IL92340A0 - Improved method and apparatus for microwave transient spectroscopy of deep levels in semiconductors - Google Patents

Improved method and apparatus for microwave transient spectroscopy of deep levels in semiconductors

Info

Publication number
IL92340A0
IL92340A0 IL92340A IL9234089A IL92340A0 IL 92340 A0 IL92340 A0 IL 92340A0 IL 92340 A IL92340 A IL 92340A IL 9234089 A IL9234089 A IL 9234089A IL 92340 A0 IL92340 A0 IL 92340A0
Authority
IL
Israel
Prior art keywords
semiconductors
improved method
deep levels
transient spectroscopy
microwave
Prior art date
Application number
IL92340A
Other languages
English (en)
Original Assignee
Magyar Tudomanyos Akademia
Geme Tec Ges Fuer Messtechnik
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Magyar Tudomanyos Akademia, Geme Tec Ges Fuer Messtechnik filed Critical Magyar Tudomanyos Akademia
Publication of IL92340A0 publication Critical patent/IL92340A0/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G01R23/163—Spectrum analysis; Fourier analysis adapted for measuring in circuits having distributed constants

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Mathematical Physics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
IL92340A 1988-11-18 1989-11-17 Improved method and apparatus for microwave transient spectroscopy of deep levels in semiconductors IL92340A0 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
HU595788 1988-11-18

Publications (1)

Publication Number Publication Date
IL92340A0 true IL92340A0 (en) 1990-07-26

Family

ID=10971033

Family Applications (1)

Application Number Title Priority Date Filing Date
IL92340A IL92340A0 (en) 1988-11-18 1989-11-17 Improved method and apparatus for microwave transient spectroscopy of deep levels in semiconductors

Country Status (3)

Country Link
DD (1) DD290986A5 (de)
IL (1) IL92340A0 (de)
WO (1) WO1990005908A1 (de)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113702451B (zh) * 2021-08-19 2023-10-17 北京工业大学 一种用于激励能级电容分析法的缺陷态空间位置测定方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3407850A1 (de) * 1984-02-29 1985-09-05 Hahn-Meitner-Institut für Kernforschung Berlin GmbH, 1000 Berlin Mikrowellen-messverfahren und -messapparatur zur kontaktlosen und zerstoerungsfreien untersuchung photoempfindlicher materialien
JPS6183946A (ja) * 1984-10-01 1986-04-28 Kanzaki Paper Mfg Co Ltd シ−ト状物質の配向測定方法
HU196262B (en) * 1986-03-17 1988-10-28 Mta Mueszaki Fiz Kutato Inteze Method for testing electrically active impuritles in semiconductor materials and structures and measuring arrangement for implementing method

Also Published As

Publication number Publication date
WO1990005908A1 (en) 1990-05-31
DD290986A5 (de) 1991-06-13

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