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Application filed by Budapesti Mueszaki EgyetemfiledCriticalBudapesti Mueszaki Egyetem
Priority to HU244181ApriorityCriticalpatent/HU185306B/hu
Priority to FI822923Aprioritypatent/FI75051C/fi
Publication of HU185306BpublicationCriticalpatent/HU185306B/hu
Reflectometer arrangement and method for determining the reflectance of selected measurement locations of measurement objects reflecting in a spectrally dependent manner