IE84893B1

IE84893B1 - Disk substrate for a perpendicular magnetic recording medium and a perpendicular magnetic recording medium using the substrate

Info

Publication number: IE84893B1
Application number: IE2005/0198A
Authority: IE
Inventors: Uwazumi Hiroyuki; Higuchi Kazuhito; Youichi Tei; Kainuma Kengo; Iso Akira; Kurihara Hajime
Original assignee: Fuji Electric Device Technology Co Ltd
Filing date: 2005-04-05
Publication date: 2008-06-11

Abstract

ABSTRACT An object of the invention is to provide a disk substrate for a perpendicular magnetic recording medium, the substrate exhibiting sufficient productivity, serving a function as a soft magnetic backing layer of the perpendicular magnetic recording medium, and scarcely generating noises. Another object of the invention is to provide a perpendicular magnetic recording medium using such a substrate. The disk substrate 10 comprises at least a soft magnetic underlayer 2 formed on a nonmagnetic base plate 1 by means of an electroless plating method. The thermal expansion coefficient of the soft magnetic underlayer 2 is larger than a thermal expansion coefficient of the nonmagnetic disk-shaped base plate 1. A saturation magnetostriction constant (lambda)s satisfies a relation (lambda)s is greater than or equal to -1 x 10 to the power of (-5). .

Description

TITLE OF THE INVENTION DISK SUBSTRATE FOR A PERPENDICULAR MAGNETIC RECORDING MEDIUM AND A PERPENDICULAR MAGNETIC RECORDING MEDIUM USING THE SUBSTRATE CROSS-REFERENCE TO RELATED APPLICATION This application is based on, and claims priority to, Japanese Application No. 2004-121889, filed on April 16, 2004, and Japanese Application No. 2004-309723, ﬁled on October 25, 2004 BACKGROUND OF THE INVENTION . Field of the Invention

[0001] The present invention relates to a disk substrate for a perpendicular magnetic recording medium and a perpendicular magnetic recording medium mounted on an external storage device of a computer and éther magnetic recording devices, in particular to a perpendicular magnetic recording medium suited for mounting on a hard disk drive (HDD), and a disk substrate for such a perpendicular magnetic recording medium.

. Description of the Related Art

[0002] A perpendicular magnetic recording system is drawing attention as a technique to achieve high density magnetic recording, in place of a conventional longitudinal magnetic recording system.

In particular, a double layer perpendicular magnetic recording medium is known to be suited for a perpendicular magnetic recording medium for achieving high density recording, as disclosed in Patent Uocument 1. A double layer perpendicular magnetic recording medium is provided with a soft magnetic ﬁlm called a soft magnetic backing layer under a magnetic recording layer that stores information. The soft magnetic backing layer, exhibiting high saturation magnetic flux density Bs, facilitates passage of the magnetic ﬂux generated by a magnetic head. The double layer perpendicular magnetic recording medium increases intensity and gradient of the magnetic ﬁeld generated by the magnetic head to improve recording resolution, and also increases the leakage flux from the medium.

The soft magnetic backing layer generally uses a Ni—Fe alloy ﬁlm, an F e-Si~Al alloy ﬁlm, or an amorphous alloy film of mainly cobalt having a thickness in a range of about 200 nm to 500 nm formed by a sputtering method. To form such a relatively thick film by a sputtering method is not appropriate from the viewpoint of production costs and mass productivity.

To solve the problem, use of a soft magnetic ﬁlm formed by an electroless plating method has been proposed for the soft magnetic backing layer. Patent Document 2, for example, proposes a soft magnetic backing layer using a NiFeP film produced by a plating method on an aluminum alloy disk substrate provided with a nonmagnetic NiP plating film.

Noirpatent Document 1 proposes a CoNiFeP plating film formed on a glass substrate, and Non-patent Document 2 proposes a soft magnetic NiP plating film formed on an aluminum alloy disk substrate provided with a nonmagnetic NiP plating film.

It is known that if the soft magnetic backing layer forms a magnetic domain structure and generates a magnetization transition region called a magnetic domain wall, the noises called spike noises generated from the magnetic domain wall degrade the performance of the perpendicular magnetic recording medium. Therefore, a soft magnetic backing layer needs suppression of formation of the magnetic domain wall.

[0004] Since the NiFeP plating film is apt to form a magnetic domain wall, Non-patent Document 3 discloses that the magnetic domain wall formation must be suppressed by forming a Mnlr alloy thin film on the plating ﬁlm by a sputtering method. The suppression of the magnetic domainiwall formation in the above'mentioned CoNiFeP plating film is described to be possible by conducting the plating process in a magnetic field. The soft magnetic NiP plating film is deemed not to generate spike noises.

Patent Document 3 also proposes that the generation of spike noises can be suppressed by forming a backing layer composed of cobalt or a CoNi alloy having coercivity He in a range of 30 to 300 Oe in such a way as to exhibit magnetic anisotropy in the circumferential direction of the disk substrate. While the backing layer in this example is formed by a dry deposition process such as a sputtering method or an evaporation method, Patent Document 4 proposes a method to form a Co-B film having Hc of at least 30 Oe and suppressing spike noises by a plating method, and suggests applicability to a soft magnetic backing layer.

[0005] For a disk substrate of a magnetic recording medium mounted on a hard disk drive, a glass disk substrate using crystallized glass or chemically reinforced glass is used as well as an aluminum alloy substrate provided with a nonmagnetic NiP plating ﬁlm. The glass substrates, having high strength, are mainly used in a magnetic recording medium of a portable hard disk drive, which needs high chock resistance. The above-described plating method for forming a soft magnetic layer is effective to improve the productivity also in a glass disk substrate for a perpendicular magnetic recording medium.

[Patent Document ll Japanese Patent Publication No. S58-91 [Patent Document 2] Japanese Unexamined Patent Application Publication No. H7- 66034 lPatent Document 3] Japanese Unexamined Patent Application Publication No. H2- [Patent Document 4] Japanese Unexamined Patent Application Publication No. H5- 1884 [Non-patent Document 1] Digest of 9th Joint MMM/Intermag Conference, EP-12, p.259 (2004) [Non-patent Document 2] Digest of 9th Joint MMM/Intermag Conference, GD- 13, p.368 (2004) lNon'patent Document 3] J. of The Magnetics Society of Japan, vol. 28, No. 23, p.289-294 (2004)

[0006] The studies of the inventors have revealed that the provision of the abovementioned soft magnetic NiP plating ﬁlm on a glass disk substratejs apt to orient the magnetization of the NiP plating film in the direction perpendicular to the film surface, generating very large noises, thus preventing the use of the soft magnetic NiP plating film for a soft magnetic backing layer. The same material of the NiP plating film can exhibit quite different magnetic properties and noise characteristics between the cases of the use on an aluminum alloy disk substrate and the use on a glass disk substrate. Therefore, selection of a material used as a soft magnetic backing layer 011 3 E13disk substrate is necessarily different from selection ofa material used on an aluminum alloy disk substrate.

