HU172499B - Sposob i ustrojstvo dlja kontrolja fotomaski, metodom izvlechenija - Google Patents

Sposob i ustrojstvo dlja kontrolja fotomaski, metodom izvlechenija

Info

Publication number
HU172499B
HU172499B HU76MA00002783A HUMA002783A HU172499B HU 172499 B HU172499 B HU 172499B HU 76MA00002783 A HU76MA00002783 A HU 76MA00002783A HU MA002783 A HUMA002783 A HU MA002783A HU 172499 B HU172499 B HU 172499B
Authority
HU
Hungary
Prior art keywords
photomasks
checking
substractive
substractive method
checking photomasks
Prior art date
Application number
HU76MA00002783A
Other languages
English (en)
Inventor
Gyoergy Bencze
Andras Hamori
Original Assignee
Mta Koezponti Fiz Kutato Intez
Egyesuelt Izzolampa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mta Koezponti Fiz Kutato Intez, Egyesuelt Izzolampa filed Critical Mta Koezponti Fiz Kutato Intez
Priority to HU76MA00002783A priority Critical patent/HU172499B/hu
Priority to NL7705607A priority patent/NL7705607A/xx
Priority to US05/839,606 priority patent/US4212536A/en
Publication of HU172499B publication Critical patent/HU172499B/hu

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/021—Interferometers using holographic techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03H—HOLOGRAPHIC PROCESSES OR APPARATUS
    • G03H1/00—Holographic processes or apparatus using light, infrared or ultraviolet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
    • G03H1/0005—Adaptation of holography to specific applications
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S359/00—Optical: systems and elements
    • Y10S359/90—Methods

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Holo Graphy (AREA)
HU76MA00002783A 1976-05-31 1976-05-31 Sposob i ustrojstvo dlja kontrolja fotomaski, metodom izvlechenija HU172499B (hu)

Priority Applications (3)

Application Number Priority Date Filing Date Title
HU76MA00002783A HU172499B (hu) 1976-05-31 1976-05-31 Sposob i ustrojstvo dlja kontrolja fotomaski, metodom izvlechenija
NL7705607A NL7705607A (nl) 1976-05-31 1977-05-20 Werkwijze en inrichting voor het detekteren van fouten op een fotomasker.
US05/839,606 US4212536A (en) 1976-05-31 1977-10-05 Holographic subtraction with phase modulation to distinguish phase and amplitude differences

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
HU76MA00002783A HU172499B (hu) 1976-05-31 1976-05-31 Sposob i ustrojstvo dlja kontrolja fotomaski, metodom izvlechenija

Publications (1)

Publication Number Publication Date
HU172499B true HU172499B (hu) 1978-09-28

Family

ID=10998851

Family Applications (1)

Application Number Title Priority Date Filing Date
HU76MA00002783A HU172499B (hu) 1976-05-31 1976-05-31 Sposob i ustrojstvo dlja kontrolja fotomaski, metodom izvlechenija

Country Status (3)

Country Link
US (1) US4212536A (hu)
HU (1) HU172499B (hu)
NL (1) NL7705607A (hu)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4718749A (en) * 1986-12-17 1988-01-12 Rockwell International Corporation Phase-conjugate interferometric coherent image subtraction
US4877297A (en) * 1988-04-29 1989-10-31 Rockwell International Corporation Reconfigurable 0ptical interconnect using dynamic hologram
US4921353A (en) * 1988-07-05 1990-05-01 Rockwell International Corporation High speed photorefractive image comparator
US5822092A (en) 1988-07-18 1998-10-13 Dimensional Arts System for making a hologram of an image by manipulating object beam characteristics to reflect image data
US5262879A (en) * 1988-07-18 1993-11-16 Dimensional Arts. Inc. Holographic image conversion method for making a controlled holographic grating
JPH0830830B2 (ja) * 1988-09-07 1996-03-27 セイコー電子工業株式会社 光学的相関処理装置
US4968107A (en) * 1988-10-11 1990-11-06 Rockwell International Corporation Real time image inversion using four-wave mixing
US4971409A (en) * 1989-04-24 1990-11-20 Rockwell International Corporation Real-time optical image subtraction
US5151799A (en) * 1991-02-11 1992-09-29 Hughes Aircraft Company System and technique for making holographic projection screens
US5270842A (en) * 1991-02-20 1993-12-14 Holographix, Inc. Holographic recording and scanning system and method
DE4343983C2 (de) * 1993-12-22 1996-09-05 Siemens Ag Integrierte Halbleiterschaltung mit Kondensatoren genau definierter Kapazität und Verfahren zur Herstellung einer solchen Schaltung
US5566199A (en) * 1993-12-29 1996-10-15 Kepros; John G. Holographic technique for extreme microcircuitry size reduction
GB2353091A (en) 1999-08-11 2001-02-14 Secr Defence Object comparator using a reference generated refractive index grating
JP4022398B2 (ja) * 2001-12-27 2007-12-19 株式会社 液晶先端技術開発センター 位相シフトマスクの作成方法及び装置
US7286743B2 (en) * 2002-03-01 2007-10-23 Jds Uniphase Corporation High dynamic range integrated receiver
CN100373270C (zh) * 2004-11-17 2008-03-05 中国科学院上海光学精密机械研究所 全息位相差放大重构装置
WO2011091877A1 (en) * 2010-01-27 2011-08-04 Asml Holding N.V. Holographic mask inspection system with spatial filter
CN105700297B (zh) * 2014-11-27 2018-01-26 上海微电子装备（集团）股份有限公司 振幅监测系统、调焦调平装置及离焦量探测方法
CN116859682B (zh) * 2023-08-31 2023-12-08 光科芯图(北京)科技有限公司 一种掩模的曝光标定装置及方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3627426A (en) * 1968-03-14 1971-12-14 Nippon Kogaku Kk Hologram interferometer with two reference beams
US3537854A (en) * 1968-05-15 1970-11-03 Ibm Holographic method for generating masking patterns
US3826555A (en) * 1969-07-21 1974-07-30 Canon Kk Holographic camera for forming planar or volume holograms
US3729634A (en) * 1971-09-20 1973-04-24 Recognition Systems Automatic beam ratio control system for holography
US3767285A (en) * 1972-07-28 1973-10-23 Rca Corp Enhanced readout of stored holograms
FR2276660A1 (fr) * 1974-06-28 1976-01-23 Thomson Csf Systeme optique de stockage de donnees binaires effacable selectivement et agencees par pages enregistrees holographiquement

Also Published As

Publication number Publication date
US4212536A (en) 1980-07-15
NL7705607A (nl) 1977-12-02

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Legal Events

Date Code Title Description
HU90 Patent valid on 900628
HMM4 Cancellation of final prot. due to non-payment of fee