HK1113520A1 - Planar avalanche photodiode - Google Patents

Planar avalanche photodiode

Info

Publication number
HK1113520A1
HK1113520A1 HK08102803.5A HK08102803A HK1113520A1 HK 1113520 A1 HK1113520 A1 HK 1113520A1 HK 08102803 A HK08102803 A HK 08102803A HK 1113520 A1 HK1113520 A1 HK 1113520A1
Authority
HK
Hong Kong
Prior art keywords
avalanche photodiode
planar avalanche
planar
photodiode
avalanche
Prior art date
Application number
HK08102803.5A
Inventor
Cheng C Ko
Barry Levine
Original Assignee
Picometrix Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Picometrix Llc filed Critical Picometrix Llc
Publication of HK1113520A1 publication Critical patent/HK1113520A1/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/10Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
    • H01L31/101Devices sensitive to infrared, visible or ultraviolet radiation
    • H01L31/102Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
    • H01L31/107Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier working in avalanche mode, e.g. avalanche photodiodes
    • H01L31/1075Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier working in avalanche mode, e.g. avalanche photodiodes in which the active layers, e.g. absorption or multiplication layers, form an heterostructure, e.g. SAM structure

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Light Receiving Elements (AREA)
HK08102803.5A 2004-04-30 2008-03-11 Planar avalanche photodiode HK1113520A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2004/013584 WO2005114712A1 (en) 2004-04-30 2004-04-30 Planar avalanche photodiode

Publications (1)

Publication Number Publication Date
HK1113520A1 true HK1113520A1 (en) 2008-10-03

Family

ID=35428612

Family Applications (1)

Application Number Title Priority Date Filing Date
HK08102803.5A HK1113520A1 (en) 2004-04-30 2008-03-11 Planar avalanche photodiode

Country Status (6)

Country Link
EP (1) EP1741127A4 (en)
JP (1) JP2007535810A (en)
CN (1) CN100541721C (en)
CA (1) CA2564218A1 (en)
HK (1) HK1113520A1 (en)
WO (1) WO2005114712A1 (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5025330B2 (en) 2007-05-22 2012-09-12 三菱電機株式会社 Semiconductor light receiving element and manufacturing method thereof
US8232586B2 (en) * 2009-08-12 2012-07-31 Globalfoundries Inc. Silicon photon detector
US20150115319A1 (en) * 2012-05-17 2015-04-30 Picometrix, Llc Planar avalanche photodiode
CN104198909B (en) * 2014-09-15 2016-11-23 华东光电集成器件研究所 A kind of measuring method of mesa avalanche diode chip area
US10921369B2 (en) * 2017-01-05 2021-02-16 Xcalipr Corporation High precision optical characterization of carrier transport properties in semiconductors
WO2019053877A1 (en) * 2017-09-15 2019-03-21 三菱電機株式会社 Semiconductor light-receiving element and manufacturing method thereof
US10854768B2 (en) * 2018-12-20 2020-12-01 Hewlett Packard Enterprise Development Lp Optoelectronic component with current deflected to high-gain paths comprising an avalanche photodiode having an absorbing region on a p-doped lateral boundary, an n-doped lateral boundary and an amplifying region
CN110690314B (en) * 2019-09-05 2023-06-27 中国电子科技集团公司第十三研究所 Ultraviolet detector with absorption layer and multiplication layer in separate structures and preparation method thereof

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02262378A (en) * 1989-04-03 1990-10-25 Toshiba Corp Manufacture of semiconductor photodetector
JPH0389566A (en) * 1989-08-31 1991-04-15 Nec Corp Superlattice avalanche photodiode
US5126281A (en) * 1990-09-11 1992-06-30 Hewlett-Packard Company Diffusion using a solid state source
US6548878B1 (en) * 1998-02-05 2003-04-15 Integration Associates, Inc. Method for producing a thin distributed photodiode structure
JP4095746B2 (en) * 1999-12-17 2008-06-04 日本オプネクスト株式会社 Semiconductor light receiving device and manufacturing method
JP4058921B2 (en) * 2001-08-01 2008-03-12 日本電気株式会社 Semiconductor photo detector
US7348607B2 (en) * 2002-02-01 2008-03-25 Picometrix, Llc Planar avalanche photodiode
KR100766174B1 (en) * 2002-02-01 2007-10-10 피코메트릭스 인코포레이티드 Enhanced photodetector
US6794631B2 (en) * 2002-06-07 2004-09-21 Corning Lasertron, Inc. Three-terminal avalanche photodiode

Also Published As

Publication number Publication date
EP1741127A1 (en) 2007-01-10
WO2005114712A1 (en) 2005-12-01
JP2007535810A (en) 2007-12-06
EP1741127A4 (en) 2009-04-22
CN100541721C (en) 2009-09-16
CA2564218A1 (en) 2005-12-01
CN101036216A (en) 2007-09-12

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Legal Events

Date Code Title Description
PE Patent expired

Effective date: 20240427