To suppress spike noises in the Ni FeP plating film described previously, the magnetic domain wall formation needs to be suppressed by forming a Mnlr alloy thin film on the plating film by a sputtering method. The requirement for provision of an additional film by a sputtering method to suppress the magnetic domain wall formation detracts from the merit of the plating method in production costs and mass productivity, and thus, undesirable.

[0007] The CoNiFeP plating film described above also finds difficulty in applying a homogeneous magnetic field to the substrate in the plating bath in an actual manufacturing process, and also very likely impair the mass productivity. Although an iron'containing plating film, exhibiting high Bs, is suitable for a soft magnetic backing layer, securing the stability of a plating bath is known generally difficult because iron ions takes stable forms of both divalent and trivalent ions. So the iron-containing plating ﬁlm is also defective in mass productivity.

The inventors have studied on a correlation between coercivity and magnetic domain wall formation of the soft magnetic underlayer formed by a plating method, and found that a coercivity value of the plating film of not smaller than 30 Oe cannot completely prevent the magnetic domain wall formation although some tendency of suppression was observed. It has been further clarified that the increase of the coercivity deteriorates the recording and reproduction performance.

[0008] As described above, the conventional technology hardly achieves a backing layer on a glass disk substrate of a perpendicular magnetic recording medium that allows high density recording and suppresses spike noises, and that is still accompanied by low production costs and satisfactory mass productivity.

SUMMARY OF THE INVENTION ln View of the above, an object of the present invention is to provide a substrate for a perpendicular magnetic recording medium, the substrate allowing mass production, serving a function as a soft magnetic backing layer of a perpendicular magnetic recording medium, and scarcely generating noises. Another object of the invention is to provide a perpendicular magnetic recording medium using such a substrate.

[0009] The inventors have made extensive studies to solve the above problems and found that a disk substrate for a perpendicular magnetic recording medium allowing mass production, serving a function as a soft magnetic backing layer of a perpendicular magnetic recording medium, and scarcely generating noises can be achieved by the combination of a nonmagnetic diskshaped base plate and a soft magnetic underlayer such that a thermal expansion coefficient of the soft magnetic underlayer is larger than a thermal expansion coefficient of the nonmagnetic disk-shaped base plate and a saturation magnetostriction constant As satisﬁes a relation As 2 -1 x -5.

Thermal expansion coefficient is a material property that changes with the temperature range of measurement. The temperature range of measurement of the thermal expansion coefficient referred to in the present invention is approximately the range from 20°C to 200°C in View of the temperature range of operation of the disk substrate for a magnetic recording medium.

The electroless plating is generally conducted in a plating bath at a temperature not lower than 80°C. If the thermal expansion coefficients of the nonmagnetic disk-shaped base plate and of the plated film differ too much, the stress develops in the plated film during cooling down to the room temperature after ﬁnish of the plating step. It is known that the magnetic anisotropy is induced in the plating ﬁlm depending on the magnitude and direction of the stress (compression or tension) and the quantity of the saturation magnetostriction of the formed plating film. When the disk-shaped base plate is composed of strengthened glass or crystallized glass (the both exhibiting thermal expansion coefficient not larger than 10x10’6 / °C) and the plating film is composed of Co, Ni, Fe, or an alloy of these elements (each exhibiting thermal expansion coefficient of about 12 x 10-5 / “C or larger), for example, the tensile stress develops in the film plane direction after cooling down to the room temperature from the finish of the plating step. In this case, if the saturation magnetostriction constant of the plating film is negative and the absolute value is large, the magnetic anisotropy with an axis of easy magnetization perpendicular to the film surface is induced in the plating film and the magnetization tends to align perpendicularly to the film surface.

[0010] According to the studies by the inventors, in order to suppress generation of large noises due to the tendency of magnetization alignment perpendicularly to the ﬁlm surface, the combination of the nonmagnetic disc-shaped base plate and the soft magnetic underlayer must satisfy the relation between the thermal expansion coefficients of the two members and the value of the saturation magnetostriction as described above.

The nonmagnetic disk base plate can be favorably composed of chemically reinforced glass or crystallized glass, which is used in nonmagnetic disk substrates of conventional hard disks. In addition, silicon, exhibiting relatively small thermal expansion coefficient, can also be used for a nonmagnetic disk base plate.

Advantageously, the soft magnetic underlayer is formed by an electroless plating method and composed of a Co-Ni-P alloy that contains phosphorus in the range of 3 at% to 20 at% and cobalt at least 45 % in a proportion of number of atoms of cobalt and nickel (Co / (Co + Ni». The thickness of the soft magnetic underlayer is preferably in the range of 0.2 pm to 3 pm.

Advantageously, the plating layer of the Co*Ni-P alloy contains at most 2 at% of tungsten or manganese. The containment of the element does not deteriorate the function as a soft magnetic backing layer and yet improves the corrosion resistance. Further, addition of germanium or lead of at most several percent for the purpose of stabilizing the plating bath does not detract from advantages of the present invention.

[0011] To obtain the function as a soft magnetic backing layer of a perpendicular magnetic recording medium that allows high density recording, the thickness of the soft magnetic underlayer is necessarily at least 0.2 pm, while the thickness is preferably at most 3 pm in view of productivity.

Concerning composition of the soft magnetic underlayer, a phosphorus concentration below 3 at% hardly allows forming a stable electroless plating film, while a phosphorus concentration over 20 at% results too low Bs value and cannot perform a function as a soft magnetic backing layer.

A cobalt concentration lower than 45 at% in a proportion of number of atoms of cobalt and nickel (Co / (Co + Ni» is not appropriate since the Bs value cannot be maintained sufficiently high and the saturation magnetostriction constant becomes a negative and large absolute value.

Although an upper limit of the cobalt concentration is not strictly limited to a special value, agcobalt concentration over 90 at% in a proportion of nurriber of atoms of cobalt and nickel (Co / (Co + Ni?) tends to make the CoNi alloy take an hcp structure having a large crystalline magnetic anisotropy constant and to increase coercivity, thus unfavorable. The composition preferably contains at least at% of nickel in a proportion of number of atoms of cobalt and nickel (Ni / (Co + Ni» to stably form an fee structure.

[0012] The effects of the present invention are also held when an adhesion layer is provided between the nonmagnetic disk base plate and the soft magnetic underlayer to improve adhesivity between the two.

A heating process may be carried out after formation of the soft magnetic underlayer, although the desired performance can be obtained Without the heating process in the plating film of the invention. The heating process scarcely deteriorates the magnetic performances and noise characteristics of the soft magnetic underlayer due to magnetic anisotropy induced by the thermal expansion difference between the nonmagnetic disk base plate and the soft magnetic underlayer, as long as the relation between the thermal expansion coefficients of the base plate and the underlayer and the saturation magnetostriction constant of the underlayer are maintained as described above.

