IN2014DN07911A - - Google Patents

Info

Publication number
IN2014DN07911A
IN2014DN07911A IN7911DEN2014A IN2014DN07911A IN 2014DN07911 A IN2014DN07911 A IN 2014DN07911A IN 7911DEN2014 A IN7911DEN2014 A IN 7911DEN2014A IN 2014DN07911 A IN2014DN07911 A IN 2014DN07911A
Authority
IN
India
Prior art keywords
light
digital
systems
vision system
mask
Prior art date
Application number
Inventor
Jeremy Georges Bertin
Rajesh Kumar Singh
Original Assignee
Procter & Gamble
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Procter & Gamble filed Critical Procter & Gamble
Publication of IN2014DN07911A publication Critical patent/IN2014DN07911A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8483—Investigating reagent band
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N7/00—Television systems
    • H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast

Landscapes

  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Molecular Biology (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Input (AREA)
  • Studio Devices (AREA)

Abstract

The systems and methods described herein relate to digital light masking systems and methods for automated image inspection. First a digital light masking system comprising a video signal; a source light which outputs emitted light; a digital light mask which attenuates the emitted light; and a vision system. The systems may inspect a disposable absorbent article. Second a method for automated image inspection comprising the steps of: generating a video signal; providing a uniform source light which outputs emitted light; providing a digital light mask which attenuates the emitted light; directing the attenuated light towards an article; and inspecting the article with a vision system. The uniform source light may be an LED light the digital light mask may be an LCD panel the attenuated light may be directed towards a disposable absorbent article and/or the vision system may comprise a camera.
IN7911DEN2014 2012-03-22 2013-03-18 IN2014DN07911A (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US201261614153P 2012-03-22 2012-03-22
US13/466,376 US20130250092A1 (en) 2012-03-22 2012-05-08 Digital light masking systems
US13/466,391 US20130250093A1 (en) 2012-03-22 2012-05-08 Methods for automated image inspection
PCT/US2013/032749 WO2013142397A1 (en) 2012-03-22 2013-03-18 Digital light masking systems and methods for automated image inspection

Publications (1)

Publication Number Publication Date
IN2014DN07911A true IN2014DN07911A (en) 2015-04-24

Family

ID=49211432

Family Applications (1)

Application Number Title Priority Date Filing Date
IN7911DEN2014 IN2014DN07911A (en) 2012-03-22 2013-03-18

Country Status (5)

Country Link
US (2) US20130250093A1 (en)
EP (1) EP2828645B1 (en)
CN (1) CN104204784B (en)
IN (1) IN2014DN07911A (en)
WO (1) WO2013142397A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9747564B1 (en) 2016-02-12 2017-08-29 The Boeing Company Aircraft maintenance and inspection with data analytics enhancement
EP3580034B1 (en) * 2017-02-08 2021-12-22 Cryovac, LLC Processes for in-line inspection of functional film layer containing detectable component

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6504605B1 (en) * 2000-10-24 2003-01-07 The Regents Of The University Of California Method and apparatus for determining the coordinates of an object
US7809179B2 (en) * 2005-09-09 2010-10-05 The Procter & Gamble Company Manufacturing inspection of folded feminine hygiene products by cascading edge and skew detection
US7492450B2 (en) * 2005-10-24 2009-02-17 General Electric Company Methods and apparatus for inspecting an object
US7545512B2 (en) * 2006-01-26 2009-06-09 Koh Young Technology Inc. Method for automated measurement of three-dimensional shape of circuit boards
KR100672818B1 (en) * 2006-01-26 2007-01-22 주식회사 고영테크놀러지 Method for measuring three-dimension shape
US8050486B2 (en) * 2006-05-16 2011-11-01 The Boeing Company System and method for identifying a feature of a workpiece
WO2008035765A1 (en) * 2006-09-21 2008-03-27 I-Pulse Kabushiki Kaisha Inspecting apparatus
CA2568260A1 (en) * 2006-11-15 2008-05-15 Christian Dufour Transparent material inspection system
WO2008124397A1 (en) * 2007-04-03 2008-10-16 David Fishbaine Inspection system and method
WO2009146201A1 (en) * 2008-04-16 2009-12-03 Blenis Robert S Jr Intelligent illumination source particularly for machine vision systems
ES2363284B1 (en) * 2009-08-27 2012-06-22 Universidad De Jaen BINARY ACTIVE LIGHTING SYSTEM

Also Published As

Publication number Publication date
CN104204784A (en) 2014-12-10
WO2013142397A1 (en) 2013-09-26
US20130250093A1 (en) 2013-09-26
US20130250092A1 (en) 2013-09-26
EP2828645B1 (en) 2019-11-20
CN104204784B (en) 2018-04-17
EP2828645A1 (en) 2015-01-28

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