JP3588039B2 - Magnetic recording medium and magnetic recording / reproducing device - Google Patents

Description

【００３１】
表１より、第１下地膜２を設けない磁気記録媒体（試験例２）に比べ、第１下地膜２を設けたものは、ノイズ特性（ＳＮＲ）、保磁力（Ｈｃ）の点で優れた結果が得られたことがわかる。
【００３２】
【発明の効果】
以上説明したように、本発明の磁気記録媒体は、第１下地膜が、Ｂ２構造をなす材料からなるものであるので、保磁力、角型比を向上させるとともに、ノイズ特性を高めることができる。
また、本発明の磁気記録再生装置によれば、上記磁気記録媒体を用いるので、保磁力、角型比を向上させるとともに、ノイズ特性を高めることができる。従って、高記録密度化が可能となる。
【図面の簡単な説明】
【図１】本発明の磁気記録媒体の第１実施形態を示す一部断面図である。
【図２】第１下地膜の厚さと、垂直磁性膜の（０００２）面の配向性との関係を示すグラフである。
【図３】通常の面内磁気記録媒体に用いられる磁気ヘッドを用いた場合において、上記磁気記録媒体の保磁力（Ｈｃ）とＳＮＲを測定した結果を示すグラフである。
【図４】本発明の磁気記録媒体の第２実施形態を示す一部断面図である。
【図５】図１に示す磁気記録媒体を用いた磁気記録再生装置の一例を示す概略構成図である。
【図６】本発明の磁気記録媒体の第３実施形態を示す一部断面図である。
【符号の説明】
１・・・基板、２・・・第１下地膜、３・・・第２下地膜、４・・・非磁性中間膜、５・・・垂直磁性膜[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to a magnetic recording medium and a magnetic recording / reproducing apparatus using the magnetic recording medium.
[0002]
[Prior art]
Most magnetic recording media currently on the market are in-plane magnetic recording media in which the easy axis of magnetization in the magnetic film is mainly oriented horizontally with respect to the substrate.
In such an in-plane magnetic recording medium, when the recording density is increased, the bit volume becomes too small, and the reproduction characteristics may be deteriorated due to the thermal fluctuation effect. Further, when the recording density is increased, medium noise may increase due to the influence of a demagnetizing field at a recording bit boundary.
In contrast, so-called perpendicular magnetic recording media, in which the easy axis of magnetization in the magnetic film is mainly oriented perpendicular to the substrate, are less affected by the demagnetizing field at the bit boundaries even when the recording density is increased, and the boundaries are sharp. Low magnetic noise is possible due to the formation of a large recording magnetic domain, and the high recording density is possible even with a relatively large bit volume. A medium structure suitable for perpendicular magnetic recording has been proposed.
For example, JP-A-58-77025 and JP-A-58-141435 disclose the use of Ti as a material for an underlayer of a perpendicular magnetic film made of a Co alloy material. Japanese Patent Application Laid-Open No. 8-180360 discloses that an alloy composed of Co and Ru is used as a material of the underlayer.
[0003]
[Problems to be solved by the invention]
In recent years, there has been a demand for higher recording densities of magnetic recording media, and accordingly, there has been a demand for improved noise characteristics.
However, the conventional magnetic recording medium is never satisfactory in terms of noise characteristics, and a magnetic recording medium having more excellent noise characteristics has been demanded.
The present invention has been made in view of the above circumstances, and has as its object to provide a magnetic recording medium and a magnetic recording / reproducing apparatus having excellent noise characteristics.
[0004]
[Means for Solving the Problems]
In the magnetic recording medium of the present invention, a first underlayer and a second underlayer are provided on a substrate, and a perpendicular magnetic film made of a Co alloy and having an easy axis of magnetization mainly oriented perpendicular to the substrate is provided thereon. The first underlayer is made of a material having a B2 structure, the second underlayer is made of a material having an hcp structure, and the first underlayer and the second underlayer are in contact with each other and are perpendicular to the second underlayer. A non-magnetic intermediate film having an hcp structure is provided between the magnetic film and the magnetic film, and the non-magnetic intermediate film is made of a CoCr alloy .
The first underlayer can be made of a material mainly containing one or more alloys of NiAl, FeAl, CoFe, CoZr, NiTi, AlCo, and AlMn.
