IL154843A0 - Improved structure identification using scattering signatures - Google Patents

Improved structure identification using scattering signatures

Info

Publication number
IL154843A0
IL154843A0 IL15484301A IL15484301A IL154843A0 IL 154843 A0 IL154843 A0 IL 154843A0 IL 15484301 A IL15484301 A IL 15484301A IL 15484301 A IL15484301 A IL 15484301A IL 154843 A0 IL154843 A0 IL 154843A0
Authority
IL
Israel
Prior art keywords
improved structure
structure identification
scattering signatures
signatures
scattering
Prior art date
Application number
IL15484301A
Other languages
English (en)
Original Assignee
Accent Optical Tech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Accent Optical Tech Inc filed Critical Accent Optical Tech Inc
Publication of IL154843A0 publication Critical patent/IL154843A0/xx

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/129—Using chemometrical methods
    • G01N2201/1293—Using chemometrical methods resolving multicomponent spectra

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Immunology (AREA)
  • Data Mining & Analysis (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Computational Mathematics (AREA)
  • Algebra (AREA)
  • Mathematical Analysis (AREA)
  • Mathematical Optimization (AREA)
  • Pure & Applied Mathematics (AREA)
  • Databases & Information Systems (AREA)
  • Software Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Complex Calculations (AREA)
  • Image Analysis (AREA)
  • Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
IL15484301A 2000-09-13 2001-09-13 Improved structure identification using scattering signatures IL154843A0 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US23257800P 2000-09-13 2000-09-13
US09/952,546 US6728663B2 (en) 2000-09-13 2001-09-12 Structure identification using scattering signatures
PCT/US2001/042123 WO2002023382A1 (en) 2000-09-13 2001-09-13 Improved structure identification using scattering signatures

Publications (1)

Publication Number Publication Date
IL154843A0 true IL154843A0 (en) 2003-10-31

Family

ID=26926141

Family Applications (2)

Application Number Title Priority Date Filing Date
IL15484301A IL154843A0 (en) 2000-09-13 2001-09-13 Improved structure identification using scattering signatures
IL154843A IL154843A (en) 2000-09-13 2003-03-10 Improved identification of structure by using diffused characterizations

Family Applications After (1)

Application Number Title Priority Date Filing Date
IL154843A IL154843A (en) 2000-09-13 2003-03-10 Improved identification of structure by using diffused characterizations

Country Status (8)

Country Link
US (1) US6728663B2 (ko)
EP (1) EP1323063A4 (ko)
JP (1) JP2004509412A (ko)
KR (2) KR20080021800A (ko)
CN (1) CN1215423C (ko)
AU (1) AU2001289214A1 (ko)
IL (2) IL154843A0 (ko)
WO (1) WO2002023382A1 (ko)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6483580B1 (en) 1998-03-06 2002-11-19 Kla-Tencor Technologies Corporation Spectroscopic scatterometer system
US7099005B1 (en) * 2000-09-27 2006-08-29 Kla-Tencor Technologies Corporation System for scatterometric measurements and applications
US6900892B2 (en) * 2000-12-19 2005-05-31 Kla-Tencor Technologies Corporation Parametric profiling using optical spectroscopic systems
US7515279B2 (en) * 2001-03-02 2009-04-07 Nanometrics Incorporated Line profile asymmetry measurement
JP4938219B2 (ja) * 2001-12-19 2012-05-23 ケーエルエー−テンカー コーポレイション 光学分光システムを使用するパラメトリック・プロフィーリング
US7119893B2 (en) * 2003-04-10 2006-10-10 Accent Optical Technologies, Inc. Determination of center of focus by parameter variability analysis
US20070091325A1 (en) * 2005-01-07 2007-04-26 Mehrdad Nikoonahad Multi-channel optical metrology
US7467064B2 (en) * 2006-02-07 2008-12-16 Timbre Technologies, Inc. Transforming metrology data from a semiconductor treatment system using multivariate analysis
US7698098B2 (en) * 2008-02-18 2010-04-13 Thermo Electron Scientific Instruments Llc Efficient spectral matching, particularly for multicomponent spectra
JP5841147B2 (ja) * 2011-07-01 2016-01-13 パナソニック インテレクチュアル プロパティ コーポレーション オブアメリカＰａｎａｓｏｎｉｃ Ｉｎｔｅｌｌｅｃｔｕａｌ Ｐｒｏｐｅｒｔｙ Ｃｏｒｐｏｒａｔｉｏｎ ｏｆ Ａｍｅｒｉｃａ 受信装置、送信装置、設定方法、及び特定方法
CN102798342B (zh) * 2012-08-02 2014-11-12 华中科技大学 一种用于光学散射测量的基于拟合误差插值的库匹配方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5274714A (en) * 1990-06-04 1993-12-28 Neuristics, Inc. Method and apparatus for determining and organizing feature vectors for neural network recognition
US5241369A (en) 1990-10-01 1993-08-31 Mcneil John R Two-dimensional optical scatterometer apparatus and process
US5114233A (en) 1990-10-09 1992-05-19 At&T Bell Laboratories Method for inspecting etched workpieces
DE69327080T2 (de) 1992-09-08 2000-06-08 Hitachi Ltd Informationsverarbeitungsvorrichtung mit Schlussfolgerung und adaptivem Lernen
US6122403A (en) * 1995-07-27 2000-09-19 Digimarc Corporation Computer system linked by using information in data objects
US5748763A (en) * 1993-11-18 1998-05-05 Digimarc Corporation Image steganography system featuring perceptually adaptive and globally scalable signal embedding
US5703692A (en) 1995-08-03 1997-12-30 Bio-Rad Laboratories, Inc. Lens scatterometer system employing source light beam scanning means
US5739909A (en) 1995-10-10 1998-04-14 Lucent Technologies Inc. Measurement and control of linewidths in periodic structures using spectroscopic ellipsometry
US5867276A (en) 1997-03-07 1999-02-02 Bio-Rad Laboratories, Inc. Method for broad wavelength scatterometry
US6075594A (en) 1997-07-16 2000-06-13 Ncr Corporation System and method for spectroscopic product recognition and identification
US6480299B1 (en) * 1997-11-25 2002-11-12 University Technology Corporation Color printer characterization using optimization theory and neural networks
US20010051856A1 (en) 2000-01-26 2001-12-13 Xinhui Niu Caching of intra-layer calculations for rapid rigorous coupled-wave analyses
WO2002014840A2 (en) 2000-08-10 2002-02-21 Sensys Instruments Corporation Database interpolation method for optical measurement of diffractive microstructures

Also Published As

Publication number Publication date
WO2002023382A1 (en) 2002-03-21
IL154843A (en) 2008-11-03
EP1323063A1 (en) 2003-07-02
KR100851417B1 (ko) 2008-08-08
AU2001289214A1 (en) 2002-03-26
US20020046008A1 (en) 2002-04-18
KR20080021800A (ko) 2008-03-07
US6728663B2 (en) 2004-04-27
KR20030045068A (ko) 2003-06-09
JP2004509412A (ja) 2004-03-25
EP1323063A4 (en) 2006-10-04
CN1215423C (zh) 2005-08-17
CN1455900A (zh) 2003-11-12

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