the same
JP4096533B2 (en) * 2001-08-31 2008-06-04 松下電工株式会社 Image processing inspection system
DE602004019537D1 (en) * 2003-07-24 2009-04-02 Cognitens Ltd SYSTEM AND METHOD FOR MONITORING AND VISUALIZING THE OUTPUT OF A PRODUCTION PROCESS
KR20070040786A (en) * 2004-06-09 2007-04-17 코그넥스 테크놀로지 앤드 인베스트먼트 코포레이션 Method and apparatus for visual detection and inspection of objects
US9052294B2 (en) * 2006-05-31 2015-06-09 The Boeing Company Method and system for two-dimensional and three-dimensional inspection of a workpiece
EP2535781A1 (en) * 2011-06-17 2012-12-19 ABB Research Ltd. Collecting data in an industrial plant
EP2700570A1 (en) 2012-08-20 2014-02-26 Hexagon Metrology S.p.A. Mechanical positioning device and method

Also Published As

Publication number Publication date
EP2913148B8 (en) 2020-03-25
CN104881863B (en) 2019-04-30
EP2913148A1 (en) 2015-09-02
US9582870B2 (en) 2017-02-28
BR102015004272A2 (en) 2015-12-22
US20150248755A1 (en) 2015-09-03
CN104881863A (en) 2015-09-02
EP2913148B1 (en) 2020-02-12

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