IN155295B - - Google Patents

Info

Publication number
IN155295B
IN155295B IN703/DEL/80A IN703DE1980A IN155295B IN 155295 B IN155295 B IN 155295B IN 703DE1980 A IN703DE1980 A IN 703DE1980A IN 155295 B IN155295 B IN 155295B
Authority
IN
India
Application number
IN703/DEL/80A
Other languages
English (en)
Inventor
Heinrich Strobel
Original Assignee
Frieseke & Hoepfner Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Frieseke & Hoepfner Gmbh filed Critical Frieseke & Hoepfner Gmbh
Publication of IN155295B publication Critical patent/IN155295B/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/08Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
IN703/DEL/80A 1979-04-06 1980-09-29 IN155295B (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2913879A DE2913879C2 (de) 1979-04-06 1979-04-06 Verfahren zur Regelung der Dicke von laufenden Meßgutbahnen

Publications (1)

Publication Number Publication Date
IN155295B true IN155295B (de) 1985-01-19

Family

ID=6067621

Family Applications (1)

Application Number Title Priority Date Filing Date
IN703/DEL/80A IN155295B (de) 1979-04-06 1980-09-29

Country Status (7)

Country Link
US (1) US4322971A (de)
CH (1) CH641904A5 (de)
DE (1) DE2913879C2 (de)
FR (1) FR2453391A1 (de)
GB (1) GB2046900B (de)
IN (1) IN155295B (de)
IT (1) IT1131076B (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3135443A1 (de) * 1981-09-08 1983-03-24 Leybold-Heraeus GmbH, 5000 Köln Verfahren und fotometrische anordnung zur dickenmessung und -steuerung optisch wirksamer schichten
DE3148800C2 (de) * 1981-12-09 1986-12-04 Grecon Greten Gmbh & Co Kg, 3220 Alfeld Verfahren und Vorrichtung zur Ermittlung und Korrektur von Schwankungen des Flächengewichts von losen lignozellulose- und/oder zellulosehaltigen Holzspanteilchen, Fasern oder dergleichen
DE3151448C2 (de) * 1981-12-24 1984-02-09 FAG Kugelfischer Georg Schäfer KGaA, 8720 Schweinfurt Einrichtung zur Regelung der Dicke von Beschichtungen auf Metallbändern
CA1236813A (en) * 1984-04-16 1988-05-17 Wolfgang Heller Method of and apparatus for obtaining a predeterminable distribution of weight in the transverse direction of a pre-mat and/or mat
FR2572176B1 (fr) * 1984-10-19 1987-02-20 Inst Textile De France Procede et dispositif de mesure par radiometrie micro-onde de la temperature d'un materiau plan en defilement, notamment textile
US4777610A (en) * 1986-01-23 1988-10-11 Amp Incorporated Thickness monitor
US4747911A (en) * 1986-10-23 1988-05-31 Boise Cascade Corporation Apparatus for measuring diagonal and simplex paper curl
US4968993A (en) * 1986-12-16 1990-11-06 L&C Family Partnership Printing press
US4827315A (en) * 1986-12-16 1989-05-02 Larry Wolfberg Printing press
US5178063A (en) * 1986-12-16 1993-01-12 L & C Family Partnership Method and apparatus for automatic numbering of forms on a rotary printing press
BE1014355A3 (fr) * 2001-08-30 2003-09-02 Ct Rech Metallurgiques Asbl Procede et dispositif pour la mesure de distances sur des bandes de metal brillant.
EP2089670B1 (de) * 2006-12-15 2010-06-23 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren und vorrichtung zur dickenmessung
CN107010436A (zh) * 2017-05-02 2017-08-04 安徽玉辉电子科技有限公司 一种用于防止打印机卡纸的系统

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3210545A (en) * 1961-07-24 1965-10-05 Industrial Nucleonics Corp Method of compensating a radiation gauge for unwanted changes in measured material
GB1261886A (en) * 1968-01-31 1972-01-26 Kent Ltd G Method and apparatus for measuring
US3565531A (en) * 1969-03-12 1971-02-23 Sanders Associates Inc Electro-optical thickness measurement apparatus
US3858983A (en) * 1973-11-13 1975-01-07 Autech Corp Shaped product measurement
US4088886A (en) * 1975-09-22 1978-05-09 Nucleonic Data Systems Radiation thickness gauge for sheet material
US4037104A (en) * 1976-04-29 1977-07-19 Nucleonic Data Systems, Inc. Dual beam X-ray thickness gauge

Also Published As

Publication number Publication date
GB2046900B (en) 1983-01-26
FR2453391A1 (fr) 1980-10-31
US4322971A (en) 1982-04-06
IT1131076B (it) 1986-06-18
CH641904A5 (de) 1984-03-15
GB2046900A (en) 1980-11-19
DE2913879C2 (de) 1982-10-28
IT8020941A0 (it) 1980-03-27
FR2453391B1 (de) 1983-10-21
DE2913879A1 (de) 1980-10-09

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