IN191620B - - Google Patents

Info

Publication number
IN191620B
IN191620B IN635CA1997A IN191620B IN 191620 B IN191620 B IN 191620B IN 635CA1997 A IN635CA1997 A IN 635CA1997A IN 191620 B IN191620 B IN 191620B
Authority
IN
India
Application number
Other languages
English (en)
Inventor
Byoung-Jin Kim
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of IN191620B publication Critical patent/IN191620B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2825—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere in household appliances or professional audio/video equipment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
IN635CA1997 1996-11-05 1997-11-04 IN191620B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019960051157A KR100212994B1 (ko) 1996-11-05 1996-11-05 디지탈 영상기기에서 제품상태에서의 회로테스트를 위한 테스트 장치와 방법

Publications (1)

Publication Number Publication Date
IN191620B true IN191620B (zh) 2003-12-06

Family

ID=19480338

Family Applications (1)

Application Number Title Priority Date Filing Date
IN635CA1997 IN191620B (zh) 1996-11-05 1997-11-04

Country Status (2)

Country Link
KR (1) KR100212994B1 (zh)
IN (1) IN191620B (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106227194A (zh) * 2016-08-26 2016-12-14 天津市英贝特航天科技有限公司 一种dsp主控模块测试机箱

Also Published As

Publication number Publication date
KR100212994B1 (ko) 1999-08-02
KR19980033764A (ko) 1998-08-05

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