In the case where the first base film is made of a material mainly containing any binary alloy of NiAl, FeAl, CoFe, CoZr, NiTi, AlCo, and AlMn, the binary alloy is The content of each of the two components is 40 to 60 at%, and preferably 45 to 55 at%.
For the second underlayer, a material containing one or more of Ti, Zr, Ru, Re, Y, Gd, and Tb as a main component can be used.
The perpendicular magnetic film is made of one of Co / Cr / Pt, Co / Cr / Ta, Co / Cr / Pt / X (X: Ta, Zr, Nb, Cu, Re, Ni, and B, or 2 Or more of them).
It is preferable that the thickness of the first underlayer be 500 ° or less.
The thickness of the perpendicular magnetic film is preferably set to 100 to 1000 °.
The magnetic recording / reproducing apparatus of the present invention includes a magnetic recording medium and a magnetic head for recording / reproducing information on / from the magnetic recording medium, wherein the magnetic recording medium is provided with a first underlayer and a second underlayer on a substrate. And a perpendicular magnetic film having a Co-alloy thereon and an axis of easy magnetization oriented mainly perpendicular to the substrate is provided, the first underlayer is made of a material having a B2 structure, and the second underlayer is formed of an hcp structure. The first base film and the second base film are in contact with each other, and a non-magnetic intermediate film having an hcp structure is provided between the second base film and the perpendicular magnetic film. The film is made of a CoCr alloy .
[0005]
BEST MODE FOR CARRYING OUT THE INVENTION
FIG. 1 shows an embodiment of a magnetic recording medium according to the present invention. The magnetic recording medium shown in FIG. 1 includes a substrate 1, a first base film 2, a second base film 3, a non-magnetic intermediate film 4, A perpendicular magnetic film 5 and a protective film 6 are sequentially formed.
As the substrate 1, an aluminum alloy substrate on which a NiP plating film generally used as a substrate for a magnetic recording medium is formed (hereinafter, referred to as “NiP plated Al substrate”), a glass substrate, a ceramic substrate, a carbon substrate, a flexible resin substrate Alternatively, a substrate in which a NiP film is formed on these substrates by plating or sputtering can be used.
[0006]
The first underlayer 2 is for improving coercive force and squareness ratio and improving noise characteristics of the magnetic recording medium, and is made of a material having a B2 structure.
As the material having the B2 structure, a material mainly containing one or more alloys of NiAl, FeAl, CoFe, CoZr, NiTi, AlCo, and AlMn can be used. Further, a material in which elements such as Cr, Nb, V, W, and Mo are added to these alloys can also be used.
[0007]
When a material containing any of the above binary alloys (NiAl, FeAl, CoFe, CoZr, NiTi, AlCo, and AlMn) as a main component is used, the content of the two components constituting the alloy is Is preferably 40 to 60 at% (preferably 45 to 55 at%).
If the content is less than the above range or exceeds the above range, the B2 structure in the first underlayer 2 may be disturbed, and the effect of improving noise characteristics may be reduced.
[0008]
The thickness of the first base film 2 is preferably determined as follows.
FIG. 2 is a graph showing the relationship between the thickness of the first underlayer 2 and the orientation of the (0002) plane of the perpendicular magnetic film 5 in the magnetic recording medium having the above configuration.
In this graph, the horizontal axis represents the thickness of the first underlayer 2, and the vertical axis represents the X-ray diffraction intensity corresponding to the (0002) plane of the perpendicular magnetic film 5.
As shown in this graph, the X-ray diffraction intensity reaches a peak when the thickness of the first underlayer 2 is 25 °, and thereafter decreases as the thickness of the first underlayer 2 increases.
According to this graph, the vertical orientation of the perpendicular magnetic film 5 increases when the thickness of the first underlayer 2 is about 25 °, that is, 15 to 40 ° (particularly, 20 to 30 °). It can be seen that when the thickness is further increased, it gradually decreases.
Hereinafter, a region where the thickness of the first base film 2 is about 25 ° (that is, 15 to 40 °) is referred to as a region A.
[0009]
FIG. 3 is a graph showing the measurement results of the coercive force Hc (Oe) and SNR (dB) of the magnetic recording medium when a ring-type head, which is a magnetic head used for a normal longitudinal magnetic recording medium, is used. It is.
In this graph, the horizontal axis indicates the thickness of the first underlayer 2, and the vertical axis indicates coercive force (Hc) and SNR.
From this graph, it can be seen that Hc sharply increases until the thickness of the first underlayer 2 reaches the region A, and thereafter increases very little.
