HK1157985A1 - Gain adjustable sensor pixels, arrays and array systems and methods therefor - Google Patents

Gain adjustable sensor pixels, arrays and array systems and methods therefor

Info

Publication number
HK1157985A1
HK1157985A1 HK11112386.4A HK11112386A HK1157985A1 HK 1157985 A1 HK1157985 A1 HK 1157985A1 HK 11112386 A HK11112386 A HK 11112386A HK 1157985 A1 HK1157985 A1 HK 1157985A1
Authority
HK
Hong Kong
Prior art keywords
arrays
sensor pixels
methods therefor
array systems
gain adjustable
Prior art date
Application number
HK11112386.4A
Other languages
English (en)
Chinese (zh)
Inventor
瑞扎．
．查基
阿洛克亞．納森
Original Assignee
瑞扎‧
‧查基
阿洛克亞‧納森
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 瑞扎‧, ‧查基, 阿洛克亞‧納森 filed Critical 瑞扎‧
Publication of HK1157985A1 publication Critical patent/HK1157985A1/xx

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N3/00—Scanning details of television systems; Combination thereof with generation of supply voltages
    • H04N3/10—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
    • H04N3/14—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
    • H04N3/15—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation
    • H04N3/1506—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation with addressing of the image-sensor elements
    • H04N3/1512—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation with addressing of the image-sensor elements for MOS image-sensors, e.g. MOS-CCD
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/50—Control of the SSIS exposure
    • H04N25/51—Control of the gain
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/50—Control of the SSIS exposure
    • H04N25/57—Control of the dynamic range
    • H04N25/571—Control of the dynamic range involving a non-linear response
    • H04N25/573—Control of the dynamic range involving a non-linear response the logarithmic type
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/779—Circuitry for scanning or addressing the pixel array
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N3/00—Scanning details of television systems; Combination thereof with generation of supply voltages
    • H04N3/10—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
    • H04N3/14—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
    • H04N3/15—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation
    • H04N3/155—Control of the image-sensor operation, e.g. image processing within the image-sensor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Measurement Of Radiation (AREA)
HK11112386.4A 2008-04-10 2011-11-16 Gain adjustable sensor pixels, arrays and array systems and methods therefor HK1157985A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CA002628792A CA2628792A1 (fr) 2008-04-10 2008-04-10 Capteur actif de pixels dans une plage dynamique etendue
PCT/CA2009/000484 WO2009124398A1 (fr) 2008-04-10 2009-04-09 Pixels de capteur à gain ajustable, matrices et systèmes de matrice et procédés apparentés

Publications (1)

Publication Number Publication Date
HK1157985A1 true HK1157985A1 (en) 2012-07-06

Family

ID=41161213

Family Applications (1)

Application Number Title Priority Date Filing Date
HK11112386.4A HK1157985A1 (en) 2008-04-10 2011-11-16 Gain adjustable sensor pixels, arrays and array systems and methods therefor

Country Status (6)

Country Link
US (1) US8947571B2 (fr)
EP (1) EP2274903B1 (fr)
CN (1) CN102067584B (fr)
CA (2) CA2628792A1 (fr)
HK (1) HK1157985A1 (fr)
WO (1) WO2009124398A1 (fr)

