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Publication date
Application filed by Samsung Electronics Co LtdfiledCriticalSamsung Electronics Co Ltd
Publication of IN191620BpublicationCriticalpatent/IN191620B/en
G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
G01R31/28—Testing of electronic circuits, e.g. by signal tracer
G01R31/317—Testing of digital circuits
G01R31/3181—Functional testing
G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
G—PHYSICS
G01—MEASURING; TESTING
G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
G01R31/28—Testing of electronic circuits, e.g. by signal tracer
G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
G01R31/2825—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere in household appliances or professional audio/video equipment
G—PHYSICS
G01—MEASURING; TESTING
G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
G01R31/28—Testing of electronic circuits, e.g. by signal tracer
G01R31/2851—Testing of integrated circuits [IC]
G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
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Engineering & Computer Science
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General Engineering & Computer Science
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Physics & Mathematics
(AREA)
General Physics & Mathematics
(AREA)
Multimedia
(AREA)
Computer Hardware Design
(AREA)
Microelectronics & Electronic Packaging
(AREA)
Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions
(AREA)