IN191620B - - Google Patents
Info
- Publication number
- IN191620B IN191620B IN635CA1997A IN191620B IN 191620 B IN191620 B IN 191620B IN 635CA1997 A IN635CA1997 A IN 635CA1997A IN 191620 B IN191620 B IN 191620B
- Authority
- IN
- India
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2825—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere in household appliances or professional audio/video equipment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Multimedia (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019960051157A KR100212994B1 (ko) | 1996-11-05 | 1996-11-05 | 디지탈 영상기기에서 제품상태에서의 회로테스트를 위한 테스트 장치와 방법 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| IN191620B true IN191620B (pl) | 2003-12-06 |
Family
ID=19480338
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IN635CA1997 IN191620B (pl) | 1996-11-05 | 1997-11-04 |
Country Status (2)
| Country | Link |
|---|---|
| KR (1) | KR100212994B1 (pl) |
| IN (1) | IN191620B (pl) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106227194A (zh) * | 2016-08-26 | 2016-12-14 | 天津市英贝特航天科技有限公司 | 一种dsp主控模块测试机箱 |
-
1996
- 1996-11-05 KR KR1019960051157A patent/KR100212994B1/ko not_active IP Right Cessation
-
1997
- 1997-11-04 IN IN635CA1997 patent/IN191620B/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| KR100212994B1 (ko) | 1999-08-02 |
| KR19980033764A (ko) | 1998-08-05 |
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