IL226984A0 - מכשיר ושיטה למדידת התאבכות של אובייקט - Google Patents

מכשיר ושיטה למדידת התאבכות של אובייקט

Info

Publication number
IL226984A0
IL226984A0 IL226984A IL22698413A IL226984A0 IL 226984 A0 IL226984 A0 IL 226984A0 IL 226984 A IL226984 A IL 226984A IL 22698413 A IL22698413 A IL 22698413A IL 226984 A0 IL226984 A0 IL 226984A0
Authority
IL
Israel
Prior art keywords
interferometring
measuring
interferometring measuring
Prior art date
Application number
IL226984A
Other languages
English (en)
Other versions
IL226984A (he
Original Assignee
Polytec Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Polytec Gmbh filed Critical Polytec Gmbh
Publication of IL226984A0 publication Critical patent/IL226984A0/he
Publication of IL226984A publication Critical patent/IL226984A/he

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P3/00—Measuring linear or angular speed; Measuring differences of linear or angular speeds
    • G01P3/36—Devices characterised by the use of optical means, e.g. using infrared, visible, or ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02075—Reduction or prevention of errors; Testing; Calibration of particular errors
    • G01B9/02082—Caused by speckles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02083—Interferometers characterised by particular signal processing and presentation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H9/00—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive means, e.g. optical means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Power Engineering (AREA)
  • Signal Processing (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
IL226984A 2012-07-03 2013-06-17 מכשיר ושיטה למדידת התאבכות של אובייקט IL226984A (he)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102012211549A DE102012211549B3 (de) 2012-07-03 2012-07-03 Vorrichtung und Verfahren zur interferometrischen Vermessung eines Objekts

Publications (2)

Publication Number Publication Date
IL226984A0 true IL226984A0 (he) 2013-12-31
IL226984A IL226984A (he) 2017-04-30

Family

ID=48608155

Family Applications (1)

Application Number Title Priority Date Filing Date
IL226984A IL226984A (he) 2012-07-03 2013-06-17 מכשיר ושיטה למדידת התאבכות של אובייקט

Country Status (5)

Country Link
US (2) US9551726B2 (he)
EP (1) EP2682709B1 (he)
JP (1) JP6332662B2 (he)
DE (1) DE102012211549B3 (he)
IL (1) IL226984A (he)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102011085599B3 (de) * 2011-11-02 2012-12-13 Polytec Gmbh Vorrichtung und Verfahren zur interferometrischen Vermessung eines Objekts
DE102013209833B4 (de) 2013-05-27 2024-09-26 Polytec Gmbh Vibrometer mit einem optischen Interferometer
WO2014208111A1 (ja) * 2013-06-27 2014-12-31 ギガフォトン株式会社 光ビーム計測装置、レーザ装置及び光ビーム分離装置
DE102014216278A1 (de) 2014-08-15 2016-02-18 Polytec Gmbh Vorrichtung zur interferometrischen Vermessung eines Objekts
US10429171B2 (en) * 2015-07-22 2019-10-01 The University Of Mississippi Laser multibeam differential interferometric sensor and methods for vibration imaging
US10753791B2 (en) * 2016-01-26 2020-08-25 Tubitak Dual-channel laser audio monitoring system
DE102018111921B4 (de) * 2018-05-17 2023-11-23 Technische Universität Clausthal Kontaktloser optischer Dehnungsmesssensor
DE102018114478B4 (de) * 2018-06-15 2024-09-19 Polytec Gmbh Verfahren zur Bestimmung des Strahlverlaufs eines Messstrahls einer interferometrischen Messvorrichtung und Messvorrichtung zur interferometrischen Vermessung eines Messobjekts
DE102018114480B3 (de) 2018-06-15 2019-11-14 Polytec Gmbh Abgleichverfahren für eine Strahlrichteinheit einer interferometrischen Messvorrichtung und Messvorrichtung zur Durchführung einer interferometrischen Messung mittels Laserstrahlung
KR101977307B1 (ko) * 2018-10-25 2019-05-10 국방과학연구소 항공 사격 채점 시스템 및 방법
US20230029700A1 (en) * 2020-01-20 2023-02-02 Nippon Telegraph And Telephone Corporation Measuring device and measuring method
DE102024131662B3 (de) * 2024-10-30 2025-11-13 Technische Universität Clausthal, Körperschaft des öffentlichen Rechts Vorrichtung und Verfahren zum kontaktlosen Messen einer Dehnungsänderung eines Messobjekts
CN121346958B (zh) * 2025-12-22 2026-03-17 安徽至博光电科技股份有限公司 一种光学检测系统及方法

