HK1212778A1 - 採用針對對象分類的角度分辨散射和光譜分辨測量的系統、設備和方法 - Google Patents

採用針對對象分類的角度分辨散射和光譜分辨測量的系統、設備和方法

Info

Publication number
HK1212778A1
HK1212778A1 HK16100625.5A HK16100625A HK1212778A1 HK 1212778 A1 HK1212778 A1 HK 1212778A1 HK 16100625 A HK16100625 A HK 16100625A HK 1212778 A1 HK1212778 A1 HK 1212778A1
Authority
HK
Hong Kong
Prior art keywords
resolved
classification
objects
systems
devices
Prior art date
Application number
HK16100625.5A
Other languages
English (en)
Inventor
Benjamin K Wilson
Michael C Hegg
Original Assignee
Tokitae Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokitae Llc filed Critical Tokitae Llc
Publication of HK1212778A1 publication Critical patent/HK1212778A1/zh

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/4738Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474Details of optical heads therefor, e.g. using optical fibres
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/06Means for illuminating specimens
    • G02B21/08Condensers
    • G02B21/10Condensers affording dark-field illumination
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/4788Diffraction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/49Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/51Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/2823Imaging spectrometer
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N2021/4704Angular selective
    • G01N2021/4711Multiangle measurement
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N2021/4733Discriminating different types of scatterers
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V20/00Scenes; Scene-specific elements
    • G06V20/60Type of objects
    • G06V20/69Microscopic objects, e.g. biological cells or cellular parts

Landscapes

  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
HK16100625.5A 2012-10-29 2016-01-21 採用針對對象分類的角度分辨散射和光譜分辨測量的系統、設備和方法 HK1212778A1 (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/662,724 US9194800B2 (en) 2012-10-29 2012-10-29 Systems, devices, and methods employing angular-resolved scattering and spectrally resolved measurements for classification of objects
US13/662,770 US9322777B2 (en) 2012-10-29 2012-10-29 Systems, devices, and methods employing angular-resolved scattering and spectrally resolved measurements for classification of objects
PCT/US2013/067025 WO2014070642A1 (en) 2012-10-29 2013-10-28 Systems, devices, and methods employing angular-resolved scattering and spectrally resolved measurements for classification of objects

Publications (1)

Publication Number Publication Date
HK1212778A1 true HK1212778A1 (zh) 2016-06-17

Family

ID=50546736

Family Applications (1)

Application Number Title Priority Date Filing Date
HK16100625.5A HK1212778A1 (zh) 2012-10-29 2016-01-21 採用針對對象分類的角度分辨散射和光譜分辨測量的系統、設備和方法

Country Status (6)

Country Link
US (2) US9194800B2 (zh)
EP (1) EP2912511A4 (zh)
JP (1) JP2015534078A (zh)
CN (1) CN104797970A (zh)
HK (1) HK1212778A1 (zh)
WO (1) WO2014070642A1 (zh)

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Also Published As

Publication number Publication date
US20140118555A1 (en) 2014-05-01
US9194800B2 (en) 2015-11-24
US20140118525A1 (en) 2014-05-01
JP2015534078A (ja) 2015-11-26
US9322777B2 (en) 2016-04-26
EP2912511A1 (en) 2015-09-02
CN104797970A (zh) 2015-07-22
WO2014070642A1 (en) 2014-05-08
EP2912511A4 (en) 2016-06-15

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