The inventors of the present invention have made extensive studies on the suppression of the magnetic domain wall formation in the soft magnetic underlayer of the CoNiP plating and found that a ratio Mrr8 / Mrcﬁ needs to be controlled in a range of 0.33 to 3.00, where Mrc8 is a product of thickness and residual magnetization obtained from a magnetization curve measured by applying a magnetic field along a circumferential direction of the disk substrate, and Mrro is a product of thickness and residual magnetimtion obtained from a magnetization curve measured by applying a magnetic ﬁeld along a radial direction of the disk substrate.

[0013] The magnetization tends to align along the circumferential direction of the disk substrate if Mrr8 / Mrc5 is smaller than 0.33, and tends to align along the radial direction of the disk if Mrrﬁ / Mrc5 is larger than 3.00. As a result, the magnetic domain walls are liable to be formed along the respective directions, generating undesirable spike noises.

The inventors have also found that the He value does not strongly correlate to the magnetic domain wall formation, and the recording and reproduction performance improves with the He value of not larger than about 20 Oe rather than with the Ho value of at least 30 Oe that is taught by Patent Documents 3 and 4.

A perpendicular magnetic recording medium of the invention uses the above'described disk substrate for a perpendicular magnetic recording medium according to the invention and comprises at least a nonmagnetic seed layer, a magnetic recording layer, and a protective layer sequentially formed on the substrate. According to the study by the inventors, such a perpendicular magnetic recording medium exhibits favorable recording and reproduction performances as a double layer perpendicular magnetic recording medium since the soft magnetic underlayer on the uppermost surface of the disk substrate functions as a soft magnetic backing layer. In addition, the soft magnetic backing layer is formed by means of an electroless plating method that is conducted with high mass productivity. Therefore, the medium is manufactured very inexpensively because the backing layer need not be formed by a sputtering method, for example.

[0014] Advantageously, a soft magnetic auxiliary layer that exhibits a product of thickness and saturation magnetic ﬂux density of at least 150 G pm and the thickness of at most 50 nm is provided between the soft magnetic underlayer on the uppermost surface of the disk substrate and the nonmagnetic seed layer. Because both this soft magnetic auxiliary layer and the soft magnetic underlayer work as a soft magnetic backing layer, the function for a double layer perpendicular magnetic recording medium improves and moreover, exhibits the effect to suppress random noises generated in the soft magnetic underlayer.

The soft magnetic auxiliary layer preferably has a product of thickness and saturation magnetic flux density of at least 150 G pm to improve the function as a soft magnetic backing layer. The thickness is preferably at most 50 nm, because a thickness larger than 50 nm is liable to form magnetic domain walls in the soft magnetiqauxiliary layer and generates spike noises, and further, deteriorates productivity.

[0015] According to the present invention, a disk substrate for a perpendicular magnetic recording medium is provided that allows mass production, serves a function as a soft magnetic backing layer of a perpendicular magnetic recording medium, and scarcely generates noises using strengthened glass, crystallized glass, or silicon or the like for the nonmagnetic disk base plate.

A perpendicular magnetic recording medium of the invention, using a substrate for a perpendicular magnetic recording medium of the invention, achieves favorable recording and reproduction performance. Because the soft magnetic backing layer in the medium of the invention is formed by an electroless plating method that allows mass production, a relatively thick ﬁlm required for a soft magnetic backing layer need not be formed by, for example, a sputtering method, permitting very inexpensive production.

[0016] Some preferred embodiments of the invention will be described in the following.

BRIEF DESCRIPTION OF THE DRAWINGS

[0049] Fig. 1 is a schematic sectional View of a structure of a disk substrategfor a perpendicular magnetic recording medium of an embodiment according to the invention; Fig. 2 is a schematic sectional View showing a structure of a perpendicular magnetic recording medium of an embodiment according to the invention; Fig. 3 is a schematic sectional View showing a structure of a perpendicular magnetic recording medium comprising a soft magnetic auxiliary layer of an embodiment according to the invention; Fig 4 shows the reproduced output signal, at a recording density of 300 kFCI, of perpendicular magnetic recording media with Various film thicknesses of the soft magnetic underlayer in the dependence on the write current in the magnetic head; Fig. 5 shows the reproduced output signal, at a recording density of 300 kFCI, of perpendicular magnetic recording media with Various mean phosphorus concentration in the soft magnetic underlayer in the dependence on the write current in the magnetic head; Fig 6 shows the reproduced output detected after dc demagnetization of the media with a write current of 50 mA represented in a dependence on the mean cobalt concentration in the soft magnetic underlayer in a proportion of number of atoms of cobalt and nickel (Co/ (Co + NH); Fig. 7 shows the saturation magnetostriction constant As represented in a dependence on the mean cobalt concentration in the soft magnetic underlayer in a proportion of number of atoms of cobalt and nickel (Co/ (Co + ND); Fig. 9 shows typical magnetization curves and the definitions of the residual magnetization and the coercivity of a soft magnetic underlayer, in which (a) shows the ones along the radial direction of the disk, and (b) shows the ones along the circumferential direction of the disk} Fig. 10 shows the signal-to'noise ratio SNR at a recording density of 370 kFCI in the dependence on the thickness of the soft magnetic auxiliary layer; Fig. 11 shows the dependence of the amount of dissolved cobalt on the tungsten concentration in atomic percent; and Fig. 12 shows the dependence of the amount of dissolved manganese on the tungsten concentration in atomic percent.

(Description of symbols)

[0050] nonmagnetic disk'shaped base plate 2 soft magnetic underlayer disk substrate nonmagnetic seed layer magnetic recording layer protective layer soft magnetic auxiliary layer DE’I‘AlL17iD DESCRIPTION or THE INVENTION

[0016] (continued) (Embodiment of a substrate) Fig. 1 shows a structure ofa disk substrate for a perpendicular magnetic recording medium of an embodiment of the invention. A disk substrate 10 for a perpendicular magnetic recording medium of the embodiment shown in Fig. 1 comprises a nonmagnetic disk- shaped base plate 1 and a soft magnetic underlayer 2 on the base plate. A soft magnetic underlayer 2 may be formed on the other side of the nonmagnetic dislrshaped base plate 1, though not shown in Fig.

The nonmagnetic disk-shaped base plate 1 is necessarily composed of a material exhibiting a thermal expansion coefficient smaller than the thermal expansion coefficient of the soft magnetic underlayer 2. The thermal expansion coefficient of the soft magnetic underlayer, when made mainly of a CoNi alloy, is larger than about 12 x 10-5 / “C. So, the nonmagnetic dislcshaped base plate 1 can be favorably composed of crystallized glass, strengthened glass, or silicon or the like.

