IL101918A - Device for testing, contacting and / or wiring sockets on a circuit board - Google Patents

Device for testing, contacting and / or wiring sockets on a circuit board

Info

Publication number
IL101918A
IL101918A IL10191892A IL10191892A IL101918A IL 101918 A IL101918 A IL 101918A IL 10191892 A IL10191892 A IL 10191892A IL 10191892 A IL10191892 A IL 10191892A IL 101918 A IL101918 A IL 101918A
Authority
IL
Israel
Prior art keywords
testing
housing
guiding elements
guiding
intermediate member
Prior art date
Application number
IL10191892A
Other languages
English (en)
Hebrew (he)
Other versions
IL101918A0 (en
Original Assignee
Lang Dahlke Helmut
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lang Dahlke Helmut filed Critical Lang Dahlke Helmut
Publication of IL101918A0 publication Critical patent/IL101918A0/xx
Publication of IL101918A publication Critical patent/IL101918A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Compounds Of Unknown Constitution (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Multi-Conductor Connections (AREA)
  • Steroid Compounds (AREA)
  • Holo Graphy (AREA)
  • Dry Shavers And Clippers (AREA)
  • Glass Compositions (AREA)
IL10191892A 1991-05-21 1992-05-19 Device for testing, contacting and / or wiring sockets on a circuit board IL101918A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE4116457A DE4116457C1 (fi) 1991-05-21 1991-05-21

Publications (2)

Publication Number Publication Date
IL101918A0 IL101918A0 (en) 1992-12-30
IL101918A true IL101918A (en) 1994-12-29

Family

ID=6432047

Family Applications (1)

Application Number Title Priority Date Filing Date
IL10191892A IL101918A (en) 1991-05-21 1992-05-19 Device for testing, contacting and / or wiring sockets on a circuit board

Country Status (6)

Country Link
US (1) US5283605A (fi)
EP (1) EP0514671B1 (fi)
AT (1) ATE125366T1 (fi)
DE (2) DE4116457C1 (fi)
FI (1) FI921827A (fi)
IL (1) IL101918A (fi)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19508902A1 (de) * 1995-03-11 1996-09-12 Nadejda Dipl Phys Poskatcheeva Vorrichtung zur Prüfung von Platinen sowie deren Verwendung
SG59913A1 (en) * 1995-12-20 1999-02-27 Tan Yin Leong Zero insertion apparatus for burn-in test probe
KR100295228B1 (ko) 1998-10-13 2001-07-12 윤종용 통합테스트시스템과그를이용한통합테스트공정수행방법
US6441627B1 (en) * 1998-10-26 2002-08-27 Micron Technology, Inc. Socket test device for detecting characteristics of socket signals
US6400134B1 (en) * 2000-07-17 2002-06-04 Infineon Technologies North America Corp. Automated bad socket masking in real-time for test handlers
US6788081B2 (en) * 2001-07-18 2004-09-07 Micron Technology, Inc. Motherboard memory slot ribbon cable and apparatus
KR100493058B1 (ko) * 2003-04-15 2005-06-02 삼성전자주식회사 소켓 이상 유무를 실시간으로 판단하는 반도체 소자의전기적 검사방법
TW576505U (en) * 2003-05-07 2004-02-11 Hon Hai Prec Ind Co Ltd Testing device for slots of motherboards
US7208936B2 (en) * 2004-04-12 2007-04-24 Intel Corporation Socket lid and test device
TW201201638A (en) * 2010-06-23 2012-01-01 Hon Hai Prec Ind Co Ltd Load board
JP5579547B2 (ja) * 2010-09-07 2014-08-27 株式会社ヨコオ コネクタ接続用検査治具

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE8417765U1 (de) * 1984-09-13 Siemens AG, 1000 Berlin und 8000 München Prüfgerät mit Bestückvorrichtung für die elektrischeFunktionsprüfung eines Einschubs für ein elektrisches Gerät
US4460236A (en) * 1981-12-17 1984-07-17 At&T Bell Laboratories Test apparatus for electrical circuit boards
US4516072A (en) * 1982-11-22 1985-05-07 Amp Incorporated Device for use in testing printed circuit board components
DE3340180C1 (de) * 1983-11-07 1985-05-15 MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH Kontaktfeldanordnung fuer ein rechnergesteuertes Leiterplattenpruefgeraet
DE3533810A1 (de) * 1984-09-25 1986-04-03 International Standard Electric Corp., New York, N.Y. Adapter zum pruefen von leiterplatten-baugruppen
US4846702A (en) * 1988-01-07 1989-07-11 Minnesota Mining & Manufacturing Company Electrical connector for surface mount chip carrier installed in a socket
DE8911411U1 (de) * 1989-09-25 1989-11-30 Siemens AG, 1000 Berlin und 8000 München Prüfadapter für Baugruppen der elektrischen Nachrichtentechnik
US4978912A (en) * 1989-10-23 1990-12-18 Ag Communication Systems Corporation Chip carrier socket test probe
FR2659175B1 (fr) * 1990-03-02 1992-06-19 Souriau & Cie Connecteur electrique pour banc de test.

Also Published As

Publication number Publication date
FI921827A0 (fi) 1992-04-23
EP0514671A1 (de) 1992-11-25
DE4116457C1 (fi) 1992-10-29
ATE125366T1 (de) 1995-08-15
DE59202910D1 (de) 1995-08-24
FI921827A (fi) 1992-11-22
IL101918A0 (en) 1992-12-30
EP0514671B1 (de) 1995-07-19
US5283605A (en) 1994-02-01

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