GB995087A - Method for the controlled doping of crystalline substances - Google Patents
Method for the controlled doping of crystalline substancesInfo
- Publication number
- GB995087A GB995087A GB23041/61A GB2304161A GB995087A GB 995087 A GB995087 A GB 995087A GB 23041/61 A GB23041/61 A GB 23041/61A GB 2304161 A GB2304161 A GB 2304161A GB 995087 A GB995087 A GB 995087A
- Authority
- GB
- United Kingdom
- Prior art keywords
- rod
- phosphorus
- boron
- silicon
- zone
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B13/00—Single-crystal growth by zone-melting; Refining by zone-melting
- C30B13/08—Single-crystal growth by zone-melting; Refining by zone-melting adding crystallising materials or reactants forming it in situ to the molten zone
- C30B13/10—Single-crystal growth by zone-melting; Refining by zone-melting adding crystallising materials or reactants forming it in situ to the molten zone with addition of doping materials
- C30B13/12—Single-crystal growth by zone-melting; Refining by zone-melting adding crystallising materials or reactants forming it in situ to the molten zone with addition of doping materials in the gaseous or vapour state
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B13/00—Single-crystal growth by zone-melting; Refining by zone-melting
- C30B13/08—Single-crystal growth by zone-melting; Refining by zone-melting adding crystallising materials or reactants forming it in situ to the molten zone
- C30B13/10—Single-crystal growth by zone-melting; Refining by zone-melting adding crystallising materials or reactants forming it in situ to the molten zone with addition of doping materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S118/00—Coating apparatus
- Y10S118/90—Semiconductor vapor doping
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S252/00—Compositions
- Y10S252/95—Doping agent source material
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/933—Germanium or silicon or Ge-Si on III-V
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
- Silicon Compounds (AREA)
Abstract
995,087. Zone-melting. WACKER CHEMIE G.m.b.H. June 26, 1961 [June 24, 1960], No. 23041/61. Heading B1S. A vertical rod of material is doped uniformly or non-uniformly in a predetermined continuous or discontinuous manner during zonerefining by supplying a doping agent in a controlled manner, as a solid, liquid, or gas, laterally to one or more molten zones during their passage through the rod. The doping agent may be supplied to a partial molten zone preceding a complete molten zone (see French Specification 1,255,849). The doping agent may affect the semi-conductor, optical, mechanical, magnetic, or thermal properties of the material of the rod ; or form a compound, e.g. gallium arsenide or indium phosphide, therewith. A rod of silicon may be doped with a thinner rod of silicon containing boron, aluminium, indium, gallium, phosphorus, arsenic, or antimony; with a thinner rod of phosphorus-containing boron ; with phosphorus- or boron-containing silicon in gaseous suspension ; or with boron hydrides, boron halides, phosphorus vapour, phosphine, or phosphorus halides. A length of a silicon rod may be doped with boron and a succeeding length with phosphorus. n- and p-doping agents may be supplied simultaneously. Heating may be by induction, radiation, electron- or ionbombardment, or plasma burner. The pressure during zone-melting may be at or above or below atmospheric pressure. An inductionheated molten zone may be fed with a thin rod as shown in Figs. 1, 2 or 4 ; or with a gas or vapour as shown in Figs. 7-12.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DEW28070A DE1190918B (en) | 1960-06-24 | 1960-06-24 | Process for the targeted doping of rod-shaped bodies during zone melting |
Publications (1)
Publication Number | Publication Date |
---|---|
GB995087A true GB995087A (en) | 1965-06-16 |
Family
ID=7598824
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB23041/61A Expired GB995087A (en) | 1960-06-24 | 1961-06-26 | Method for the controlled doping of crystalline substances |
Country Status (4)
Country | Link |
---|---|
US (1) | US3141848A (en) |
BE (1) | BE605268A (en) |
GB (1) | GB995087A (en) |
NL (1) | NL266156A (en) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3311510A (en) * | 1964-03-16 | 1967-03-28 | Mandelkorn Joseph | Method of making a silicon semiconductor device |
US3477959A (en) * | 1967-04-24 | 1969-11-11 | Northern Electric Co | Method and apparatus for producing doped,monocrystalline semiconductor materials |
BE788026A (en) * | 1971-08-26 | 1973-02-26 | Siemens Ag | METHOD AND DEVICE FOR DIRECTED INTRODUCTION OF DOPING MATERIALS INTO SEMICONDUCTOR CRYSTALS DURING A CRUCIBLE ZONE MELTING |
DE2319700C3 (en) * | 1973-04-18 | 1980-11-27 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Process for influencing the radial resistance curve in a semiconductor single crystal rod during crucible-free zone melting and devices for carrying out the process |
DE2327085C3 (en) * | 1973-05-28 | 1979-03-08 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Device for doping during crucible-free zone melting |
US3858549A (en) * | 1973-08-15 | 1975-01-07 | Siemens Ag | Apparatus for controlled doping of semiconductor crystals |
DE2623350A1 (en) * | 1976-05-25 | 1977-12-08 | Wacker Chemitronic | PROCEDURE FOR DETERMINING THE EFFECTIVE DOPERANT CONTENT OF HYDROGEN FOR SEMICONDUCTOR MANUFACTURING |
US4229298A (en) * | 1979-02-05 | 1980-10-21 | The Western States Machine Company | Method and apparatus for determining the thickness of a charge wall formed in a centrifugal basket |
US4270972A (en) * | 1980-03-31 | 1981-06-02 | Rockwell International Corporation | Method for controlled doping semiconductor material with highly volatile dopant |
US4556448A (en) * | 1983-10-19 | 1985-12-03 | International Business Machines Corporation | Method for controlled doping of silicon crystals by improved float zone technique |
JP5194146B2 (en) * | 2010-12-28 | 2013-05-08 | ジルトロニック アクチエンゲゼルシャフト | Method for producing silicon single crystal, silicon single crystal, and wafer |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL168491B (en) * | 1951-11-16 | Roussel-Uclaf, Societe Anonyme Te Parijs. | ||
US2964396A (en) * | 1954-05-24 | 1960-12-13 | Siemens Ag | Producing semiconductor substances of highest purity |
NL255390A (en) * | 1958-09-20 | 1900-01-01 |
-
0
- NL NL266156D patent/NL266156A/xx unknown
-
1961
- 1961-06-22 BE BE605268A patent/BE605268A/en unknown
- 1961-06-26 US US119547A patent/US3141848A/en not_active Expired - Lifetime
- 1961-06-26 GB GB23041/61A patent/GB995087A/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
NL266156A (en) | |
BE605268A (en) | 1961-12-22 |
US3141848A (en) | 1964-07-21 |
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