[0017] The soft magnetic underlayer 2 is necessarily composed of a material exhibiting a thermal expansion coefficient larger than the thermal expansion coefficient of the nonmagnetic disk-shaped base plate 1 and a saturation magnetostriction constant As that satisﬁes the relation As 2 '1 x 10*5. A material exhibiting a saturation magnetostriction As smaller than -1 x 10-5, which means negative and large absolute Value, is inadequate for a disk substrate for a perpendicular magnetic recording medium because the magnetic anisotropy perpendicular to the film surface occurs due to the tensile stress developed in the plating film, generating large noises.

Measurement of the saturation magnetostriction constant As can be made for example, by the following method. For example, a float, glass substrate of a rectangular strip with dimensions 20 mm x 5 mm x 0.15 mm thick having a known Young’s modulus E is prepared and a plating film is formed on one surface of the substrate. One end of the strip is fixed and a magnetic field is applied in parallel to the plane of the strip while rotating. The deﬂection of the substrate is measured through the displacement of a reﬂected laser light illuminating the end of the substrate opposite to the ﬁxed end. The saturation magnetostriction constant As can be calculated from the change of the amounts of deflection due to the magnetic fields applied along the major axis and the minor axis of the strip (a cantilever method). lOO18l The soft magnetic underlayer 2 is preferably composed of a Co N i'P alloy formed by an electroless plating method, and has a film thickness in the range of 0.2 pm to 3 pm. To obtain the function as a soft magnetic backing layer of a perpendicular magnetic recording medium that allows high density recording, the thickness of the soft magneticlunderlayer needs at least 0.2 pm, while the thickness is preferably at most 3 pm in View of productivity.

Concerning the composition of the soft magnetic underlayer, a phosphorus concentration below 3 at% hardly allows forming a stable electroless plating film, while a phosphorus concentration over 20 at% results too low Bs Value and cannot perform a function as a soft magnetic backing layer.

A cobalt concentration lower than 45 at% in a proportion of number of atoms of cobalt and nickel (Co / (Co + Ni)) is not appropriate since the Bs value cannot be maintained sufficiently high and the saturation magnetostriction constant becomes a negative and large absolute value.

[0019] Although an upper limit of the cobalt concentration is not strictly limited to a special value, a cobalt concentration over 90 at% in a proportion of number of atoms of cobalt and nickel (Co / (Co + Nil) tends to make the CoNi alloy take an hcp structure having a large crystalline magnetic anisotropy constant and to increase coercivity, thus unfavorable. The composition preferably contains at least 10 at% of nickel in a proportion of number of atoms of cobalt and nickel (Ni / (Co + Ni» to stably form an fee structure.

Advantageously, the plating layer of the Co'Ni'P alloy contains at most 2 at% of tungsten or manganese. The containment of the element does not deteriorate the function as a soft magnetic backing layer and yet improves the corrosion resistance. Further, addition of germanium or lead of at most several percent for the purpose of stabilizing the plating bath does not detract from the advantages of the present invention.

The plating films ofa Co-Ni-P alloy, a Co-Ni-W-P alloy, and a Co- Ni~Mn-P alloy as described above can be formed by means of a known method of a so-called kanigen plating method using a reducing agent of sodium hypophosphite, and controlling the composition, temperature, and pH of the plating bath appropriately.

[0020] In order to secure adhesion between the nonmagnetic disk- shaped base plate and the plating film and to promote the initial plating reaction, it is effective to conduct a pretreatment on the nonmagnetic disk base plate prior to the electroless plating step. The pretreatment can be carried out by dipping the base plate in a silane coupling agent solution (for example, 3-aminopropyl ethoxysilane) and then, dipping in palladium chloride solution.

The effects of the invention are preserved when an adhesion layer composed of a nonmagnetic NiP film, for example, is provided between the nonmagnetic disk base plate and the soft magnetic underlayer for improving the adhesivity.

A heating process may be carried out after formation of the soft magnetic underlayer, although the desired performance can be obtained without the heating process in the plating film of the invention. The heating process scarcely deteriorates the magnetic performances and noise characteristics of the soft magnetic underlayer due to magnetic anisotropy induced by the thermal expansion difference between the nonmagnetic disk base plate and the soft magnetic underlayer, as long as the relation between the thermal expansion coefficients of the base plate and the underlayer, and the saturation magnetostriction constant of the underlayer are maintained as described above.

[0021] 2 After forming the soft magnetic underlayer by an electroless plating method or after the heating process described above, a polishing process may be conducted for smoothing the surface of the soft magnetic underlayer. The surface of the soft magnetic underlayer is effectively polished and smoothed using free abrasive.

The polishing can be conducted for example, using a double polishing machine with polishing pads of urethane foam and feeding the abrasive of suspended aluminum oxide or colloidal silica. After the polishing process, a heating process may be conducted.

Concerning the suppression of the magnetic domain wall formation in the soft magnetic underlayer of the Co-Ni'P, Co*Ni'W-P, or Co‘Ni-Mn-P plating, a ratio Mrr6 / Mrc8 needs to be controlled in a range of 0.33 to 3.00, where Mrc8 is a product of thickness and residual magnetization obtained from a magnetization curve measured by applying a magnetic ﬁeld along a circumferential direction of the disk substrate, and Mrrfi is a product of thickness and residual magnetization obtained from a magnetization curve measured by applying a magnetic field along a radial direction of the disk substrate.

[0022] The magnetization tends to align along the circumferential direction of the disk substrate if Mrrﬁ / Mrc8 is smaller than 0.33, and tends to align along the radial direction of the disk if Mrr8 / Mrcﬁ is larger than 3.00. As a result, the magnetic domain walls are liable to be formed along the respective directions, generating undesirable spike noises. Therefore, the ratio Mrr8 / Mrc5 is preferably controlled in a range of 0.33 to 3.00 The Hc value does not strongly correlate to the magnetic domain wall formation, and the recording and reproduction performance improves with the Ho value of not larger than about 20 Oe, rather than with the Ho value of not smaller than 30 Oe that is taught by Patent Documents 3 and 4.

The magnitude of the ratio Mrrﬁ / Mrc5 can be controlled by appropriately adjusting the rotating speed of the nonmagnetic base plate in the plating bath and the composition of the plating bath. The Mrr6 / Mrc6 could also be controlled by applying a magnetic field to the nonmagnetic base plate in the plating bath. The application of a homogeneous magnetic field to the substrate in the plating bath is, however, difﬁcult in a practical production process. Further, the process is very liable to impair the mass productivity.

