HK35879A - Improvements in or relating to test leads for use with multimeters in testing the current amplification factor of transistors - Google Patents

Improvements in or relating to test leads for use with multimeters in testing the current amplification factor of transistors

Info

Publication number
HK35879A
HK35879A HK35879A HK35879A HK35879A HK 35879 A HK35879 A HK 35879A HK 35879 A HK35879 A HK 35879A HK 35879 A HK35879 A HK 35879A HK 35879 A HK35879 A HK 35879A
Authority
HK
Hong Kong
Prior art keywords
multimeters
transistors
relating
testing
amplification factor
Prior art date
Application number
HK35879A
Other languages
English (en)
Original Assignee
Sanwa Instr Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanwa Instr Works Ltd filed Critical Sanwa Instr Works Ltd
Publication of HK35879A publication Critical patent/HK35879A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2608—Circuits therefor for testing bipolar transistors
    • G01R31/2614—Circuits therefor for testing bipolar transistors for measuring gain factor thereof

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
HK35879A 1974-04-21 1979-06-07 Improvements in or relating to test leads for use with multimeters in testing the current amplification factor of transistors HK35879A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1974044980U JPS547487Y2 (enExample) 1974-04-21 1974-04-21

Publications (1)

Publication Number Publication Date
HK35879A true HK35879A (en) 1979-06-15

Family

ID=12706604

Family Applications (1)

Application Number Title Priority Date Filing Date
HK35879A HK35879A (en) 1974-04-21 1979-06-07 Improvements in or relating to test leads for use with multimeters in testing the current amplification factor of transistors

Country Status (3)

Country Link
JP (1) JPS547487Y2 (enExample)
GB (1) GB1482137A (enExample)
HK (1) HK35879A (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2535850A1 (fr) * 1982-11-10 1984-05-11 Chauvin Arnoux Sa Accessoire pouvant etre connecte a un multimetre pour la mesure de resistances de terre
CN114236336B (zh) * 2021-12-08 2024-02-13 成都海光微电子技术有限公司 一种三极管放大倍数检测电路、方法及传感器

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4828370U (enExample) * 1971-08-11 1973-04-06
JPS4866375A (enExample) * 1971-12-14 1973-09-11

Also Published As

Publication number Publication date
JPS50135069U (enExample) 1975-11-07
GB1482137A (en) 1977-08-03
JPS547487Y2 (enExample) 1979-04-07

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