IL78943A - Method and apparatus for automated optical inspection of printed circuits - Google Patents

Method and apparatus for automated optical inspection of printed circuits

Info

Publication number
IL78943A
IL78943A IL78943A IL7894386A IL78943A IL 78943 A IL78943 A IL 78943A IL 78943 A IL78943 A IL 78943A IL 7894386 A IL7894386 A IL 7894386A IL 78943 A IL78943 A IL 78943A
Authority
IL
Israel
Prior art keywords
optical inspection
printed circuits
automated optical
automated
printed
Prior art date
Application number
IL78943A
Other languages
English (en)
Other versions
IL78943A0 (en
Original Assignee
Ibm Israel
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm Israel filed Critical Ibm Israel
Priority to IL78943A priority Critical patent/IL78943A/xx
Publication of IL78943A0 publication Critical patent/IL78943A0/xx
Priority to EP87104072A priority patent/EP0247308A3/en
Priority to JP62100217A priority patent/JPS62280975A/ja
Publication of IL78943A publication Critical patent/IL78943A/xx

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30141—Printed circuit board [PCB]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Computer Hardware Design (AREA)
  • Toxicology (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)
  • Image Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Image Analysis (AREA)
IL78943A 1986-05-27 1986-05-27 Method and apparatus for automated optical inspection of printed circuits IL78943A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
IL78943A IL78943A (en) 1986-05-27 1986-05-27 Method and apparatus for automated optical inspection of printed circuits
EP87104072A EP0247308A3 (en) 1986-05-27 1987-03-20 Method for automated optical inspection of printed circuits
JP62100217A JPS62280975A (ja) 1986-05-27 1987-04-24 プリント回路の光学的検査方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IL78943A IL78943A (en) 1986-05-27 1986-05-27 Method and apparatus for automated optical inspection of printed circuits

Publications (2)

Publication Number Publication Date
IL78943A0 IL78943A0 (en) 1986-09-30
IL78943A true IL78943A (en) 1990-09-17

Family

ID=11056814

Family Applications (1)

Application Number Title Priority Date Filing Date
IL78943A IL78943A (en) 1986-05-27 1986-05-27 Method and apparatus for automated optical inspection of printed circuits

Country Status (3)

Country Link
EP (1) EP0247308A3 (xx)
JP (1) JPS62280975A (xx)
IL (1) IL78943A (xx)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1234506B (it) * 1988-05-31 1992-05-19 Gd Spa Metodo per il controllo elettro-ottico di sigarette
IT1220409B (it) * 1988-06-29 1990-06-15 Gd Spa Metodo per il controllo di estremita' di sigarette disposte ammassate
FR2640050B1 (fr) * 1988-12-06 1991-03-29 Bull Sa Procede pour le controle d'une carte de circuit imprime equipee notamment le controle des composants de la carte et appareillage pour la mise en oeuvre de ce procede
FR2647574B1 (fr) * 1989-05-12 1991-09-06 Automatisme Robotique Applique Procedes et dispositifs pour effectuer des controles de fabrication visuels d'une serie de pieces identiques
US5119434A (en) * 1990-12-31 1992-06-02 Beltronics, Inc. Method of and apparatus for geometric pattern inspection employing intelligent imaged-pattern shrinking, expanding and processing to identify predetermined features and tolerances
DE69331433T2 (de) * 1992-10-22 2002-10-02 Advanced Interconnection Technology, Inc. Einrichtung zur automatischen optischen Prüfung von Leiterplatten mit darin verlegten Drähten
DE19709939A1 (de) * 1997-03-11 1998-09-17 Atg Test Systems Gmbh Verfahren und Vorrichtung zum Prüfen von Leiterplatten
EP1076831A2 (en) * 1998-02-13 2001-02-21 Scientific Generics Limited Circuit board assembly inspection
GB9803179D0 (en) * 1998-02-13 1998-04-08 Scient Generics Ltd PCB Inspection system
CN111707678B (zh) * 2020-07-24 2024-01-26 深圳芯通互联科技有限公司 一种pcb系统检测方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4589140A (en) * 1983-03-21 1986-05-13 Beltronics, Inc. Method of and apparatus for real-time high-speed inspection of objects for identifying or recognizing known and unknown portions thereof, including defects and the like
DE3475106D1 (en) * 1983-04-15 1988-12-15 Hitachi Ltd Method and apparatus for detecting defects of printed circuit patterns
JPS6115343A (ja) * 1984-06-29 1986-01-23 インタ−ナショナル　ビジネス　マシ−ンズ　コ−ポレ−ション 集積回路の光学的検査解析方法
JPS6186638A (ja) * 1984-10-05 1986-05-02 Hitachi Ltd 配線パターン欠陥検査方法

Also Published As

Publication number Publication date
JPS62280975A (ja) 1987-12-05
EP0247308A3 (en) 1989-07-26
IL78943A0 (en) 1986-09-30
EP0247308A2 (en) 1987-12-02

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Legal Events

Date Code Title Description
RH Patent void