(Embodiment of a medium) Fig.2 shows a structure of a perpendicular magnetic recording medium of an embodiment of the invention. The perpendicular magnetic recording medium of the embodiment shown in Fig. 2 comprises at least a nonmagnetic seed layer 20, a magnetic recording layer 30, and a protective layer 40 sequentially formed on a disk substrate.l10 for a perpendicular magnetic recording medium shown in Fig. 1. I Though not shown, the nonmagnetic seed layer 20, the magnetic recording layer 30, and the protective layer 40 can also be formed on the other side of the disk substrate 10.

[0023] The nonmagnetic seed layer 20 can be composed of a material to control the crystal alignment and the grain size of the magnetic t\> DJ recording layer 30 favorably, without any special limitation. When the magnetic recording layer 30 is a perpendicular magnetization film composed of a CoCrPt alloy, for example, the nonmagnetic seed layer can be composed of a CoCr alloy, titanium or a titanium alloy, or ruthenium or a ruthenium alloy- When the magnetic recording layer is a so-called laminated perpendicular magnetization film composed of laminated cobalt alloy layers and platinum or palladium layers, the nonmagnetic seed layer 20 can be composed of platinum or palladium. A pre’seed layer or an intermediate layer can be provided on or under the nonmagnetic seed layer 20 Without obstructing the effects of the invention.

'The magnetic recording layer 30 can be composed of any material that allows recording and reproduction in a perpendicular magnetic recording medium. The materials can be selected from the above- mentioned perpendicular magnetization ﬁlms composed of the CoCrPt alloy, the CoCrPt alloy containing an oxide, or a so~called perpendicular magnetization ﬁlm comprising layers of a cobalt alloy and platinum or palladium.

[0024] g_ The protective layer 40 is a thin film composed mainly of carbon, for example. The protective layer 40 can also be composed of the thin film of mainly carbon and a liquid lubricant layer formed by applying a liquid lubricantzsuch as perfluoropolyether on the carbon thin film.

The nonmagnetic seed layer 20, the magnetic recording layer 30, and the protective layer 40 can be formed by a thin film formation technique selected from sputtering, CVD, vacuum evaporation, plating, and the like.

A perpendicular magnetic recording medium manufactured as described above has the favorable recording and reproduction performance as a double layer perpendicular magnetic recording medium since the soft magnetic underlayer 2 in the disk substrate 10 (Fig. 1) acts as a soft magnetic backing layer. In addition, the soft magnetic backing layer is formed by an electroless plating method that exhibits high productivity. Therefore, the medium can be manufactured at a very low cost because the backing layer need not be formed by an expensive method of sputtering, for example.

(An embodiment of a medium With a soft magnetic auxiliary layer) Fig. 3 shows a structure of a perpendicular magnetic recording medium provided with a soft magnetic auxiliary layer of an embodiment of the invention. The perpendicular magnetic recording medium of the embodiment shown in Fig. 3 comprises at least a soft magnetic auxiliary layer 100, a nonmagnetic seed layer 20, a magnetic recording layer 30, and a protective layer 40 sequentially formed on a disk substrate 10 for a perpendicular magnetic recording medium shown in Fig. 1. Though not shown, the soft magnetic auxiliary layer 100, a nonmagnetic seed layer 20, a magnetic recording layer 30, and a protective layer 40 can also be formed on the other side of the substrate 10.

[0025] The nonmagnetic seed layer 20, the magnetic recording layer 30, and the protective layer 40 can be composed of materials similar to the materials used in the perpendicular magnetic recording medium shown in Fig. 2. The soft magnetic auxiliary layer 100 preferably exhibits a product of thickness and saturation magnetic flux density of at least 150 G pm and has a thickness not larger than 50 nm.

Examples of the auxiliary layer includes a CoZrNb amorphous soft magnetic layer 15 to 50 nm thick having a saturation magnetic ﬂux density of 10,000 G and a FeTaC soft magnetic layer 10 to 50 nm thick having a saturation magnetic ﬂux density of 15,000 G.

When the soft magnetic auxiliary layer 100 is provided, both the soft magnetic auxiliary layer 100 and the soft magnetic underlayer 2 (Fig.1) act as soft magnetic backing layers, improving the performance for a double layer perpendicular magnetic recording medium. In addition, an effect is produced to reduce random noises generated in the soft magnetic underlayer 2.

[0026] The soft magnetic auxiliary layer 100 preferably exhibits a product of thickness and saturation magnetic ﬂux density of at least 150 G pm for improving the performance as a soft magnetic backing layer. The thickness is preferably not larger than 50 nm. If the thickness is thicker than 50 nm, magnetic domain walls are apt to be formed in the soft magnetic auxiliary layer 100 generating the spike noises, and also the productivity is deteriorated, thus, such a thickness is unfavorable.

[Examples]

[0027] Specific examples of the substrates and the media according to the embodiment of the invention will be described in the following.

The examples of substrates are the disk substrate 10 in Fig. 1 that comprises soft magnetic underlayers 2 provided on the front and back surfaces of a nonmagnetic diskshaped base plate 1. The examples of media comprise the layers, including magnetic recording layer 30, shown in Fig. 2 and Fig. 3 on the both surfaces of the disk substrate lExample ll

[0028] (Manufacturing a substrate shown in Fig. 1) A nonmagnetic disk'shaped base plate 1 was composed of a strengthened glass substrate manufactured by HOYA Corporation (trade name N5, having a thermal expansion coefficient of 7.1 X 10-5 / °C). T he surface of the substrate was cleaned by alkali washing and acid etching. To form an initial reaction layer and an adhesion layer between the glass disk and a plating film, the substrate was dipped in a solution of a silane coupling agent of 3-propylamino ethoxysilane and then in a palladium chloride solution.

Subsequently, a soft magnetic underlayer 2 of a Co-Ni-P alloy having one of the various thicknesses from 0.5 to 5 pm was formed using a plating bath (1) shown in Table 1. The substrate was rotated in the plating bath at a rotating speed of 10 rpm. The formed soft magnetic underlayers 2 had an average phosphorus concentration of at.% and an average cobalt concentration of 7 1 at% in a proportion ..___.....,.a__.-__._._-__ ..._ - a__ of number of atoms of cobalt and nickel (Co / (Co + Ni».

[0029] [Table ll Plating bath (1) nickel sulfate 10 g / liter cobalt sulfate 10 gl liter sodium hypophosphite 15 g / liter sodium citrate 60 g/ liter boric acid 30 g / liter pH 8iO.2 (adjusted by NaOH and H2804) liquid temperature 80d:2°C The surface of the soft magnetic underlayer 2 was polished using colloidal silica with a mean grain diameter of 60 nm and a polishing pad of urethane form. The surface roughness Ra was 0.3 nm. Thus, a disk substrate 10 for a perpendicular magnetic recording medium as shown in Fig. ]_ was manufactured. The p0lished'off amount was about 0.5 pm in conversion to a thickness. The thicknesses of the soft magnetic underlayer 2 in the following descriptions are all the values after the polishing process.