As for the SNR, the thickness of the first underlayer 2 increases until reaching the region A, and once becomes substantially constant, then increases again in the region where the thickness of the first underlayer 2 is 80 to 500 °, It can be seen that after passing through this region, the temperature slightly decreases and becomes a substantially constant value.
Hereinafter, a region where the thickness of the first base film 2 is 80 to 500 ° is referred to as a B region. In particular, the SNR has a particularly high value in the range of 80 to 300 °, and more particularly, 80 to 150 ° in the B region.
[0010]
According to this graph, when a magnetic head (ring-type head) used for a normal in-plane magnetic recording medium is used, a region B having a lower perpendicular orientation than a region A having a higher perpendicular orientation of the perpendicular magnetic film 5 is used. It can be seen that excellent SNR characteristics can be obtained in
The reason that the SNR characteristic is improved in the region B having a low vertical orientation is that the magnetization direction is mostly in the vertical direction in the region A having a high vertical orientation, whereas the orientation of the magnetic film 5 has a certain degree in the region B. Since the magnetization is random, the magnetization in the in-plane direction also increases, and a loop-shaped magnetization curve composed of the perpendicular direction and the in-plane direction is formed, whereby the magnetization is stabilized and the output is improved. Conceivable.
[0011]
In a region where the thickness of the first base film 2 is larger than the region B, Hc is higher than that in the region B, and it is considered that the reproduction output level is higher in accordance with the increase of Hc.
For this reason, in the region where the thickness of the base film 2 is larger than the region B, although the SNR, which is the ratio between the reproduction output and the noise, decreases only slightly, compared to the region B, the increase in the noise is considered to be remarkable. Can be
From this, it is considered that setting the thickness of the first base film 2 in the B region can suppress the noise level lower than the case where the thickness of the base film 2 is set to a value exceeding the B region. Can be
[0012]
From the above results, it is understood that the thickness of the first base film 2 is preferably determined as follows.
When it is assumed that a ring-type head, which is a magnetic head used for a normal longitudinal magnetic recording medium, is used, the thickness of the first underlayer 2 is 80 to 500 [deg.] Corresponding to the B region. (Preferably 80 to 300 °, more preferably 80 to 150 °) is preferable because the SNR characteristics can be further improved.
If the thickness is less than the above range, the SNR characteristics deteriorate. This is because, when the thickness is less than the above range, the magnetization in the in-plane direction is less likely to occur due to an increase in the vertical orientation, and as a result, the effect of improving the output by forming the above-mentioned loop-shaped magnetization curve is obtained. It is thought that this is because it is difficult to be performed.
If the thickness exceeds the above range, the noise characteristics deteriorate. If the thickness exceeds the above range, the crystal grains become coarse in the first underlayer 2, so that the nonmagnetic intermediate film 4 and the perpendicular magnetic film 5 formed on the underlayer 2 also become large. This is considered to be because the coarsening of the crystal grains progresses, thereby increasing noise.
[0013]
The second underlayer 3 is for enhancing the vertical orientation of the nonmagnetic intermediate film 4 and the perpendicular magnetic film 5, and is made of a material having an hcp structure.
As a constituent material of the second base film 3, a material containing one or more of Ti, Zr, Ru, Re, Y, Gd, and Tb as main components can be used.
As this material, any one of Ti, Zr, Ru, Re, Y, Gd, and Tb can be used alone, and lattice matching (matching) with the nonmagnetic intermediate film 4 and the perpendicular magnetic film 5 can be used. In consideration of the above, an alloy in which Cr, Co, Fe, Ni, or the like is added to these materials may be used.
Note that the second base film 3 may have a partially fcc structure.
[0014]
The non-magnetic intermediate film 4 is for increasing the coercive force of the medium, and is made of a non-magnetic material having an hcp structure.
Examples of the material of the non-magnetic intermediate film 4 include Co / Cr-based, Co / Cr / Pt-based, Co / Cr / Ta-based, and Co / Cr / Pt / X-based (X: Ta, Zr, Nb, Cu, Re, It is preferable to use an alloy of one or more of Ni and B).
In particular, it is preferable to use a material whose main component is a Co alloy having a Cr content of 25 to 50 at%, a Pt content of 0 to 15 at%, an X content of 0 to 10 at%, and a balance of Co. .
