IL111410A - Test kit to identify defects in system interfaces - Google Patents

Test kit to identify defects in system interfaces

Info

Publication number
IL111410A
IL111410A IL11141094A IL11141094A IL111410A IL 111410 A IL111410 A IL 111410A IL 11141094 A IL11141094 A IL 11141094A IL 11141094 A IL11141094 A IL 11141094A IL 111410 A IL111410 A IL 111410A
Authority
IL
Israel
Prior art keywords
control unit
bus
test
maintenance control
data
Prior art date
Application number
IL11141094A
Other languages
English (en)
Hebrew (he)
Other versions
IL111410A0 (en
Original Assignee
Grumman Aerospace Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Grumman Aerospace Corp filed Critical Grumman Aerospace Corp
Publication of IL111410A0 publication Critical patent/IL111410A0/xx
Publication of IL111410A publication Critical patent/IL111410A/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G01R31/11—Locating faults in cables, transmission lines, or networks using pulse reflection methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Hardware Design (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Debugging And Monitoring (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Small-Scale Networks (AREA)
IL11141094A 1993-11-01 1994-10-26 Test kit to identify defects in system interfaces IL111410A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/144,318 US5479610A (en) 1993-11-01 1993-11-01 System interface fault isolator test set

Publications (2)

Publication Number Publication Date
IL111410A0 IL111410A0 (en) 1995-01-24
IL111410A true IL111410A (en) 1996-08-04

Family

ID=22508063

Family Applications (1)

Application Number Title Priority Date Filing Date
IL11141094A IL111410A (en) 1993-11-01 1994-10-26 Test kit to identify defects in system interfaces

Country Status (7)

Country Link
US (1) US5479610A (cs)
EP (1) EP0727048A4 (cs)
JP (1) JPH09506448A (cs)
CA (1) CA2175365A1 (cs)
IL (1) IL111410A (cs)
TW (1) TW269023B (cs)
WO (1) WO1995012820A1 (cs)

Families Citing this family (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2712998B1 (fr) * 1993-11-22 1996-02-09 Aerospatiale Simulateur de bus numériques intégré dans un système de test automatique de boîtiers électroniques embarqués sur avion.
US5600248A (en) * 1995-06-21 1997-02-04 Dipl.-Ing H. Horstmann Gmbh Fault distance locator for underground cable circuits
EP0829729B1 (en) * 1996-06-21 2004-05-12 Agilent Technologies, Inc. (a Delaware corporation) Measuring apparatus and method for the adjustment of test/measurement parameters
US5805793A (en) * 1996-10-18 1998-09-08 Mcdonnell Douglas Corporation Stand-alone test device for testing command-response remote terminals
US6522515B1 (en) * 1999-01-08 2003-02-18 Littelfuse, Inc. Data and power connector port
CA2291939C (en) * 1999-12-08 2008-12-30 Harry E. Orton Method for diagnosing degradation in aircraft wiring
US6448781B1 (en) 2000-10-06 2002-09-10 Northrop Grumman Corporation Method and system for analyzing cable faults
US6972574B2 (en) * 2001-01-31 2005-12-06 Cm Technologies Corporation Method and apparatus for monitoring integrity of wires or electrical cables
US6686746B2 (en) 2001-01-31 2004-02-03 Cm Technologies Corporation Method and apparatus for monitoring integrity of wires or electrical cables
US6574537B2 (en) 2001-02-05 2003-06-03 The Boeing Company Diagnostic system and method
WO2003051452A1 (en) * 2001-12-17 2003-06-26 Bausch & Lomb Incorporated Drug implant injection device
AU2003213833A1 (en) * 2002-03-11 2003-09-29 Fairchild Semiconductor Corporation Drain activated/deactivated ac coupled bandpass rf switch
US20040082203A1 (en) * 2002-05-07 2004-04-29 Oleg Logvinov Method and apparatus for power theft prevention based on TDR or FDR signature monitoring on LV and MV power lines
US6844715B2 (en) * 2002-09-05 2005-01-18 Honeywell International Inc. Synthetic RF detection system and method
US6954076B2 (en) * 2002-09-06 2005-10-11 Northrop Grumman Corporation Aircraft multi-function wire and insulation tester
US6859041B2 (en) 2002-11-26 2005-02-22 Honeywell International, Inc. Methods for locating faults in aircraft branch conductors and determining the distance to the faults
US6751536B1 (en) * 2002-12-04 2004-06-15 The Boeing Company Diagnostic system and method for enabling multistage decision optimization for aircraft preflight dispatch
US7512503B2 (en) * 2003-05-12 2009-03-31 Simmonds Precision Products, Inc. Wire fault detection
US7080243B2 (en) * 2003-05-15 2006-07-18 Hewlett-Packard Development Company, L.P. Method and system for comparing firmware images
DE10338697A1 (de) * 2003-08-22 2005-03-24 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung und Verfahren zum Überwachen einer Leitung
US6943558B2 (en) * 2003-09-15 2005-09-13 The Boeing Company System and method for remotely detecting electric arc events in a power system
US7005995B2 (en) * 2003-09-16 2006-02-28 The Boeing Company System and method for remotely detecting and locating damaged conductors in a power system
US7236338B2 (en) * 2003-09-16 2007-06-26 The Boeing Company System and method for remotely detecting and locating faults in a power system
US7801702B2 (en) * 2004-02-12 2010-09-21 Lockheed Martin Corporation Enhanced diagnostic fault detection and isolation
US7075309B2 (en) * 2004-03-08 2006-07-11 Livewire Test Labs, Inc. System and method to locate an anomaly of a conductor
USD518393S1 (en) * 2004-08-19 2006-04-04 Mitchell B. Nesenoff Cable tester CES model Ed-Lab 800CT
US20080052281A1 (en) 2006-08-23 2008-02-28 Lockheed Martin Corporation Database insertion and retrieval system and method
US7639022B2 (en) * 2006-08-02 2009-12-29 At&T Intellectual Property I, L.P. Method and apparatus for measuring data rates
US8032330B2 (en) * 2008-03-07 2011-10-04 Nokia Corporation Electromagnetic interference sensor device and method and computer program
US7902834B2 (en) * 2008-05-02 2011-03-08 Avo Multi-Amp Corporation Upgradable test set
US8461847B2 (en) * 2009-02-23 2013-06-11 Tribune IP LLC Electrical interconnect status monitoring system
US10854378B2 (en) 2009-02-23 2020-12-01 Triune Ip Llc Wireless power transmittal
US8339590B2 (en) * 2009-03-04 2012-12-25 The Boeing Company Fiber cable distortion detection system and method
CN102448777B (zh) * 2009-05-26 2015-06-24 丰田自动车株式会社 控制装置、车载设备以及系统及其方法
CN101930030B (zh) * 2009-06-26 2014-12-03 深圳市齐创美科技有限公司 电子信号走线特性阻抗测试系统及方法
WO2012025138A1 (en) * 2010-08-23 2012-03-01 Telefonaktiebolaget Lm Ericsson (Publ) Device and method for impedance monitoring
FR2964748B1 (fr) * 2010-09-15 2012-09-07 Airbus Operations Sas Procede et architecture de detection d'anomalies electriques par reflectometrie
NO341197B1 (no) 2012-10-24 2017-09-11 Wirescan As Fremgangsmåte og system for overvåkning av tilstanden til elektriske kabler
US9958490B2 (en) * 2015-04-15 2018-05-01 The Boeing Company Electrical monitoring system and assembly
US10685125B2 (en) 2017-04-20 2020-06-16 The Boeing Company Multiple security level monitor for monitoring a plurality of MIL-STD-1553 buses with multiple independent levels of security
US10467174B2 (en) 2017-04-20 2019-11-05 The Boeing Company System and method of monitoring data traffic on a MIL-STD-1553 data bus
US10691573B2 (en) * 2017-04-20 2020-06-23 The Boeing Company Bus data monitor
CN109655706A (zh) * 2018-12-11 2019-04-19 中国航空工业集团公司成都飞机设计研究所 一种远程接口单元自动测试设备
US11867525B2 (en) 2020-12-16 2024-01-09 Google Llc Sharing a navigation session to minimize driver distraction

