IL282170A - מערכת מד עדשות ללא מתקן - Google Patents

מערכת מד עדשות ללא מתקן

Info

Publication number
IL282170A
IL282170A IL282170A IL28217021A IL282170A IL 282170 A IL282170 A IL 282170A IL 282170 A IL282170 A IL 282170A IL 28217021 A IL28217021 A IL 28217021A IL 282170 A IL282170 A IL 282170A
Authority
IL
Israel
Prior art keywords
fixtureless
lensmeter system
fixtureless lensmeter
lensmeter
Prior art date
Application number
IL282170A
Other languages
English (en)
Other versions
IL282170B (he
Original Assignee
Jand Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US16/164,488 external-priority patent/US10557773B2/en
Application filed by Jand Inc filed Critical Jand Inc
Publication of IL282170A publication Critical patent/IL282170A/he
Publication of IL282170B publication Critical patent/IL282170B/he

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0242Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • G01M11/0264Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested by using targets or reference patterns
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0221Testing optical properties by determining the optical axis or position of lenses
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0228Testing optical properties by measuring refractive power
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0228Testing optical properties by measuring refractive power
    • G01M11/0235Testing optical properties by measuring refractive power by measuring multiple properties of lenses, automatic lens meters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0242Testing optical properties by measuring geometrical properties or aberrations

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Studio Devices (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Eyeglasses (AREA)
  • Lens Barrels (AREA)
  • Gyroscopes (AREA)
IL282170A 2018-10-18 2019-10-17 מערכת מד עדשות ללא מתקן IL282170B (he)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US16/164,488 US10557773B2 (en) 2016-05-18 2018-10-18 Fixtureless lensmeter system
PCT/US2019/056827 WO2020081871A1 (en) 2018-10-18 2019-10-17 Fixtureless lensmeter system

Publications (2)

Publication Number Publication Date
IL282170A true IL282170A (he) 2021-05-31
IL282170B IL282170B (he) 2022-07-01

Family

ID=68503207

Family Applications (2)

Application Number Title Priority Date Filing Date
IL282170A IL282170B (he) 2018-10-18 2019-10-17 מערכת מד עדשות ללא מתקן
IL293343A IL293343A (he) 2018-10-18 2019-10-17 מערכת מד עדשות ללא מתקן

Family Applications After (1)

Application Number Title Priority Date Filing Date
IL293343A IL293343A (he) 2018-10-18 2019-10-17 מערכת מד עדשות ללא מתקן

Country Status (9)

Country Link
EP (1) EP3867618A1 (he)
JP (1) JP6984071B6 (he)
KR (2) KR102363130B1 (he)
CN (1) CN113227747B (he)
AU (2) AU2019360254B2 (he)
CA (1) CA3116887A1 (he)
IL (2) IL282170B (he)
MX (1) MX2021003814A (he)
WO (1) WO2020081871A1 (he)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10036685B2 (en) * 2016-05-18 2018-07-31 Jand, Inc. Fixtureless lensmeter and methods of operating same
US10557773B2 (en) 2016-05-18 2020-02-11 Jand, Inc. Fixtureless lensmeter system
CN109936737B (zh) * 2017-12-15 2021-11-16 京东方科技集团股份有限公司 可穿戴设备的测试方法及系统
EP4054187B1 (en) * 2021-03-04 2024-08-21 Essilor International Calibration method of a portable electronic device
GB2628990A (en) * 2023-04-12 2024-10-16 Eyoto Group Ltd Lens examination equipment and method

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3827619B2 (ja) * 2002-07-11 2006-09-27 株式会社トプコン 眼鏡レンズの光学特性測定方法及びレンズメータ
JP4566569B2 (ja) * 2004-01-28 2010-10-20 株式会社トプコン レンズメータ
JP2006071325A (ja) * 2004-08-31 2006-03-16 Topukon Yamagata:Kk レンズメータ
EP2101143A1 (de) * 2008-03-10 2009-09-16 Technische Universität Carolo-Wilhelmina zu Braunschweig Verfahren und Vorrichtung zur Erfassung der Form transparenter refraktiver Objekte
FR3000233B1 (fr) * 2012-12-21 2016-04-15 Essilor Int Procede de verification de la conformite d'une caracteristique optique d'une lentille ophtalmique et dispositif associe
US10330566B2 (en) * 2015-03-05 2019-06-25 Eyenetra, Inc. Methods and apparatus for small aperture lensometer
BR112017024165B1 (pt) * 2015-05-10 2022-12-20 6 OVER 6 VISION Ltd Método de determinação de um ou mais parâmetros óticos de uma lente de óculos, produto, aparelho e dispositivo móvel
WO2017125902A1 (en) * 2016-01-23 2017-07-27 6 Over 6 Vision Ltd. Apparatus, system and method of determining one or more optical parameters of a lens
FR3039660B1 (fr) * 2015-07-30 2017-09-08 Essilor Int Methode de verification d'une caracteristique geometrique et d'une caracteristique optique d'une lentille ophtalmique detouree et dispositif associe
EP3128362B1 (en) * 2015-08-05 2023-10-04 Essilor International Method for determining a parameter of an optical equipment
KR102415501B1 (ko) * 2015-08-07 2022-07-01 삼성전자주식회사 3차원 디스플레이 장치의 파라미터 추정 방법 및 그 방법을 이용한 3차원 디스플레이 장치
WO2017134275A1 (en) * 2016-02-05 2017-08-10 Eidgenossische Technische Hochschule Zurich Methods and systems for determining an optical axis and/or physical properties of a lens and use of the same in virtual imaging and head-mounted displays
US10036685B2 (en) * 2016-05-18 2018-07-31 Jand, Inc. Fixtureless lensmeter and methods of operating same
JP6830654B2 (ja) * 2016-08-23 2021-02-17 株式会社トーメーコーポレーション レンズメータ

Also Published As

Publication number Publication date
JP6984071B6 (ja) 2022-01-18
MX2021003814A (es) 2022-08-19
CN113227747B (zh) 2022-07-08
AU2019360254B2 (en) 2022-02-03
KR102363130B1 (ko) 2022-02-14
EP3867618A1 (en) 2021-08-25
JP6984071B1 (ja) 2021-12-17
WO2020081871A1 (en) 2020-04-23
KR20220025199A (ko) 2022-03-03
CA3116887A1 (en) 2020-04-23
AU2019360254A1 (en) 2021-06-03
IL293343A (he) 2022-07-01
KR20210062708A (ko) 2021-05-31
JP2022502671A (ja) 2022-01-11
CN113227747A (zh) 2021-08-06
AU2022202677A1 (en) 2022-05-19
IL282170B (he) 2022-07-01

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