The nonmagnetic intermediate film 4 may have a single-layer structure or a multi-layer structure. In the case of a multilayer structure, a plurality of the same or different materials selected from the above materials may be stacked.
[0015]
It is preferable that the thickness of the non-magnetic intermediate film 4 be 500 ° or less.
If the thickness exceeds 500 °, the magnetic particles in the perpendicular magnetic film 5 are likely to become coarse, and the noise characteristics are undesirably reduced.
More preferably, the thickness of the non-magnetic intermediate film 4 is 20 to 300 °. For the above reason, the thickness of the non-magnetic intermediate film 4 in the case of a multilayer is preferably 500 ° or less in total, preferably 50 to 200 °.
[0016]
The perpendicular magnetic film 5 is a film made of a magnetic material whose easy axis of magnetization is mainly oriented in a direction perpendicular to the substrate, and includes Co / Cr / Pt-based, Co / Cr / Ta-based, Co / It is preferable to use any alloy of the Cr / Pt / X system (X: one or more of Ta, Zr, Nb, Cu, Re, Ni, and B).
In particular, it is preferable to use a Co alloy having a Cr content of 13 to 28 at%, a Pt content of 0 to 15 at%, an X content of 0 to 5 at%, and a balance of Co. When the content of each of the above components is out of the above range, the noise characteristics or the reproduction output are undesirably reduced.
[0017]
It is preferable that the thickness of the perpendicular magnetic film 5 be 100 to 1000 °. If the thickness of the perpendicular magnetic film 5 is less than 100 °, sufficient magnetic flux cannot be obtained, and the reproduction output decreases.
On the other hand, if the thickness of the perpendicular magnetic film 5 exceeds 1000 °, the magnetic particles in the perpendicular magnetic film 5 become coarse, and the noise characteristics deteriorate, which is not preferable.
More preferably, the thickness of the perpendicular magnetic film 5 is 200 to 700 °. This is because, when the thickness of the perpendicular magnetic film 5 is in this range, the reproduction output can be further improved, and the magnetic particles in the perpendicular magnetic film 5 can be prevented from being roughened, and the noise characteristics can be further improved. .
[0018]
The protective film 6 is for preventing corrosion of the perpendicular magnetic film 5, preventing damage to the medium surface when the head comes in contact with the medium, and ensuring lubrication characteristics between the head and the medium. A material can be used, for example, a single composition of C, SiO ₂ , or ZrO ₂ , or a material containing these as a main component and containing other elements can be used.
The thickness of the protective film 6 is desirably 10 to 100 °.
Further, it is preferable to provide a lubricating film made of perfluoropolyether, fluorinated alcohol, fluorinated carboxylic acid, or the like on the protective film 6.
[0019]
In order to manufacture the magnetic recording medium having the above structure, a first underlayer 2, a second underlayer 3, a non-magnetic intermediate film 4, and a perpendicular magnetic film 5 are sequentially formed on a substrate 1 by sputtering, vacuum deposition, ion plating. Then, the protective film 6 is formed preferably by a plasma CVD method, an ion beam method, or a sputtering method.
When forming the first base film 2, it is preferable to use a sputtering target made of a material having a B2 structure. As this material, those described above can be used.
Further, in order to form a lubricating film, a conventionally known method such as a dipping method and a spin coating method can be adopted.
[0020]
In the magnetic recording medium having the above structure, the first underlayer 2 is made of a material having the B2 structure, so that the coercive force and the squareness can be improved, and the noise characteristics can be improved.
The reason why the above effects can be obtained by providing the first base film 2 made of the material having the B2 structure is not clear, but it can be assumed that the reason is as follows.
That is, the perpendicular magnetic film 5 formed on the first base film 2 via the second base film 3 and the non-magnetic intermediate film 4 grows under the influence of the first base film 2 having the B2 structure.
It is considered that in the perpendicular magnetic film 5 grown under the influence of the first underlayer 2 having the B2 structure, the crystal grains become finer, isolated and uniform.
Thus, it is considered that the coercive force and the squareness ratio are increased, and a recording magnetic domain having a sharp boundary is formed, so that noise can be reduced.
[0021]
Further, by forming the second underlayer 3 from a material having an hcp structure, the perpendicular orientation of the perpendicular magnetic film 5 formed on the second underlayer 3 via the non-magnetic intermediate film 4 is enhanced, Noise characteristics and coercive force can be improved.
