HK1046668A1 - 測試微電機裝置的方法 - Google Patents
測試微電機裝置的方法Info
- Publication number
- HK1046668A1 HK1046668A1 HK02108353.2A HK02108353A HK1046668A1 HK 1046668 A1 HK1046668 A1 HK 1046668A1 HK 02108353 A HK02108353 A HK 02108353A HK 1046668 A1 HK1046668 A1 HK 1046668A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- testing
- mechanical device
- micro electro
- electro
- micro
- Prior art date
Links
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AUPP130999 | 1999-06-30 | ||
PCT/AU2000/000585 WO2001002179A1 (en) | 1999-06-30 | 2000-05-24 | Testing a micro electro-mechanical device |
Publications (1)
Publication Number | Publication Date |
---|---|
HK1046668A1 true HK1046668A1 (zh) | 2003-01-24 |
Family
ID=39719819
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK02108356.9A HK1046883A1 (zh) | 1999-06-30 | 2002-11-19 | 微型機電器件中的故障檢測 |
HK02108353.2A HK1046668A1 (zh) | 1999-06-30 | 2002-11-19 | 測試微電機裝置的方法 |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK02108356.9A HK1046883A1 (zh) | 1999-06-30 | 2002-11-19 | 微型機電器件中的故障檢測 |
Country Status (3)
Country | Link |
---|---|
AT (1) | ATE405423T1 (zh) |
DE (1) | DE60039990D1 (zh) |
HK (2) | HK1046883A1 (zh) |
-
2000
- 2000-05-24 DE DE60039990T patent/DE60039990D1/de not_active Expired - Lifetime
- 2000-05-24 AT AT00929098T patent/ATE405423T1/de not_active IP Right Cessation
-
2002
- 2002-11-19 HK HK02108356.9A patent/HK1046883A1/zh unknown
- 2002-11-19 HK HK02108353.2A patent/HK1046668A1/zh unknown
Also Published As
Publication number | Publication date |
---|---|
DE60039990D1 (de) | 2008-10-02 |
ATE405423T1 (de) | 2008-09-15 |
HK1046883A1 (zh) | 2003-01-30 |
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