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CN102985844B (zh) * 2010-05-06 2016-09-07 Eos成像公司 造影成像设备及用于造影成像设备的探测器
EP2721431A4 (fr) * 2011-06-16 2015-05-06 Forstgarten Internat Holding Gmbh Dispositif numérique de capteur d'images par rayons x
US9165960B2 (en) * 2013-01-04 2015-10-20 Industrial Technology Research Institute Pixel circuit, active sensing array, sensing device and driving method thereof
US9276031B2 (en) 2013-03-04 2016-03-01 Apple Inc. Photodiode with different electric potential regions for image sensors
US9741754B2 (en) 2013-03-06 2017-08-22 Apple Inc. Charge transfer circuit with storage nodes in image sensors
GB201318404D0 (en) * 2013-10-17 2013-12-04 Cmosis Nv An image sensor
US9473706B2 (en) * 2013-12-09 2016-10-18 Apple Inc. Image sensor flicker detection
US10285626B1 (en) 2014-02-14 2019-05-14 Apple Inc. Activity identification using an optical heart rate monitor
US9479717B2 (en) 2014-02-18 2016-10-25 Semiconductor Components Industries, Llc Image sensor array with external charge detection circuitry
US9686485B2 (en) 2014-05-30 2017-06-20 Apple Inc. Pixel binning in an image sensor
CN111682039B (zh) 2016-09-23 2021-08-03 苹果公司 堆叠式背面照明spad阵列
US10656251B1 (en) 2017-01-25 2020-05-19 Apple Inc. Signal acquisition in a SPAD detector
EP3574344B1 (fr) 2017-01-25 2024-06-26 Apple Inc. Détecteur spad ayant une sensibilité modulée
US10962628B1 (en) 2017-01-26 2021-03-30 Apple Inc. Spatial temporal weighting in a SPAD detector
US10622538B2 (en) 2017-07-18 2020-04-14 Apple Inc. Techniques for providing a haptic output and sensing a haptic input using a piezoelectric body
US10440301B2 (en) 2017-09-08 2019-10-08 Apple Inc. Image capture device, pixel, and method providing improved phase detection auto-focus performance
US10848693B2 (en) 2018-07-18 2020-11-24 Apple Inc. Image flare detection using asymmetric pixels
US11019294B2 (en) 2018-07-18 2021-05-25 Apple Inc. Seamless readout mode transitions in image sensors
TWI699973B (zh) * 2019-12-31 2020-07-21 茂達電子股份有限公司 可動態控制時間增益的光感測裝置
US11563910B2 (en) 2020-08-04 2023-01-24 Apple Inc. Image capture devices having phase detection auto-focus pixels
US11546532B1 (en) 2021-03-16 2023-01-03 Apple Inc. Dynamic correlated double sampling for noise rejection in image sensors
CN113132659B (zh) * 2021-04-23 2022-07-12 深圳市汇顶科技股份有限公司 像素单元、阵列、图像传感器及电子设备
US12069384B2 (en) 2021-09-23 2024-08-20 Apple Inc. Image capture devices having phase detection auto-focus pixels

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6246436B1 (en) * 1997-11-03 2001-06-12 Agilent Technologies, Inc Adjustable gain active pixel sensor
US6252218B1 (en) * 1999-02-02 2001-06-26 Agilent Technologies, Inc Amorphous silicon active pixel sensor with rectangular readout layer in a hexagonal grid layout
US6473122B1 (en) * 1999-12-06 2002-10-29 Hemanth G. Kanekal Method and apparatus to capture high resolution images using low resolution sensors and optical spatial image sampling
FR2813000A1 (fr) * 2000-11-23 2002-02-15 Commissariat Energie Atomique Circuit de detection de rayonnement electromagnetique et procede de detection de rayonnement electromagnetique
US7443427B2 (en) * 2002-08-23 2008-10-28 Micron Technology, Inc. Wide dynamic range linear-and-log active pixel
US7327393B2 (en) * 2002-10-29 2008-02-05 Micron Technology, Inc. CMOS image sensor with variable conversion gain
US7224388B2 (en) * 2003-05-08 2007-05-29 Micron Technology, Inc. Wide dynamic range active pixel with knee response
US7075049B2 (en) * 2003-06-11 2006-07-11 Micron Technology, Inc. Dual conversion gain imagers
CN100477746C (zh) * 2004-08-11 2009-04-08 美国博通公司 主动式像素传感器的模数转换器
JP4797567B2 (ja) * 2005-10-24 2011-10-19 ソニー株式会社 固体撮像装置、固体撮像装置の駆動方法および撮像装置
US8304821B2 (en) 2006-12-23 2012-11-06 Semiconductor Manufacturing International (Shanghai) Corporation CMOS image sensor

Also Published As

Publication number Publication date
EP2274903A1 (fr) 2011-01-19
CN102067584A (zh) 2011-05-18
CA2628792A1 (fr) 2009-10-10
EP2274903A4 (fr) 2012-08-01
CA2758308A1 (fr) 2009-10-15
WO2009124398A1 (fr) 2009-10-15
EP2274903B1 (fr) 2016-08-24
US20110187906A1 (en) 2011-08-04
US8947571B2 (en) 2015-02-03
CN102067584B (zh) 2014-12-10

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