This effect is considered to be obtained by improving the matching of the lattice between the first underlayer 2 and the non-magnetic intermediate layer 4 in the second underlayer 3 having the hcp structure.
[0022]
Further, by disposing the non-magnetic intermediate film 4 having the hcp structure between the second underlayer 3 and the perpendicular magnetic film 5, disturbance of crystal orientation during initial growth of the perpendicular magnetic film 5 is prevented, and The crystal orientation of the film 5 can be improved, and high coercive force and low noise can be achieved.
[0023]
In the present invention, as shown in FIG. 4, a soft magnetic film 12 can be provided between the substrate 1 and the first underlayer 2.
As a constituent material of the soft magnetic film 12, a Co amorphous material (for example, an alloy such as CoZrNb, CoTaNb, Permalloy, or Sendust) can be used. The thickness of the soft magnetic film 12 is preferably 50 nm or more (preferably 100 nm or more, more preferably 200 nm or more). If the thickness is less than the above range, it is difficult to form the loop-shaped magnetization curve.
[0024]
FIG. 5 shows an example of a magnetic recording / reproducing apparatus using the magnetic recording medium. The magnetic recording / reproducing apparatus shown here comprises a magnetic recording medium 7 having the configuration shown in FIG. 1, a medium driving unit 8 for rotating and driving the magnetic recording medium 7, a magnetic head 9 for recording / reproducing information on / from the magnetic recording medium 7, A head drive unit 10 and a recording / reproducing signal processing system 11 are provided. The recording / reproducing signal processing system 11 can process input data and send a recording signal to the magnetic head 9, or can process a reproducing signal from the magnetic head 9 and output data.
As the magnetic head 9, a ring type head used for a normal longitudinal magnetic recording medium can be exemplified.
In the magnetic head 9, the material of the portion where the gap is formed, the gap length, the writing conditions, and the like are set as appropriate.
For example, the gap length of the element in the recording portion of the ring type head is preferably 0.08 μm or more, preferably 0.1 μm or more, and more preferably 0.12 μm or more. Further, it is preferable that the gap length of the element of the recording portion of the ring type head is 0.4 μm or less.
[0025]
According to the magnetic recording / reproducing apparatus, since the magnetic recording medium is used, the coercive force and the squareness can be improved, and the noise characteristics can be improved. Therefore, high recording density can be achieved.
[0026]
Although the magnetic recording medium having the above-described configuration has the non-magnetic intermediate film 4 made of a material having the hcp structure, an example of a magnetic recording medium without the non-magnetic intermediate film 4 is shown in FIG. Further, in this specification, the main component indicates that the component is contained in an amount exceeding 50 at%.
[0027]
【Example】
(Test Example 1)
Hereinafter, the working effects of the present invention will be clarified by showing specific examples.
The glass substrate 1 (OHARA TS-10SX) was set in a chamber of a DC magnetron sputtering apparatus (3010 manufactured by Anelva).
The chamber was evacuated to a vacuum attainment of 2 × 10 ⁻⁷ Pa and the substrate 1 was heated to 200 ° C., and then Ni-50 at% Al (Al content: 50 at%, balance: Ni, hereinafter referred to as “Ni50Al”), a second underlayer 3 made of Ru and having an hcp structure, a non-magnetic intermediate film 4 made of Co-40 at% Cr (Co40Cr), and Co-22 at%. A perpendicular magnetic film 5 made of Cr-12at% Pt-2at% Ta (Co22Cr12Pt2Ta) was sequentially formed by sputtering.
On the perpendicular magnetic film 5, a carbon protective film 6 having a thickness of 70 ° was formed by using a plasma CVD method.
[0028]
(Test Examples 2 to 24)
A magnetic recording medium was manufactured with the materials and thicknesses of each film as shown in Table 1.
[0029]
The magnetostatic properties of the magnetic recording media of Test Examples 1 to 24 were measured using a vibrating magnetic property measuring device (VSM).
The electromagnetic conversion characteristics of these magnetic recording media were measured using a read / write analyzer RWA1632 manufactured by GUZIK and a spin stand S1701MP.
For the evaluation of the electromagnetic conversion characteristics, a composite thin film magnetic recording head having a giant magnetoresistive (GMR) element in the reproducing section was used as a magnetic head, and the recording conditions were measured at a linear recording density of 250 kFCI.
