GR871998B - Computer aided probe with tri- state circuitry test capability - Google Patents

Computer aided probe with tri- state circuitry test capability

Info

Publication number
GR871998B
GR871998B GR871998A GR870101998A GR871998B GR 871998 B GR871998 B GR 871998B GR 871998 A GR871998 A GR 871998A GR 870101998 A GR870101998 A GR 870101998A GR 871998 B GR871998 B GR 871998B
Authority
GR
Greece
Prior art keywords
tri
computer aided
test capability
state circuitry
circuitry test
Prior art date
Application number
GR871998A
Other languages
English (en)
Inventor
Ugenti Michael
Caiola Richard
Original Assignee
Grumman Aerospace Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Grumman Aerospace Corp filed Critical Grumman Aerospace Corp
Publication of GR871998B publication Critical patent/GR871998B/el

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16557—Logic probes, i.e. circuits indicating logic state (high, low, O)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Measurement Of The Respiration, Hearing Ability, Form, And Blood Characteristics Of Living Organisms (AREA)
  • Logic Circuits (AREA)
GR871998A 1986-12-23 1987-12-22 Computer aided probe with tri- state circuitry test capability GR871998B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/945,636 US4779042A (en) 1986-12-23 1986-12-23 Computer-aided probe with tri-state circuitry test capability

Publications (1)

Publication Number Publication Date
GR871998B true GR871998B (en) 1988-04-26

Family

ID=25483366

Family Applications (1)

Application Number Title Priority Date Filing Date
GR871998A GR871998B (en) 1986-12-23 1987-12-22 Computer aided probe with tri- state circuitry test capability

Country Status (9)

Country Link
US (1) US4779042A (el)
EP (1) EP0294449A4 (el)
JP (1) JPH01501968A (el)
CN (1) CN87108371A (el)
AU (1) AU1085688A (el)
GR (1) GR871998B (el)
IL (1) IL84898A0 (el)
NO (1) NO883758L (el)
WO (1) WO1988004781A1 (el)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4743842A (en) * 1987-03-11 1988-05-10 Grumman Aerospace Corporation Tri-state circuit tester
JPS63291134A (ja) * 1987-05-22 1988-11-29 Toshiba Corp 論理集積回路
US4977530A (en) * 1988-05-02 1990-12-11 Mitel Corporation Voltage monitor for in-circuit testing
US5066909A (en) * 1990-01-30 1991-11-19 Hewlett-Packard Company Apparatus for testing an electronic circuit having an arbitrary output waveform
EP0541837B1 (en) * 1991-11-11 1995-01-11 Hewlett-Packard GmbH Detector circuit
US7439751B2 (en) * 2006-09-27 2008-10-21 Taiwan Semiconductor Manufacturing Co, Ltd. Apparatus and method for testing conductive bumps
KR101808480B1 (ko) 2017-02-07 2017-12-14 연세대학교 산학협력단 반도체 테스트를 지원하는 보스트 모듈 장치 및 그 동작 방법

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3513400A (en) * 1966-11-25 1970-05-19 Whittaker Corp Analog to pulse width conversion system including amplitude comparators
US3683284A (en) * 1968-06-25 1972-08-08 Picker Corp Pulse height analyzer
US3525939A (en) * 1968-08-01 1970-08-25 Kurz Kasch Inc Hand held instrument having a pair of indicator lamps for indicating voltage levels in electrical circuits
US3543154A (en) * 1968-11-01 1970-11-24 Hewlett Packard Co Logic probe
US3628141A (en) * 1969-11-17 1971-12-14 Advanced Digital Research Corp Self-contained probe for delineating characteristics of logic circuit signals
GB1316319A (en) * 1970-02-06 1973-05-09 Siemens Ag Ecl gating circuits
US3633100A (en) * 1970-05-12 1972-01-04 Ibm Testing of nonlinear circuits by comparison with a reference simulation with means to eliminate errors caused by critical race conditions
US3742351A (en) * 1970-07-17 1973-06-26 Nu Concept Computer Co Digital test probe with signal latches and conditionable gating
US3750015A (en) * 1970-11-12 1973-07-31 Comtec Ind Inc Digital logic test probe for indicating both signal levels as well as a count of changes in signal levels
US3944921A (en) * 1970-12-11 1976-03-16 Canon Kabushiki Kaisha Logic level test probe with grated oscillator
US3662193A (en) * 1971-05-24 1972-05-09 Itt Tri-stable circuit
US3903471A (en) * 1972-03-10 1975-09-02 Canon Kk Electronic circuit test equipment including a cathode ray tube detachably connected thereto using a plurality of information signals
US3845328A (en) * 1972-10-09 1974-10-29 Rca Corp Tri-state logic circuit
US3838339A (en) * 1973-08-17 1974-09-24 Gte Automatic Electric Lab Inc Logic test probe and indicator circuit
JPS5719436B2 (el) * 1973-09-14 1982-04-22
US4016492A (en) * 1975-06-09 1977-04-05 Hewlett-Packard Company Pulse discriminator and misprobe detector for digital logic tester probe
US4038598A (en) * 1976-03-16 1977-07-26 The United States Of America As Represented By The Secretary Of The Air Force Probe contact and junction detector
US4145651A (en) * 1977-06-23 1979-03-20 Ripingill Jr Allen E Hand-held logic circuit probe
US4189673A (en) * 1978-05-01 1980-02-19 Burroughs Corporation Pen-shaped precision multi-level current mode logic test probe
US4291356A (en) * 1979-08-02 1981-09-22 H.O.P. Consulab Inc. Apparatus for analyzing a physical quantity
US4418314A (en) * 1980-10-20 1983-11-29 The United States Of America As Represented By The Secretary Of The Army High impedance fast voltage probe
JPS57115022A (en) * 1981-01-08 1982-07-17 Fuji Xerox Co Ltd Detecting circuit for zero cross point
JPS57119524A (en) * 1981-01-19 1982-07-26 Oki Electric Ind Co Ltd Tristate input circuit
US4403183A (en) * 1981-04-10 1983-09-06 Tektronix, Inc. Active voltage probe

Also Published As

Publication number Publication date
IL84898A0 (en) 1988-06-30
EP0294449A1 (en) 1988-12-14
NO883758D0 (no) 1988-08-22
US4779042A (en) 1988-10-18
NO883758L (no) 1988-08-22
WO1988004781A1 (en) 1988-06-30
CN87108371A (zh) 1988-07-06
JPH01501968A (ja) 1989-07-06
AU1085688A (en) 1988-07-15
EP0294449A4 (en) 1989-03-29

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