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US4121295A (en) * 1977-04-07 1978-10-17 Wittronics, Inc. Integer weighted impulse equivalent coded signal processing apparatus
CA2048278C (en) * 1990-11-07 2002-07-23 Wayne V. Sorin Polarization independent optical coherence-domain reflectometry
US6191862B1 (en) * 1999-01-20 2001-02-20 Lightlab Imaging, Llc Methods and apparatus for high speed longitudinal scanning in imaging systems
US6324003B1 (en) * 1999-12-23 2001-11-27 Silicon Valley Group, Inc. Calcium fluoride (CaF2) stress plate and method of making the same
AU2001268062A1 (en) * 2000-05-16 2001-11-26 Air Fiber, Inc. Multi-channel optical transceiver
EP1475606A4 (en) * 2002-02-14 2007-04-04 Imalux Corp OBJECT EXAMINATION METHOD AND OPTICAL INTERFEROMETER FOR CARRYING OUT SAID METHOD
SG125923A1 (en) * 2002-09-20 2006-10-30 Asml Netherlands Bv Lithographic marker structure, lithographic projection apparatus comprising such a lithographic marker structure and method for substrate alignment using such a lithographic marker structure
JP2004215987A (ja) * 2003-01-16 2004-08-05 Matsushita Electric Ind Co Ltd 超音波診断装置および超音波診断方法
US20040170109A1 (en) * 2003-02-28 2004-09-02 Matsushita Electric Industrial Co., Ltd. Optical pickup
US7477398B2 (en) * 2003-03-31 2009-01-13 Metrolaser, Inc. Multi-beam heterodyne laser doppler vibrometer
US7733497B2 (en) * 2003-10-27 2010-06-08 The General Hospital Corporation Method and apparatus for performing optical imaging using frequency-domain interferometry
US7126693B2 (en) * 2004-03-29 2006-10-24 Carl Zeiss Meditec, Inc. Simple high efficiency optical coherence domain reflectometer design
US7417740B2 (en) * 2004-11-12 2008-08-26 Medeikon Corporation Single trace multi-channel low coherence interferometric sensor
US7359057B2 (en) * 2005-08-26 2008-04-15 Ball Aerospace & Technologies Corp. Method and apparatus for measuring small shifts in optical wavelengths
JP4701928B2 (ja) * 2005-09-01 2011-06-15 株式会社日立製作所 光電界波形観測装置
US7728985B2 (en) * 2005-11-14 2010-06-01 Imalux Corporation Polarization-sensitive common path optical coherence reflectometry/tomography device
US7742173B2 (en) * 2006-04-05 2010-06-22 The General Hospital Corporation Methods, arrangements and systems for polarization-sensitive optical frequency domain imaging of a sample
DE102006038031A1 (de) * 2006-05-26 2007-11-29 Rohde & Schwarz Gmbh & Co. Kg Messvorrichtung und Messverfahren zum Messen der Hüllkurvenleistung und des Leistungsmittelwerts
US7488930B2 (en) * 2006-06-02 2009-02-10 Medeikon Corporation Multi-channel low coherence interferometer
DE102007010389B4 (de) * 2007-03-03 2011-03-10 Polytec Gmbh Vorrichtung zur optischen Vermessung eines Objekts
US8704638B2 (en) * 2008-07-07 2014-04-22 Tyco Fire & Security Services GmbH Electronic article surveillance system with metal detection capability and method therefor
EP2547982B1 (en) * 2010-03-17 2017-09-13 Lightlab Imaging, Inc. Intensity noise reduction methods and apparatus for interferometric sensing and imaging systems
WO2012050901A2 (en) * 2010-09-28 2012-04-19 The Regents Of The University Of Colorado, A Body Corporate Fourier domain sensing
GB2485202B (en) * 2010-11-05 2017-08-30 Oclaro Tech Ltd Demodulator and optical arrangement thereof

Also Published As

Publication number Publication date
US20170199214A1 (en) 2017-07-13
EP2682709B1 (de) 2021-08-25
US20140009750A1 (en) 2014-01-09
DE102012211549B3 (de) 2013-07-04
US9551726B2 (en) 2017-01-24
JP2014013238A (ja) 2014-01-23
JP6332662B2 (ja) 2018-05-30
IL226984A (he) 2017-04-30
EP2682709A1 (de) 2014-01-08
US9910056B2 (en) 2018-03-06

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