The magnetic head used for the evaluation of the electromagnetic conversion characteristics is the same as the magnetic head used for a normal longitudinal magnetic recording medium. As a result of the X-ray diffraction test, it was confirmed that the first underlayer 2 had a B2 structure in each of the test examples.
Table 1 shows the measurement results of the magnetostatic characteristics and the electromagnetic conversion characteristics of the magnetic recording media of Test Examples 1 to 24.
In Table 1, Mr / Ms indicates a squareness ratio, and Co (0002) intensity indicates an X-ray diffraction intensity corresponding to the (0002) plane of the perpendicular magnetic film 5.
[0030]
[Table 1]

[0031]
As shown in Table 1, the magnetic recording medium provided with the first base film 2 was superior in the noise characteristics (SNR) and the coercive force (Hc) as compared with the magnetic recording medium without the first base film 2 (Test Example 2). It can be seen that the result was obtained.
[0032]
【The invention's effect】
As described above, in the magnetic recording medium of the present invention, since the first underlayer is made of the material having the B2 structure, the coercive force and the squareness can be improved, and the noise characteristics can be improved. .
Further, according to the magnetic recording / reproducing apparatus of the present invention, since the magnetic recording medium is used, the coercive force and the squareness can be improved, and the noise characteristics can be improved. Therefore, high recording density can be achieved.
[Brief description of the drawings]
FIG. 1 is a partial sectional view showing a first embodiment of a magnetic recording medium according to the present invention.
FIG. 2 is a graph showing the relationship between the thickness of a first underlayer and the orientation of the (0002) plane of a perpendicular magnetic film.
FIG. 3 is a graph showing the results of measuring the coercive force (Hc) and SNR of the magnetic recording medium when a magnetic head used for a normal longitudinal magnetic recording medium is used.
FIG. 4 is a partial sectional view showing a second embodiment of the magnetic recording medium of the present invention.
FIG. 5 is a schematic configuration diagram showing an example of a magnetic recording / reproducing apparatus using the magnetic recording medium shown in FIG.
FIG. 6 is a partial sectional view showing a third embodiment of the magnetic recording medium of the present invention.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 ... Substrate, 2 ... 1st under film, 3 ... 2nd under film, 4 ... Non-magnetic intermediate film, 5 ... Perpendicular magnetic film

Claims (7)

A first underlayer and a second underlayer are provided on a substrate, and a perpendicular magnetic film made of a Co alloy and having an easy axis of magnetization mainly oriented perpendicular to the substrate is provided thereon,
The first underlayer is made of a material having a B2 structure, the second underlayer is made of a material having an hcp structure, and the first underlayer and the second underlayer are in contact with each other;
A non-magnetic intermediate film having an hcp structure is provided between a second underlayer and a perpendicular magnetic film, and the non-magnetic intermediate film is made of a CoCr alloy . 2. The magnetic recording medium according to claim 1, wherein the first underlayer is made of a material mainly composed of one or more alloys of NiAl, FeAl, CoFe, CoZr, NiTi, AlCo, and AlMn. A magnetic recording medium, comprising: 3. The magnetic recording medium according to claim 1, wherein the second underlayer is made of a material mainly containing one or more of Ti, Zr, Ru, Re, Y, Gd, and Tb. A magnetic recording medium characterized by the above-mentioned. 4. The magnetic recording medium according to claim 1, wherein the perpendicular magnetic film is made of a Co / Cr / Pt system, a Co / Cr / Ta system, or a Co / Cr / Pt / X system (X: Ta, A magnetic recording medium comprising an alloy of one or more of Zr, Nb, Cu, Re, Ni, and B). 5. The magnetic recording medium according to claim 1, wherein a thickness of the first underlayer is 500 [deg.] Or less. 6. The magnetic recording medium according to claim 1, wherein the perpendicular magnetic film has a thickness of 100 to 1000 [deg.]. A magnetic recording medium; and a magnetic head for recording and reproducing information on and from the magnetic recording medium. The magnetic recording medium is provided with a first underlayer and a second underlayer on a substrate, and is made of a Co alloy thereon. , A perpendicular magnetic film whose easy axis is mainly oriented perpendicular to the substrate is provided,
The first underlayer is made of a material having a B2 structure, the second underlayer is made of a material having an hcp structure, and these first and second underlayers are in contact with each other;
A non-magnetic intermediate film having an hcp structure is provided between the second underlayer and the perpendicular magnetic film, and the non-magnetic intermediate film is made of a CoCr alloy .

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