(Manufacturing a medium of Fig. 2) After cleaning the disk substrate 10 for a perpendicular magnetic recording medium, the substrate was introduced into a sputtering apparatus. After heating the substrate by a lamp heater for 10 seconds to reach a surface temperature of 200°C, deposited on the substrate surface were a nonmagnetic seed layer of titanium with a thickness of 10 nm using a titanium target, subsequently a magnetic recording layer of a CoCrPt alloy with a thickness of 30 nm using a target of Co7oCr2oPt1o, and finally a protective layer of a carbon protective ﬁlm 8 nm thick using a carbon target. Then, the substrate with the layers was taken out from the vacuum chamber. All these deposition processes by sputtering were conducted by a DC magnetron sputtering method under an argon gas pressure of 5 mTorr. After that, a liquid lubricant layer 2 nm thick was formed of perﬂuoropolyether by a dipping method, to produce a perpendicular magnetic recording medium of Fig. 2.

(Evaluation) The recording and reproduction performance was measured on the thus fabricated perpendicular magnetic recording media using a spinning stand tester equipped with a single pole type magnetic head for a perpendicular magnetic recording medium. {(3030} Fig. 4 shows the dependence of the reproduced output signal at a recordinggdensity of 300 kFCI (flux change per inch) on the write current in the magnetic head.

In the case the thickness of the soft magnetic underlayer is zero, that is, the case without a soft magnetic underlayer, the reproduced output is scarcelyiobtained. In the case the thickness of the soft magnetic underlayer is thinner than 0.2 pm, the reproduced output is relatively low, and further, not saturated with increase of the write current.

The slow saturation of the reproduced output with increase of the write current requires large current to obtain high output. Moreover, in the region of unsaturated reproduction output, the variation of the write current produces the large variation of the reproduced output, which is unfavorable in the practical application.

In contrast, in the case the thickness of the soft magnetic underlayer is not smaller than 0.2 pm, a sufficient reproduction output is obtained and the reproduction output is saturated at a low write current, thus, a practically favorable medium is obtained. lExample 2]

[0031] (Examples of the substrate of Fig. 1 and the medium of Fig. 2) Disk substrates 10 for a perpendicular magnetic recording medium of Fig. 1 were manufactured in the same manner as in Example 1 except that the thickness of the soft magnetic underlayer 2 was 1.5 pm and the average phosphorus concentration in the soft magnetic underlayer 2 was varied in the range of 3 at% to 24 at% by varying the conditions of the plating bath in the range shown in the plating bath (2) of Table 2.

The average cobalt concentration in the soft magnetic underlayer 2 was in the range of 67 at% to 72 at% in a proportion of number of atoms of cobalt and nickel (Co / (Co + ND).

Then, perpendicular magnetic recording media of Fig. 2 were manufactured as in Example 1.

[0032] [Table 2] Plating bath (2) nickel sulfate 7 - 12 g / liter cobalt sulfate '7 - 12 g / liter sodium hypophosphite 10 - 30 g / liter sodium citrate 20 - 80 g / liter sodium tartrate O - 150 g / liter sodium acetate 0 - 80 g / liter pH 8i0.2 (adjusted by NaOH and H2804) liquid temperature 80d:2°C When the phosphorus concentration was less than 8 at%, the plating bath was found very unstable and unacceptable in mass production.

The recording and reproduction performance was measured on these media as in Example 1.

Fig. 5 shows the dependence of the reproduced output signal at a recording density of 300 kFCI on the write current in the magnetic head.

When the average phosphorus concentration in the soft magnetic underlayer is lower than 20 at%, the obtained reproduction output is sufﬁcie nt, while in the case higher than 22 at%, the reproduced output decreases and the saturation is slower, thus, the performance is insufficient for a soft magnetic backing layer.

[Example 3]

[0033] s (Examples of the substrate of Fig. 1 and the medium of Fig. 2) Disk substrates 10 for a perpendicular magnetic recording medium of Fig. 1 were manufactured in the same manner as in Example 1 except that the thickness of the soft magnetic underlayer 2 was 1.5 pm and the average cobalt concentration in the soft magnetic underlayer 2 was varied in the range of 17.5 at% to 92.0 at% in a proportion of number of atoms of cobalt and nickel (Co/ (Co + Nil) by varying the conditions of the plating bath in the range shown in the plating bath (3) of Table 3.

In addition, samples for measuring the saturation maghetostriction were fabricated by the same electroless plating on the substrates of a strip of ﬂoat glass with the dimensions of 20 mm X mm X 0.15 mm thick.

The mean phosphorus concentration in the soft magnetic underlayer 2 was in the range of 12 at% to 20 at%.

[0034] lTable 3l Plating bath (8) nickel sulfate 6 - 18 g / liter cobalt sulfate 2 - 14 g / liter sodium hypophosphite 10 ' 20 g / liter sodium citrate 60 g / liter pH 6.5:t0.2 to 8i0.2 (adjusted by NaOH and H2804) liquid temperature 80i2°C (Comparative Example) A comparative example of a disk substrate was manufactured in the same manner as in Example 1 except that a soft magnetic underlayer 2 of a soft magnetic NiP plating layer 1.5 pm thick was formed using a plating bath (4) shown in Table 4. A sample for measuring the saturation magnetostriction was also fabricated as described above. Mean phosphorus concentration in the soft magnetic NiP plating film was 7 at%. A perpendicular magnetic recording medium was also manufactured using this disk substrate as in Example 1.

[0035] [Table 4] Plating bath (4) nickel sulfate 25 g / liter sodium hypophosphite 15 g / liter sodium acetate 10 g / liter sodium citrate 15 g / liter pH 6:tO.1 (adjusted by NaOH and H2304) liquid temperature 90i1°C (Evaluation) The noises generated from the soft magnetic underlayer were measured on these media using a spinning stand tester equipped with a single pole type magnetic head for a perpendicular magnetic recording medium.

Fig 6 shows the reproduced output detected after dc demagnetization of the media with a write current of 50 mA represented in a dependence on the mean cobalt concentration in the soft magnetic underlayer in a proportion of number of atoms of cobalt and nickel (Co / (C0 + Nil).

The reproduced output detected from the medium provided with a soft magnetic NiP plating film fabricated in the Comparative Example is indicated in Fig 6 as the point at zero at% of the mean cobalt concentration. The reproduction output in this measurement is detected in the condition in which the magnetization in the magnetic recording layer orients in one direction by the dc demagnetization. Consequently, the detected noises can be deemed mostly generated from the soft magnetic underlayer (soft magnetic backing layer).

[0036] ln the cases the mean cobalt concentration is 43.4 at% and below in a proportion of atoms of cobalt and nickel (Co / (Co + Ni)), and in the case of the medium provided with the soft magnetic NiP plating film (mean cobalt concentration of zero at%), Very large reproduction output was detected even though in the dc demagnetized condition, thus, inadequate for use as a perpendicular magnetic recording medium.

