HK1002259A1 - Automatic circuit tester with separate instrument and scanner busses - Google Patents

Automatic circuit tester with separate instrument and scanner busses

Info

Publication number
HK1002259A1
HK1002259A1 HK98101163A HK98101163A HK1002259A1 HK 1002259 A1 HK1002259 A1 HK 1002259A1 HK 98101163 A HK98101163 A HK 98101163A HK 98101163 A HK98101163 A HK 98101163A HK 1002259 A1 HK1002259 A1 HK 1002259A1
Authority
HK
Hong Kong
Prior art keywords
busses
scanner
automatic circuit
circuit tester
separate instrument
Prior art date
Application number
HK98101163A
Other languages
English (en)
Inventor
Robert C Sullivan
Brian J Sargent
Robert H Pincus
Rudy D Pietrantoni
Original Assignee
Genrad Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Genrad Inc filed Critical Genrad Inc
Publication of HK1002259A1 publication Critical patent/HK1002259A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Tests Of Electronic Circuits (AREA)
HK98101163A 1991-02-22 1998-02-13 Automatic circuit tester with separate instrument and scanner busses HK1002259A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/660,289 US5101150A (en) 1991-02-22 1991-02-22 Automatic circuit tester with separate instrument and scanner buses

Publications (1)

Publication Number Publication Date
HK1002259A1 true HK1002259A1 (en) 1998-08-07

Family

ID=24648891

Family Applications (1)

Application Number Title Priority Date Filing Date
HK98101163A HK1002259A1 (en) 1991-02-22 1998-02-13 Automatic circuit tester with separate instrument and scanner busses

Country Status (5)

Country Link
US (1) US5101150A (xx)
EP (1) EP0500310B1 (xx)
JP (1) JP3324773B2 (xx)
DE (1) DE69221516T2 (xx)
HK (1) HK1002259A1 (xx)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5260947A (en) * 1990-12-04 1993-11-09 Hewlett-Packard Company Boundary-scan test method and apparatus for diagnosing faults in a device under test
US5648891A (en) * 1995-08-23 1997-07-15 Rockwell International Corp. Circuit board assembly
US5751151A (en) * 1996-04-12 1998-05-12 Vlsi Technology Integrated circuit test apparatus
FR2751082B1 (fr) * 1996-07-10 1998-11-06 Aerospatiale Dispositif de commutation notamment de systeme sous test
US6175230B1 (en) 1999-01-14 2001-01-16 Genrad, Inc. Circuit-board tester with backdrive-based burst timing
US6717429B2 (en) * 2000-06-30 2004-04-06 Texas Instruments Incorporated IC having comparator inputs connected to core circuitry and output pad
US7017138B2 (en) * 2001-08-15 2006-03-21 National Instruments Corporation Dynamically determining a route through one or more switch devices at program execution time
US20030043757A1 (en) * 2001-08-15 2003-03-06 Jason White Optimizing switch device route transitions
US6954904B2 (en) 2001-08-15 2005-10-11 National Instruments Corporation Creating a graphical program to configure one or more switch devices
US7062719B2 (en) 2001-08-15 2006-06-13 National Instruments Corporation Graphically defining a route through one or more switch devices
US8161144B2 (en) * 2001-08-15 2012-04-17 National Instruments Corporation Defining a switch device route based on required signal characteristics and resource dependencies
US20050232256A1 (en) * 2002-03-29 2005-10-20 Jason White Applying object oriented concepts to switch system configurations
US7272760B2 (en) * 2004-11-18 2007-09-18 Systems On Silicon Manufacturing Co. Pte. Ltd. Curve tracing device and method
US20090091342A1 (en) * 2007-10-03 2009-04-09 Agilent Technologies, Inc. Node Extender for In-Circuit Test Systems
US10677815B2 (en) * 2018-06-08 2020-06-09 Teradyne, Inc. Test system having distributed resources

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3854125A (en) * 1971-06-15 1974-12-10 Instrumentation Engineering Automated diagnostic testing system
JPS58151570A (ja) * 1982-03-05 1983-09-08 Mitsubishi Electric Corp 電気部品の試験装置
US4517512A (en) * 1982-05-24 1985-05-14 Micro Component Technology, Inc. Integrated circuit test apparatus test head
FR2531230A1 (fr) * 1982-07-27 1984-02-03 Rank Xerox Sa Ensemble destine au test automatique centralise de circuits imprimes et procede de test de circuits a microprocesseur faisant application de cet ensemble
US4746855A (en) * 1984-03-14 1988-05-24 Teradyne, Inc. Relay multiplexing for circuit testers
US4764925A (en) * 1984-06-14 1988-08-16 Fairchild Camera & Instrument Method and apparatus for testing integrated circuits
US4707834A (en) * 1985-09-17 1987-11-17 Tektronix, Inc. Computer-based instrument system
US4689721A (en) * 1986-01-10 1987-08-25 Trw Inc. Dual printed circuit board module
US4736374A (en) * 1986-05-14 1988-04-05 Grumman Aerospace Corporation Automated test apparatus for use with multiple equipment
US4758780A (en) * 1986-12-08 1988-07-19 Ncr Corporation Circuit board test apparatus and method
GB2214319B (en) * 1987-01-16 1991-09-25 Teradyne Inc Automatic test equipment
US5001422A (en) * 1989-06-09 1991-03-19 Hilevel Technology, Inc. VLSI tester backplane
US5032789A (en) * 1989-06-19 1991-07-16 Hewlett-Packard Company Modular/concurrent board tester

Also Published As

Publication number Publication date
EP0500310B1 (en) 1997-08-13
US5101150A (en) 1992-03-31
EP0500310A1 (en) 1992-08-26
JPH04323578A (ja) 1992-11-12
DE69221516D1 (de) 1997-09-18
DE69221516T2 (de) 1998-01-29
JP3324773B2 (ja) 2002-09-17

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Legal Events

Date Code Title Description
PF Patent in force
PE Patent expired

Effective date: 20120217