HK1156155A1 - 電容器測試方法及其電路 - Google Patents

電容器測試方法及其電路

Info

Publication number
HK1156155A1
HK1156155A1 HK11110045.1A HK11110045A HK1156155A1 HK 1156155 A1 HK1156155 A1 HK 1156155A1 HK 11110045 A HK11110045 A HK 11110045A HK 1156155 A1 HK1156155 A1 HK 1156155A1
Authority
HK
Hong Kong
Prior art keywords
test method
circuit therefor
capacitor test
capacitor
therefor
Prior art date
Application number
HK11110045.1A
Other languages
English (en)
Inventor
帕維爾．赫斯基
切赫．卡梅尼茨基
Original Assignee
半導體元件工業有限責任公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 半導體元件工業有限責任公司 filed Critical 半導體元件工業有限責任公司
Publication of HK1156155A1 publication Critical patent/HK1156155A1/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/40—Testing power supplies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/64—Testing of capacitors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Continuous-Control Power Sources That Use Transistors (AREA)
  • Dc-Dc Converters (AREA)
HK11110045.1A 2009-11-19 2011-09-23 電容器測試方法及其電路 HK1156155A1 (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US12/621,951 US8179156B2 (en) 2009-11-19 2009-11-19 Capacitor test method and circuit therefor

Publications (1)

Publication Number Publication Date
HK1156155A1 true HK1156155A1 (zh) 2012-06-01

Family

ID=44010860

Family Applications (1)

Application Number Title Priority Date Filing Date
HK11110045.1A HK1156155A1 (zh) 2009-11-19 2011-09-23 電容器測試方法及其電路

Country Status (4)

Country Link
US (1) US8179156B2 (zh)
CN (1) CN102075086B (zh)
HK (1) HK1156155A1 (zh)
TW (1) TWI493316B (zh)

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EP2434363B1 (en) * 2010-09-27 2013-05-15 ST-Ericsson SA Presence and operability test of a decoupling capacitor
US8929106B2 (en) 2011-05-20 2015-01-06 General Electric Company Monotonic pre-bias start-up of a DC-DC converter
US8913406B2 (en) * 2011-06-24 2014-12-16 General Electric Company Paralleled power converters with auto-stagger start-up
US9046909B2 (en) * 2011-09-02 2015-06-02 Rambus Inc. On-chip regulator with variable load compensation
US9791494B2 (en) 2012-01-20 2017-10-17 Lear Corporation Apparatus and method for diagnostics of a capacitive sensor
DE102013105356A1 (de) 2012-05-29 2013-12-05 Samsung Electronics Co., Ltd. Verfahren zum Betreiben von nichtflüchtigen Speichervorrichtungen, die effiziente Fehlererkennung unterstützen
US9306457B2 (en) * 2013-12-04 2016-04-05 Apple Inc. Instantaneous load current monitoring
US10260983B2 (en) 2014-01-20 2019-04-16 Lear Corporation Apparatus and method for diagnostics of a capacitive sensor with plausibility check
US9910451B2 (en) * 2014-02-17 2018-03-06 Taiwan Semiconductor Manufacturing Company Limited Low-dropout regulator
JP6419025B2 (ja) * 2015-05-27 2018-11-07 キヤノン株式会社 電力供給装置、プリンタ及び制御方法
EP3470954B1 (en) * 2017-10-10 2020-08-05 NXP USA, Inc. Closed-loop system oscillation detector
EP3732777A4 (en) * 2017-12-25 2021-05-26 Texas Instruments Incorporated VOLTAGE MONITORING CIRCUIT HANDLING A VOLTAGE DRIFT CAUSED BY NEGATIVE PRELOAD TEMPERATURE INSTABILITY
CN109765479B (zh) * 2019-01-28 2021-10-01 合肥京东方视讯科技有限公司 一种电路板缺件检测装置和方法
CN110108956A (zh) * 2019-04-26 2019-08-09 华夏天信智能物联股份有限公司 一种宽频率范围的电容器测试专用高频电源及其测试方法
US11251789B1 (en) 2020-07-27 2022-02-15 Semiconductor Components Industries, Llc Instability management in a signal driver circuit
DE102020213559B4 (de) 2020-10-28 2022-05-05 Infineon Technologies Ag Bestimmung einer Information über eine Verbindung einer Schaltungskomponente
US11614499B2 (en) * 2020-12-23 2023-03-28 Texas Instruments Incorporated Methods and apparatus to improve detection of capacitors implemented for regulators
KR20220148548A (ko) * 2021-04-29 2022-11-07 삼성전자주식회사 이상 전압 감지 장치, 스토리지 장치 및 차량

Family Cites Families (10)

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Publication number Priority date Publication date Assignee Title
US5309446A (en) * 1990-07-31 1994-05-03 Texas Instruments Incorporated Test validation method for a semiconductor memory device
US5648759A (en) * 1994-02-02 1997-07-15 National Semiconductor Corporation Failsafe voltage regulator with warning signal driver
US5589802A (en) * 1995-06-07 1996-12-31 American Microsystems, Inc. Circuit for detecting the absence of an external component
CN1362783A (zh) * 2001-01-02 2002-08-07 深圳赛意法微电子有限公司 外部振荡器电阻检测电路
JP3753112B2 (ja) * 2002-08-20 2006-03-08 株式会社村田製作所 スイッチング電源装置およびそれを用いた電子装置
JP2005117784A (ja) * 2003-10-08 2005-04-28 Rohm Co Ltd スイッチング電源装置
CN101040422A (zh) * 2004-10-19 2007-09-19 罗姆股份有限公司 开关电源控制电路及开关电源装置及使用其的电子设备
WO2007008202A1 (en) * 2005-07-11 2007-01-18 Semiconductor Components Industries, L.L.C. Switched capacitor controller and method therefor
JP5039371B2 (ja) * 2006-12-12 2012-10-03 ローム株式会社 スイッチングレギュレータの制御回路および電源装置、電子機器
CN100533900C (zh) * 2007-08-16 2009-08-26 浙江大学 一种用于漏电保护器的电网状态检测方法

Also Published As

Publication number Publication date
CN102075086B (zh) 2014-12-17
US20110115520A1 (en) 2011-05-19
TWI493316B (zh) 2015-07-21
US8179156B2 (en) 2012-05-15
CN102075086A (zh) 2011-05-25
TW201133173A (en) 2011-10-01

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20211026