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4538103A (en) * 1982-08-30 1985-08-27 John Cappon Time domain reflectometer apparatus for identifying the location of cable defects
US4541031A (en) * 1983-11-21 1985-09-10 Derek W. Moore Loop fault isolator
FR2557980B1 (fr) * 1984-01-10 1986-04-18 Balteau Dispositif et procede de localisation de defauts de cables
US4629835A (en) * 1984-12-26 1986-12-16 New England Telephone And Telegraph Company Fault isolating apparatus system and method
US4786857A (en) * 1986-04-24 1988-11-22 Charles L. Mohr Methods and apparatus for time domain reflectometry determination of relative proportion, fluid inventory and turbulence
US4766386A (en) * 1986-05-23 1988-08-23 Cabletron Time domain reflectometer for measuring impedance discontinuities on a powered transmission line
US4739276A (en) * 1986-06-12 1988-04-19 Maris Graube Method and apparatus for digital time domain reflectometry
US4838690A (en) * 1988-04-12 1989-06-13 Sumitomo Electric Fiber Optics Corporation Simultaneous bi-directional optical time domain reflectometry method
US4970466A (en) * 1989-03-22 1990-11-13 Microtest, Inc. TDR cable testing apparatus with pulse timing manipulation to automatically compensate for diverse cable characteristics
US5083080A (en) * 1989-06-30 1992-01-21 Anritsu Corporation High frequency signal measuring equipment with cabled detecting and signal companding
US5083086A (en) * 1990-07-12 1992-01-21 James G. Biddle Co. Differential arc reflectometry
US5185579A (en) * 1991-07-31 1993-02-09 Hughes Aircraft Company Detection and ranging of material flaws using microwave transmission line reflectometry
US5352984A (en) * 1992-11-04 1994-10-04 Cable Repair Systems Corporation Fault and splice finding system and method
US5361776A (en) * 1993-08-06 1994-11-08 Telectronics Pacing Systems, Inc. Time domain reflectometer impedance sensor method of use and implantable cardiac stimulator using same

Also Published As

Publication number Publication date
EP0727048A4 (en) 1997-04-23
EP0727048A1 (en) 1996-08-21
TW269023B (cs) 1996-01-21
US5479610A (en) 1995-12-26
CA2175365A1 (en) 1995-05-11
IL111410A0 (en) 1995-01-24
JPH09506448A (ja) 1997-06-24
WO1995012820A1 (en) 1995-05-11

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