IN2015DE00209A - - Google Patents

Info

Publication number
IN2015DE00209A
IN2015DE00209A IN209DE2015A IN2015DE00209A IN 2015DE00209 A IN2015DE00209 A IN 2015DE00209A IN 209DE2015 A IN209DE2015 A IN 209DE2015A IN 2015DE00209 A IN2015DE00209 A IN 2015DE00209A
Authority
IN
India
Prior art keywords
measuring
monitoring
sequence
sequences
monitoring data
Prior art date
Application number
Other languages
English (en)
Inventor
Tal Vagman
Jordi Edo Abella
Original Assignee
Hexagon Metrology Israel Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hexagon Metrology Israel Ltd filed Critical Hexagon Metrology Israel Ltd
Publication of IN2015DE00209A publication Critical patent/IN2015DE00209A/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/047—Accessories, e.g. for positioning, for tool-setting, for measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8803—Visual inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by quality surveillance of production
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/10—Scanning
    • G01N2201/102—Video camera
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10016—Video; Image sequence
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Automation & Control Theory (AREA)
  • General Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Geometry (AREA)
  • Image Analysis (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Image Processing (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
IN209DE2015 2014-02-28 2015-01-23 IN2015DE00209A (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP14157229.7A EP2913148B8 (de) 2014-02-28 2014-02-28 Verfahren und System zur Analyse von Verfahrensüberwachungsdaten

Publications (1)

Publication Number Publication Date
IN2015DE00209A true IN2015DE00209A (de) 2015-09-04

Family

ID=50184807

Family Applications (1)

Application Number Title Priority Date Filing Date
IN209DE2015 IN2015DE00209A (de) 2014-02-28 2015-01-23

Country Status (5)

Country Link
US (1) US9582870B2 (de)
EP (1) EP2913148B8 (de)
CN (1) CN104881863B (de)
BR (1) BR102015004272A2 (de)
IN (1) IN2015DE00209A (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10197394B2 (en) * 2013-11-06 2019-02-05 Hexagon Metrology (Israel) Ltd. Method and system for analyzing spatial measuring data
JP6628539B2 (ja) * 2015-10-06 2020-01-08 株式会社日立製作所 生産計画指示装置、生産計画指示システム、及び生産計画指示方法
US20170228440A1 (en) * 2016-02-10 2017-08-10 Virdree BURNS Method of facilitating pattern recognition through organizing data based on their sequencing relationship
US10783397B2 (en) 2016-06-29 2020-09-22 Intel Corporation Network edge device with image thresholding
US10666909B2 (en) 2016-06-29 2020-05-26 Intel Corporation Methods and apparatus to perform remote monitoring
EP3339801B1 (de) * 2016-12-20 2021-11-24 Hexagon Technology Center GmbH Selbstüberwachendes herstellungssystem, produktionsüberwachungseinheit und verwendung der produktionsüberwachungseinheit
EP3364374A1 (de) * 2017-02-20 2018-08-22 My Virtual Reality Software AS Verfahren zur visualisierung von dreidimensionalen daten
GB201708730D0 (en) 2017-06-01 2017-07-19 Renishaw Plc Production and measurement of work workpieces
EP3459713A1 (de) * 2017-09-26 2019-03-27 Siemens Aktiengesellschaft Verfahren zur rechnergestützten verarbeitung von qualitätsinformationen eines objekts und entsprechende hilfsvorrichtung
EP3467430B1 (de) * 2017-10-06 2023-02-15 Bayerische Motoren Werke Aktiengesellschaft Verfahren und system zur optischen abtastung und vermessung von objekten
JP7025266B2 (ja) * 2018-03-29 2022-02-24 パナソニック デバイスＳｕｎｘ株式会社 画像検査システム
CN109003326B (zh) * 2018-06-05 2021-07-23 湖北亿咖通科技有限公司 一种基于虚拟世界的虚拟激光雷达数据生成方法
FR3090088B1 (fr) * 2018-12-12 2021-06-18 Saint Gobain Procédé de mesure des écarts géométriques entre les surfaces incurvées d'une pluralité de matériaux à évaluer et une surface incurvée d’un matériau de référence
EP4290322A1 (de) * 2022-06-07 2023-12-13 Dassault Systèmes Ableitung neuer probleme bei der produktherstellung
CN117723550B (zh) * 2024-02-18 2024-06-25 宁德时代新能源科技股份有限公司 产品质量检测设备的检测方法、装置和电子设备

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5105183A (en) * 1989-04-27 1992-04-14 Digital Equipment Corporation System for displaying video from a plurality of sources on a display
DE19544240A1 (de) 1994-12-01 1996-06-05 Volkswagen Ag Verfahren und Vorrichtung zur Ermittlung der räumlichen Koordinaten von Objektpunkten und Verfahren zur Herstellung einer Karosserie
JP3295733B2 (ja) * 1996-11-14 2002-06-24 松下電工株式会社 制御動作の解析方法及びこれを用いた解析装置
JP4096533B2 (ja) * 2001-08-31 2008-06-04 松下電工株式会社 画像処理検査システム
ATE423341T1 (de) * 2003-07-24 2009-03-15 Cognitens Ltd System und verfahren zur überwachung und visualisierung der ausgabe eines produktionsprozesses
JP5175549B2 (ja) * 2004-06-09 2013-04-03 コグネックス・テクノロジー・アンド・インベストメント・コーポレーション 物体の視覚検出および検査のための方法および装置
US9052294B2 (en) * 2006-05-31 2015-06-09 The Boeing Company Method and system for two-dimensional and three-dimensional inspection of a workpiece
EP2535781A1 (de) * 2011-06-17 2012-12-19 ABB Research Ltd. Sammeln von Daten in einer Industrieanlage
EP2700570A1 (de) 2012-08-20 2014-02-26 Hexagon Metrology S.p.A. Mechanische Positionierungsvorrichtung und Verfahren

Also Published As

Publication number Publication date
CN104881863A (zh) 2015-09-02
EP2913148A1 (de) 2015-09-02
CN104881863B (zh) 2019-04-30
US20150248755A1 (en) 2015-09-03
EP2913148B8 (de) 2020-03-25
BR102015004272A2 (pt) 2015-12-22
US9582870B2 (en) 2017-02-28
EP2913148B1 (de) 2020-02-12

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