IN2014DN07077A - - Google Patents
Info
- Publication number
- IN2014DN07077A IN2014DN07077A IN7077DEN2014A IN2014DN07077A IN 2014DN07077 A IN2014DN07077 A IN 2014DN07077A IN 7077DEN2014 A IN7077DEN2014 A IN 7077DEN2014A IN 2014DN07077 A IN2014DN07077 A IN 2014DN07077A
- Authority
- IN
- India
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
- G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012198531A JP5847674B2 (en) | 2012-09-10 | 2012-09-10 | X-ray thickness gauge |
| PCT/JP2012/007373 WO2014037984A1 (en) | 2012-09-10 | 2012-11-16 | X ray thickness meter |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| IN2014DN07077A true IN2014DN07077A (en) | 2015-04-10 |
Family
ID=50236638
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IN7077DEN2014 IN2014DN07077A (en) | 2012-09-10 | 2014-08-22 |
Country Status (8)
| Country | Link |
|---|---|
| EP (1) | EP2894433B1 (en) |
| JP (1) | JP5847674B2 (en) |
| KR (1) | KR101666470B1 (en) |
| CN (1) | CN104136885B (en) |
| BR (1) | BR112014021492B1 (en) |
| IN (1) | IN2014DN07077A (en) |
| TW (1) | TWI490448B (en) |
| WO (1) | WO2014037984A1 (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6888905B2 (en) * | 2015-12-10 | 2021-06-18 | 株式会社東芝 | Thickness gauge device that reduces the noise of the A / D converter in the detection signal |
| TWI781381B (en) * | 2020-03-06 | 2022-10-21 | 台達電子工業股份有限公司 | X-ray imaging method and system thereof |
| CN116026263B (en) * | 2023-03-30 | 2023-06-20 | 杭州百子尖科技股份有限公司 | Thickness measurement calibration method, device, equipment and storage medium |
| CN117112989B (en) * | 2023-10-23 | 2024-01-23 | 北京华力兴科技发展有限责任公司 | Thickness measurement data filtering optimization processing method |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4088886A (en) * | 1975-09-22 | 1978-05-09 | Nucleonic Data Systems | Radiation thickness gauge for sheet material |
| JPS5476988A (en) * | 1977-12-01 | 1979-06-20 | Hitachi Cable Ltd | Preparing parallel multicore cable |
| JPS56106107A (en) * | 1980-01-29 | 1981-08-24 | Toshiba Corp | Radiation thickness measuring device |
| JPS5740604A (en) * | 1980-08-25 | 1982-03-06 | Toshiba Corp | Thickness measuring apparatus with radiation |
| US4574387A (en) * | 1981-09-18 | 1986-03-04 | Data Measurement Corporation | Apparatus and method for measuring thickness |
| US4510577A (en) * | 1982-02-18 | 1985-04-09 | Tokyo Shibaura Denki Kabushiki Kaisha | Non-contact radiation thickness gauge |
| JPS58150809A (en) | 1982-02-25 | 1983-09-07 | Toshiba Corp | Non-contact radiation thickness gauge |
| JPH0237523A (en) | 1988-07-28 | 1990-02-07 | Yamaha Corp | Production of magnetic recording medium |
| JP2856815B2 (en) * | 1990-02-14 | 1999-02-10 | 株式会社東芝 | X-ray thickness gauge |
| GB9113990D0 (en) * | 1991-06-28 | 1991-08-14 | Data Measurement Corp | Means of calibrating x-ray gauging systems |
| JP3948965B2 (en) * | 2001-03-01 | 2007-07-25 | 株式会社東芝 | Multi-point thickness gauge |
| JP2003219324A (en) * | 2002-01-17 | 2003-07-31 | Olympus Optical Co Ltd | Image correction data calculation method, image correction data calculation apparatus, and multi- projection system |
| JP3991267B2 (en) * | 2002-10-08 | 2007-10-17 | アークレイ株式会社 | Analytical apparatus and manufacturing method thereof |
| JP4087274B2 (en) * | 2003-04-01 | 2008-05-21 | 株式会社東芝 | X-ray thickness measuring device |
| JP2005017028A (en) * | 2003-06-24 | 2005-01-20 | Toshiba Corp | Reference plate setting device of x-ray thickness gauge |
| US20070116183A1 (en) * | 2003-07-30 | 2007-05-24 | Hironori Ueki | Tomograph |
| JP4357923B2 (en) * | 2003-10-17 | 2009-11-04 | 名古屋電機工業株式会社 | X-ray inspection apparatus, X-ray inspection method, and control program for X-ray inspection apparatus |
| JP4613613B2 (en) * | 2004-12-28 | 2011-01-19 | 横河電機株式会社 | Physical quantity measurement method |
| JP2008128756A (en) * | 2006-11-20 | 2008-06-05 | Yokogawa Electric Corp | X-ray thickness measuring apparatus |
| JP2011059000A (en) * | 2009-09-11 | 2011-03-24 | Toshiba Corp | Radiation thickness meter |
| KR101626072B1 (en) * | 2009-11-13 | 2016-06-13 | 삼성전자주식회사 | Method and Apparatus for Compensating Image |
| JP2011242254A (en) * | 2010-05-18 | 2011-12-01 | Nippon Steel Corp | Steel plate thickness measuring instrument and calibration method thereof |
| CN102564361B (en) * | 2011-11-18 | 2013-10-23 | 北京金自天正智能控制股份有限公司 | Ray-type thickness gauge and calibration method thereof |
-
2012
- 2012-09-10 JP JP2012198531A patent/JP5847674B2/en active Active
- 2012-11-16 KR KR1020147021219A patent/KR101666470B1/en active IP Right Grant
- 2012-11-16 WO PCT/JP2012/007373 patent/WO2014037984A1/en active Application Filing
- 2012-11-16 EP EP12884078.2A patent/EP2894433B1/en active Active
- 2012-11-16 BR BR112014021492-1A patent/BR112014021492B1/en active IP Right Grant
- 2012-11-16 CN CN201280070812.2A patent/CN104136885B/en active Active
- 2012-11-26 TW TW101144213A patent/TWI490448B/en active
-
2014
- 2014-08-22 IN IN7077DEN2014 patent/IN2014DN07077A/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| BR112014021492A2 (en) | 2017-06-20 |
| WO2014037984A1 (en) | 2014-03-13 |
| JP2014052342A (en) | 2014-03-20 |
| CN104136885A (en) | 2014-11-05 |
| JP5847674B2 (en) | 2016-01-27 |
| EP2894433B1 (en) | 2018-09-26 |
| EP2894433A4 (en) | 2016-05-11 |
| CN104136885B (en) | 2017-03-01 |
| TWI490448B (en) | 2015-07-01 |
| KR20140107650A (en) | 2014-09-04 |
| EP2894433A1 (en) | 2015-07-15 |
| BR112014021492B1 (en) | 2021-10-05 |
| KR101666470B1 (en) | 2016-10-14 |
| TW201411091A (en) | 2014-03-16 |