In the cases the mean cobalt concentration is 48.2 at% and more in a proportion of number of atoms of cobalt and nickel (Co / (Co + N i)), the detected reproduction output was small.

Then, the saturation magnetostriction constant As was measured by means of the cantilever method using the samples for measuring saturation magnetostriction.

Fig. 7 shows the saturation magnetostriction constant As represented in a dependence on the mean cobalt concentration in the soft magnetic underlayer in a proportion of number of atoms of cobalt and nickel (Co / (Co + ND). The saturation magnetostriction constant As measured on the sample provided with a soft magnetic NiP plating film fabricated in the Comparative Example is indicated in Fig 7 as the point at zero at% of the mean cobalt concentration.

[0037] The value of the As was negative for the soft magnetic NiP plating film (mean cobalt concentration of zero at%) and decreased the absolute Value with increase of the mean cobalt concentration.

The As Value reaches -1 x 10-5 at the mean cobalt concentration of about 45 at%, and then reaches zero at the mean cobalt concentration ofabout 50 at%. Afterwards, the As becomes a positive value.

Comparing Fig. 7 and Fig. 6, it can be noted that noises are large in the region As < '1 x 10-5, and noises are small in the region As 2 -1 x lO‘5.

The recording and reproduction characteristics are measured as in Example 1 on the media having the mean cobalt concentration of 48.2 at % and larger in a proportion of number of atoms of cobalt and nickel (Co / (Co + Nil), those media exhibiting small reproduced output in the above-described measurement in the dc demagnetized condition.

Fig. 8 shows the reproduced output signal at a recording density of 300 kFCl in the dependence on the write current in the magnetic head. High reproduced output signal and fast saturation of the reproduced output have been obtained in the media comprising a soft magnetic underlayer having the mean cobalt concentration in the range of 48.2 at% to 79.1 at% in a proportion of number of atoms of cobalt and nickel (Co/(Co + Ni».

[0038] On the other hand, in the case of the mean cobalt concentration of 92.0 at% in a proportion of number of atoms of cobalt and nickel (Co/(Co + Ni», the reproduced output decreases and the saturation goes slow down, thus, insufficient function as a soft magnetic backing layer has been suggested.

[Example 4l

[0039] (Examples of substrates of Fig. 1 and media of Fig. 2) Disk substrates 10 for a perpendicular magnetic recording medium of Fig. 1 were manufactured in the same manner as in Example 1 except that the thickness of the soft magnetic underlayer 2 was 15 pm, and the deposition speed of the soft magnetic underlayer 2 by a plating process was varied by changing the rotating speed of the substrate in the plating bath in the range from zero to 20 rpm, and-ychanging the plating bath temperature.

The average phosphorus concentration in the soft magnetic underlayer was in the range of 10 at% to 20 at%, and the average cobalt concentration was in the range of 67 at% to 72 at% in a proportion of number of atoms of cobalt and nickel (Co/(Co + N ill.

After cutting the substrate into 8 mm square and removing the plating film on one side of the substrate by polishing, the magnetization curves were measured in the disk radial direction and CI‘! the disk circumferential direction using a vibrating sample magnetometer (VSM) to obtain the residual magnetizations Mrr and Mrc, and the coercivities Her and Hcc.

[0040] Fig. 9 shows a typical magnetization curve and the definitions of the residual magnetization and the coercivity. The Values of Mrr6 / Mrc8 of the produced soft magnetic underlayer were in the range of 0.05 to 12.

Using the uncut disk substrates, perpendicular magnetic recording media as shown in Fig. 2 were manufactured in the same manner as in Example 1.

On these perpendicular magnetic recording media, the spike noises were measured using a spinning stand tester equipped with a single magnetic pole type magnetic head for a perpendicular magnetic recording medium.

In the first of the measurement, direct current demagnetization of the perpendicular magnetic recording medium was carried out by supplying the writing element of the magnetic head with the dc current of 50 mA. Then, the current in the writing element was decreased to zero and the signal generated in the perpendicular magnetic recording medium was read out without writing‘in.

Table 5 shows occurrence of the spike noise in each perpendicular magnetic recording medium, and the Value of Mrr5 / Mrc8 and mean Value Hc of Her and Hcc obtained from the magnetization curve for the corresponding substrate.

[0041] [Table 5] Mrro / Mrcfi He (Oe) spike noises 0.005 4 X 0.14 3 X 0.27 5 X 0.31 8 A 0.38 8 O .5 18 O 1.3 12 O 2.2 8 O 2.9 7 O 3.1 9 x ‘7 4 k X 85 3 X Symbols K, O. and A respectively indicate that spike noises were generated, no spike noise was generated, and Very little Spike noises were generated.

The perpendicular magnetic recording medium exhibiting the Value Mrr5 / Mrcﬁ of in the range of 0.33 to 3.0 generated no spike noise. The Hc value of the media that did not generate spike noise was not more than 20 Oe.

[Example 5l

[0042] (Examples of the substrates of Fig. 1 and the media of Fig. 3) Disk substrates 10 for a perpendicular magnetic recording medium of Fig. 1 were manufactured in the same manner as in Example 1 except that the thickness of the soft magnetic underlayer 2 was 1.5 pm. The value of Mrrﬁ / Mrc8 of this substrate was 1.5, which was measured using a VSM by the method described in Example 4.

After cleaning, each of these disk substrates 10 for perpendicular magnetic recording medium was introduced into a sputtering apparatus. Soft magnetic auxiliary layers 100 of a NiFe alloy having a thickness of in the range of O to 100 nm were formed using a target of NisoFe2o. Subsequent processes from substrate heating were conducted in the same manner as in Example 1, to produce perpendicular magnetic recording media shown in Fig. 3. The saturation magnetic flux density of the thus formed soft magnetic auxiliary layers 100 was 10,000 G.

[0043] I Fig. 10 shows the signal'to'noise ratio SNR at a recording density of 370 kFCI (ﬂux change per inch) in the dependence on the thickness of the soft magnetic auxiliary layer.

The effect of SNR improvement is unsatisfactory when the thickness of the soft magnetic auxiliary layer is thinner than 15 nm, which is equivalent to the product of the thickness and the saturation magnetic flux density less than 150 G pm. Forming the soft magnetic auxiliary layer of at least 15 nm achieves the SNR improvement by 0.5 dB to 1 dB in comparison with the case without the soft magnetic auxiliary layer.

While the SN R is practically constant in the range of the thickness of 15 nm or more, the media provided with a soft magnetic auxiliary layer thicker than 50 nm caused the detection of spike noises that can be attributed to the soft magnetic auxiliary layer, and found inappropriate for a perpendicular magnetic recording medium.

