IL137596A - Method for use in simulation of an soi device - Google Patents
Method for use in simulation of an soi deviceInfo
- Publication number
- IL137596A IL137596A IL13759600A IL13759600A IL137596A IL 137596 A IL137596 A IL 137596A IL 13759600 A IL13759600 A IL 13759600A IL 13759600 A IL13759600 A IL 13759600A IL 137596 A IL137596 A IL 137596A
- Authority
- IL
- Israel
- Prior art keywords
- simulation
- soi device
- soi
- Prior art date
Links
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/388,594 US6141632A (en) | 1997-09-26 | 1999-09-02 | Method for use in simulation of an SOI device |
Publications (2)
Publication Number | Publication Date |
---|---|
IL137596A0 IL137596A0 (en) | 2001-07-24 |
IL137596A true IL137596A (en) | 2003-11-23 |
Family
ID=23534750
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IL13759600A IL137596A (en) | 1999-09-02 | 2000-07-31 | Method for use in simulation of an soi device |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP3418975B2 (en) |
CN (1) | CN1171168C (en) |
IL (1) | IL137596A (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SG113006A1 (en) * | 2004-01-04 | 2005-07-28 | Teradyne Inc | Silicon-on-insulator channel architecture of automatic test equipment |
US8236709B2 (en) * | 2009-07-29 | 2012-08-07 | International Business Machines Corporation | Method of fabricating a device using low temperature anneal processes, a device and design structure |
-
2000
- 2000-07-31 IL IL13759600A patent/IL137596A/en not_active IP Right Cessation
- 2000-08-31 CN CNB001261908A patent/CN1171168C/en not_active Expired - Fee Related
- 2000-08-31 JP JP2000263994A patent/JP3418975B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
CN1171168C (en) | 2004-10-13 |
IL137596A0 (en) | 2001-07-24 |
JP3418975B2 (en) | 2003-06-23 |
JP2001148427A (en) | 2001-05-29 |
CN1287333A (en) | 2001-03-14 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
GB2367669B (en) | An improved simulation method and apparatus | |
WO2002022264A8 (en) | Method and apparatus for gradient generation | |
AU2002219866A1 (en) | Medical simulation apparatus and related method | |
AU2002224949A1 (en) | Method and device for measuring levels | |
GB2383422B (en) | Method and apparatus for well testing | |
AU5139900A (en) | Liposome-enhanced test device and method | |
AU2002213333A1 (en) | Method and apparatus for modeling and executing deferred award instrument plan | |
HK1064016A1 (en) | Method and device for measuring body compositions | |
AU2001262914A1 (en) | Method and apparatus for electro-optic delay generation | |
EP1100127A4 (en) | Soi wafer and method for producing soi wafer | |
AU4639200A (en) | Sytem and method for simulated device training | |
EP1317806A4 (en) | Method and device for measuring cavitation | |
SG106606A1 (en) | Developing method and developing apparatus | |
GB2355386B (en) | Measuring device and method | |
SG114460A1 (en) | Method of field isolation in silicon-on-insulator technology | |
GB9901887D0 (en) | Machining simulation method and apparatus | |
AU5603400A (en) | Device and method for testing tissue | |
GB0315737D0 (en) | Device and method for changing lines | |
AU2002222329A1 (en) | An electro-optical device and method | |
GB9925743D0 (en) | Fixing device and method | |
GB9913915D0 (en) | Semiconductor device simulation method and simulator | |
IL137596A (en) | Method for use in simulation of an soi device | |
AU2001234630A1 (en) | Method and apparatus for distributing power to an integrated circuit | |
HUP0200524A3 (en) | Method and device for inserting playing in or information-block | |
AU2001267937A1 (en) | Method and device for multiplying tissue parts |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
FF | Patent granted | ||
KB | Patent renewed | ||
KB | Patent renewed | ||
MM9K | Patent not in force due to non-payment of renewal fees |