HK1084723A1 - Probe for three-dimensional measurements - Google Patents

Probe for three-dimensional measurements

Info

Publication number
HK1084723A1
HK1084723A1 HK06104740A HK06104740A HK1084723A1 HK 1084723 A1 HK1084723 A1 HK 1084723A1 HK 06104740 A HK06104740 A HK 06104740A HK 06104740 A HK06104740 A HK 06104740A HK 1084723 A1 HK1084723 A1 HK 1084723A1
Authority
HK
Hong Kong
Prior art keywords
probe
dimensional measurements
measurements
dimensional
Prior art date
Application number
HK06104740A
Other languages
English (en)
Inventor
Adriano Zanier
Claude Rouge
Leonard Wunderlin
Pascal Jordil
Original Assignee
Tesa Sa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tesa Sa filed Critical Tesa Sa
Publication of HK1084723A1 publication Critical patent/HK1084723A1/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/004Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
    • G01B5/008Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
    • G01B5/012Contact-making feeler heads therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/045Correction of measurements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
HK06104740A 2004-07-12 2006-04-20 Probe for three-dimensional measurements HK1084723A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP04103304A EP1617171B1 (fr) 2004-07-12 2004-07-12 Palpeur pour mesures tridimensionnelles

Publications (1)

Publication Number Publication Date
HK1084723A1 true HK1084723A1 (en) 2006-08-04

Family

ID=34929316

Family Applications (1)

Application Number Title Priority Date Filing Date
HK06104740A HK1084723A1 (en) 2004-07-12 2006-04-20 Probe for three-dimensional measurements

Country Status (6)

Country Link
US (1) US7281433B2 (xx)
EP (1) EP1617171B1 (xx)
JP (1) JP3944220B2 (xx)
CN (1) CN100360892C (xx)
DE (1) DE602004010639T2 (xx)
HK (1) HK1084723A1 (xx)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012519563A (ja) * 2009-03-09 2012-08-30 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 対象にエネルギーを当てるためのカテーテル、装置、方法、及び、コンピュータプログラム
JP5136940B2 (ja) * 2009-06-05 2013-02-06 公益財団法人北九州産業学術推進機構 三次元測定装置
JP5336279B2 (ja) * 2009-07-08 2013-11-06 株式会社ミツトヨ 表面性状測定装置および真円度測定装置
US9671257B2 (en) * 2011-07-08 2017-06-06 Carl Zeiss Industrielle Messtechnik Gmbh Correcting and/or preventing errors during the measurement of coordinates of a workpiece
WO2013130185A1 (en) * 2012-02-27 2013-09-06 United Technologies Corporation Machine tool - based, optical coordinate measuring machine calibration device
EP2657642A1 (de) 2012-04-24 2013-10-30 Hexagon Technology Center GmbH Sensorelement für eine Messmaschine, insbesondere eine Koordinatenmessmaschine
EP2884225B1 (en) 2013-06-28 2020-11-18 Unimetrik, S.A. Laser sensor with a built-in rotary mechanism
JP6049785B2 (ja) * 2015-03-05 2016-12-21 株式会社ミツトヨ 測定プローブ
JP6039718B2 (ja) 2015-03-05 2016-12-07 株式会社ミツトヨ 測定プローブ
JP6049786B2 (ja) 2015-03-05 2016-12-21 株式会社ミツトヨ 測定プローブ
CN105436993B (zh) * 2015-12-31 2017-10-03 山东省计算中心(国家超级计算济南中心) 工件感知器和感知系统
JP6341962B2 (ja) * 2016-08-26 2018-06-13 株式会社ミツトヨ 三次元測定装置及び座標補正方法
US11105605B2 (en) * 2018-02-18 2021-08-31 The L.S. Starrett Company Metrology device with automated compensation and/or alert for orientation errors

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3740070A1 (de) * 1987-11-26 1989-06-08 Zeiss Carl Fa Dreh-schwenk-einrichtung fuer tastkoepfe von koordinatenmessgeraeten
EP0392660B1 (en) * 1989-04-14 1993-09-08 Renishaw plc Probe head
EP0392699B1 (en) * 1989-04-14 1993-09-22 Renishaw plc Probe head
DE10006753A1 (de) * 2000-02-15 2001-08-16 Zeiss Carl Dreh-Schwenkeinrichtung für den Tastkopf eines Koordinatenmeßgerätes
EP1150092A3 (en) * 2000-04-12 2001-11-07 Bidwell Corporation Gage set for measuring ring shaped parts
EP1316778B1 (fr) * 2001-11-30 2007-07-25 Tesa Sa Palpeur à déclenchement et procédé d'assemblage d'un palpeur à déclenchement
EP1443302B2 (fr) * 2003-01-29 2015-09-16 Tesa Sa Palpeur orientable
EP1443300B1 (fr) * 2003-01-29 2010-02-24 Tesa SA Palpeur orientable
EP1443301B1 (fr) * 2003-01-29 2010-02-10 Tesa SA Palpeur orientable
ATE340987T1 (de) * 2003-01-29 2006-10-15 Tesa Sa Taststift mit einstellbarer orientierung

Also Published As

Publication number Publication date
DE602004010639T2 (de) 2008-12-04
EP1617171B1 (fr) 2007-12-12
US7281433B2 (en) 2007-10-16
JP3944220B2 (ja) 2007-07-11
JP2006030186A (ja) 2006-02-02
CN1721812A (zh) 2006-01-18
EP1617171A1 (fr) 2006-01-18
CN100360892C (zh) 2008-01-09
DE602004010639D1 (de) 2008-01-24
US20060005633A1 (en) 2006-01-12

Similar Documents

Publication Publication Date Title
HK1084723A1 (en) Probe for three-dimensional measurements
GB0623351D0 (en) Measurement probe
GB0509394D0 (en) Dimensional measurement probe
EP1901091A4 (en) DEVICE FOR DISTANCE MEASUREMENT
EP1842221A4 (en) ATOMIC LASER PROBES
GB0428165D0 (en) Position measurement
GB0523722D0 (en) Trench measurement
EP1774561A4 (en) LASER ATOM PROBE METHOD
EP1760455A4 (en) MEASURING DEVICE
EP1735812A4 (en) LASER ATOM PROBE
EP1852101A4 (en) Biophoton METER
TWI372245B (en) Measuring probe
GB0608999D0 (en) Surface measurement probe
EP1770357A4 (en) Circularity METER
GB0402941D0 (en) Surface shape measurement
GB2410799B (en) Fluid-gauging probes
EP1893995A4 (en) METER
GB0508402D0 (en) Probe calibration
GB0428193D0 (en) Density measuring apparatus
GB0514081D0 (en) Measurement apparatus
GB0405914D0 (en) Measurement apparatus
GB0523244D0 (en) Measurement apparatus
GB2437454B (en) Adjustable Measuring Scoop
GB0401661D0 (en) Measurement instrument
GB0412982D0 (en) Non-destructive measurements

Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20150711