[Example 6']

[0044] (Examples of the substrate of Fig. 1 and the medium of Fig. 2) Disk substrates 10 for a perpendicular magnetic recording medium of Fig. 1 were manufactured in the same manner as in Example 1 except that the conditions of the plating bath were as shown in the plating bath (5) of Table 6.

In addition, samples for measuring the saturation magnetostriction were fabricated by the same electroless plating method on the substrates of a strip of ﬂoat glass with the dimensions of 20 mm X 5 mm X 0.15 mm thick.

The mean cobalt concentration in the soft magnetic underlayer 2 was in the range of 68 at% to 72 at% in a proportion of number of atoms of cobalt and nickel (Co/(Co + Ni», and the mean phosphorus concentration was in the range of 5 at% to 13 at%. The mean tungsten concentration was in the range of 0.1 at% to 2 at%. The mean tungsten concentration increased no more than the uppermost value of 2 at% even with increase of the quantity of sodium tungstate in the plating bath.

[0045] [Table 6] Plating bath (5) sodium tungstate 1.6 ' 8.2 g / liter nickel sulfate 5 g / liter cobalt sulfate 5 g / liter sodium hypophosphite 20 gl liter sodium citrate 60 g / liter Mnviﬁ M Horic acid 30 g / liter pH 8250.2 (adjusted by NaOH and H2804) liquid temperature 80i0.2°C Perpendicular magnetic recording media of Fig. 2 were manufactured as in Example 1 using the fabricated samples of the disk substrates for a perpendicular magnetic recording medium. One sheet of the sample of the perpendicular magnetic recording medium was left in an atmosphere at a temperature of 80°C and a relative humidity of 85 % for 96 hr. After that, the sample of the perpendicular magnetic recording medium was dipped in 50 ml of ultra high purity water. After pure water extraction by a shaker for 3 minutes, an ICP'MS measurement was conducted using ELAN‘ DRCII (a product of PerkinElmer, Inc).

Fig. 11 shows the measurement result of the amount of dissolved cobalt. The amount of dissolved cobalt decreases by adding at most 2 at% of tungsten. It has been demonstrated that a soft magnetic underlayer 2 ofa Co'Ni'W*P alloy containing at most 2 at% of tungsten improves the corrosion resistance as compared with an underlayer 2 ofa Co-Ni-P alloy without tungsten. l0046l The saturation magnetostriction constant As was measured on the sample for measuring the saturation magnetostriction by a cantilever method, and resulted in the value of the saturation magnetostriction constant in the range As 2 -1 x 10-5.

[Example 7]

[0047] (Examples of the substrate of Fig. 1 and the medium of Fig. 2) Disk substrates 10 for a perpendicular magnetic recording medium of Fig. l were manufactured in the same manner as in Example 1 except that the conditions of the plating bath were as shown in the plating bath (6) of Table 7.

The mean cobalt concentration in the soft magnetic underlayer 2 was in the range of 55 at% to 60 at% in a proportion of number of atoms of cobalt and nickel (Co I (Co + Ni», and the mean phosphorus concentration was in the range of 8 at% to 18 at%. The mean manganese concentration was in the range of 0.3 at% to 2 at%.

Containment of more than 2 at% of manganese makes the film surface coarse, and thus, undesirable.

[0048] [Table 7] Plating bath (6) manganese sulfate 6 - 12 g / liter nickel sulfate 10 g / liter cobalt sulfate 10 g / liter sddium hypophosphite 40 g/ liter sodium citrate 60 g/ liter boric acid 30 g / liter pH 8:02 (adjusted by NaOH and H2804) liquid temperature 80i2°C Perpendicular magnetic recording media of Fig. 2 were manufactured as in Example 1 using the fabricated samples of the disk substrates for a perpendicular magnetic recording medium.

Fig. 12 shows the amount of dissolved cobalt measured by the same method as in Example 6. The amount of dissolved cobalt decreases by adding at most 2 at% of manganese. It has been demonstrated that a soft magnetic underlayer 2 of a Co-Ni-Mn'P alloy containing at most 2 at% of manganese improves the corrosion resistance as compared with an underlayer 2 of a Co-Ni-P alloy without manganese.

Claims

CLAIMS What is claimed isl

1. I. A disk substrate for a perpendicular magnetic recording medium comprising at least a soft magnetic underlayer formed on a nonmagnetic disk-shaped base plate by means of an electroless plating method, characterized in that a thermal expansion coefficient of the soft magnetic underlayer is larger than a thermal expansion coefficient of the nonmagnetic disk'shaped base plate and a saturation magnetostriction constant As satisﬁes a relation As > '1 x 1045.

2. The disk substrate for a perpendicular magnetic recording medium according to claim 1, wherein the nonmagnetic diskshaped base plate is composed of chemically reinforced glass or crystallized glass.

3. The disk substrate for a perpendicular magnetic recording medium according to claim 1 or claim 2, wherein the soft magnetic underlayer is composed of a Co'Ni'P alloy that contains phosphorus in a range of 3 at% to 20 at% and cobalt in an amount of at least 45 at% in a proportion of number of atoms of cobalt and nickel (Co / (Co + ND), and a thickness of the soft magnetic underlayer is in a range of 0.2 pm to 3 pm.

4. The disk substrate for a perpendicular magnetic recording medium according to claim 3, wherein the soft magnetic underlayer further contains tungsten or manganese in an amount of at most 2 at%.

5. The disk substrate for a perpendicular magnetic recording medium according to any one of claims 1 through 4, wherein the soft magnetic underlayer exhibits a ratio Mrr 5 / Mrc 6 in a range of 0.33 to 3.00, in which Mrc 6 is a product of the thickness and residual magnetization obtained from a magnetization curve measured by applying a magnetic ﬁeld along a circumferential direction of the disk substrate, and Mrr 8 is a product of the thickness and residual magnetization obtained from a magnetization curve measured by applying a magnetic field along a radial direction of the disk substrate.

6. A perpendicular magnetic recording medium characterized in that3 the medium comprises the disk substrate for a perpendicular magnetic recording medium according to any one of claims 1 through 5, and at least a nonmagnetic seed layer, a magnetic recording layer, and a protective layer sequentially formed on the substrate; and the soft magnetic underlayer of the substrate is utilized as at least a part ofa soft magnetic backing layer for the magnetic recording layer. 45

7. , The perpendicular magnetic recording medium according to claim 6 further comprising at least a soft magnetic auxiliary layer having a thickness of at most 50 nm and exhibiting a product of the thickness and a saturation magnetic flux density of at least 150 G pm, disposed between the soft magnetic underlayer and the nonmagnetic seed layer.

8. A disk substrate substantially as described herein with reference to the accompanying drawings. 9, A perpendicular magnetic recording medium substantially as desrribed herein with reference to the accompanying drawings.