HK1113520A1 - Planar avalanche photodiode - Google Patents
Planar avalanche photodiodeInfo
- Publication number
- HK1113520A1 HK1113520A1 HK08102803.5A HK08102803A HK1113520A1 HK 1113520 A1 HK1113520 A1 HK 1113520A1 HK 08102803 A HK08102803 A HK 08102803A HK 1113520 A1 HK1113520 A1 HK 1113520A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- avalanche photodiode
- planar avalanche
- planar
- photodiode
- avalanche
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
- H01L31/107—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier working in avalanche mode, e.g. avalanche photodiodes
- H01L31/1075—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier working in avalanche mode, e.g. avalanche photodiodes in which the active layers, e.g. absorption or multiplication layers, form an heterostructure, e.g. SAM structure
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Light Receiving Elements (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/US2004/013584 WO2005114712A1 (en) | 2004-04-30 | 2004-04-30 | Planar avalanche photodiode |
Publications (1)
Publication Number | Publication Date |
---|---|
HK1113520A1 true HK1113520A1 (en) | 2008-10-03 |
Family
ID=35428612
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK08102803.5A HK1113520A1 (en) | 2004-04-30 | 2008-03-11 | Planar avalanche photodiode |
Country Status (6)
Country | Link |
---|---|
EP (1) | EP1741127A4 (en) |
JP (1) | JP2007535810A (en) |
CN (1) | CN100541721C (en) |
CA (1) | CA2564218A1 (en) |
HK (1) | HK1113520A1 (en) |
WO (1) | WO2005114712A1 (en) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5025330B2 (en) | 2007-05-22 | 2012-09-12 | 三菱電機株式会社 | Semiconductor light receiving element and manufacturing method thereof |
US8232586B2 (en) * | 2009-08-12 | 2012-07-31 | Globalfoundries Inc. | Silicon photon detector |
US20150115319A1 (en) * | 2012-05-17 | 2015-04-30 | Picometrix, Llc | Planar avalanche photodiode |
CN104198909B (en) * | 2014-09-15 | 2016-11-23 | 华东光电集成器件研究所 | A kind of measuring method of mesa avalanche diode chip area |
US10921369B2 (en) * | 2017-01-05 | 2021-02-16 | Xcalipr Corporation | High precision optical characterization of carrier transport properties in semiconductors |
WO2019053877A1 (en) * | 2017-09-15 | 2019-03-21 | 三菱電機株式会社 | Semiconductor light-receiving element and manufacturing method thereof |
US10854768B2 (en) * | 2018-12-20 | 2020-12-01 | Hewlett Packard Enterprise Development Lp | Optoelectronic component with current deflected to high-gain paths comprising an avalanche photodiode having an absorbing region on a p-doped lateral boundary, an n-doped lateral boundary and an amplifying region |
CN110690314B (en) * | 2019-09-05 | 2023-06-27 | 中国电子科技集团公司第十三研究所 | Ultraviolet detector with absorption layer and multiplication layer in separate structures and preparation method thereof |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02262378A (en) * | 1989-04-03 | 1990-10-25 | Toshiba Corp | Manufacture of semiconductor photodetector |
JPH0389566A (en) * | 1989-08-31 | 1991-04-15 | Nec Corp | Superlattice avalanche photodiode |
US5126281A (en) * | 1990-09-11 | 1992-06-30 | Hewlett-Packard Company | Diffusion using a solid state source |
US6548878B1 (en) * | 1998-02-05 | 2003-04-15 | Integration Associates, Inc. | Method for producing a thin distributed photodiode structure |
JP4095746B2 (en) * | 1999-12-17 | 2008-06-04 | 日本オプネクスト株式会社 | Semiconductor light receiving device and manufacturing method |
JP4058921B2 (en) * | 2001-08-01 | 2008-03-12 | 日本電気株式会社 | Semiconductor photo detector |
US7348607B2 (en) * | 2002-02-01 | 2008-03-25 | Picometrix, Llc | Planar avalanche photodiode |
KR100766174B1 (en) * | 2002-02-01 | 2007-10-10 | 피코메트릭스 인코포레이티드 | Enhanced photodetector |
US6794631B2 (en) * | 2002-06-07 | 2004-09-21 | Corning Lasertron, Inc. | Three-terminal avalanche photodiode |
-
2004
- 2004-04-30 WO PCT/US2004/013584 patent/WO2005114712A1/en active Application Filing
- 2004-04-30 EP EP04822037A patent/EP1741127A4/en not_active Ceased
- 2004-04-30 JP JP2007510676A patent/JP2007535810A/en active Pending
- 2004-04-30 CN CNB2004800432368A patent/CN100541721C/en not_active Expired - Lifetime
- 2004-04-30 CA CA002564218A patent/CA2564218A1/en not_active Abandoned
-
2008
- 2008-03-11 HK HK08102803.5A patent/HK1113520A1/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
EP1741127A1 (en) | 2007-01-10 |
WO2005114712A1 (en) | 2005-12-01 |
JP2007535810A (en) | 2007-12-06 |
EP1741127A4 (en) | 2009-04-22 |
CN100541721C (en) | 2009-09-16 |
CA2564218A1 (en) | 2005-12-01 |
CN101036216A (en) | 2007-09-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PE | Patent expired |
Effective date: 20240427 |