GB9907868D0 - Method of calibrating a scanning system - Google Patents
Method of calibrating a scanning systemInfo
- Publication number
- GB9907868D0 GB9907868D0 GBGB9907868.5A GB9907868A GB9907868D0 GB 9907868 D0 GB9907868 D0 GB 9907868D0 GB 9907868 A GB9907868 A GB 9907868A GB 9907868 D0 GB9907868 D0 GB 9907868D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- calibrating
- scanning system
- scanning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/042—Calibration or calibration artifacts
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y15/00—Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Molecular Biology (AREA)
- Crystallography & Structural Chemistry (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Priority Applications (8)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GBGB9907868.5A GB9907868D0 (en) | 1999-04-08 | 1999-04-08 | Method of calibrating a scanning system |
| JP2000611030A JP5042409B2 (ja) | 1999-04-08 | 2000-04-07 | 走査システムを校正する方法 |
| PCT/GB2000/001315 WO2000062015A1 (en) | 1999-04-08 | 2000-04-07 | Method of calibrating a scanning system |
| EP00919028A EP1086356B1 (en) | 1999-04-08 | 2000-04-07 | Method of calibrating a scanning system |
| US09/701,735 US6434846B1 (en) | 1999-04-08 | 2000-04-07 | Method of calibrating a scanning system |
| DE60019219T DE60019219T2 (de) | 1999-04-08 | 2000-04-07 | Verfahren zur kalibrierung eines scan-systems |
| US10/191,460 US6601311B2 (en) | 1999-04-08 | 2002-07-10 | Method of calibrating a scanning system |
| US10/632,868 US6810597B2 (en) | 1999-04-08 | 2003-08-04 | Use of surface measuring probes |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GBGB9907868.5A GB9907868D0 (en) | 1999-04-08 | 1999-04-08 | Method of calibrating a scanning system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB9907868D0 true GB9907868D0 (en) | 1999-06-02 |
Family
ID=10851041
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GBGB9907868.5A Ceased GB9907868D0 (en) | 1999-04-08 | 1999-04-08 | Method of calibrating a scanning system |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US6434846B1 (https=) |
| EP (1) | EP1086356B1 (https=) |
| JP (1) | JP5042409B2 (https=) |
| DE (1) | DE60019219T2 (https=) |
| GB (1) | GB9907868D0 (https=) |
| WO (1) | WO2000062015A1 (https=) |
Families Citing this family (46)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6810597B2 (en) * | 1999-04-08 | 2004-11-02 | Renishaw Plc | Use of surface measuring probes |
| GB9907868D0 (en) * | 1999-04-08 | 1999-06-02 | Renishaw Plc | Method of calibrating a scanning system |
| JP3473937B2 (ja) | 1999-07-27 | 2003-12-08 | 日立建機株式会社 | 走査型プローブ顕微鏡とその走査方法 |
| JP4660779B2 (ja) * | 2000-08-18 | 2011-03-30 | 学校法人 中央大学 | 移動装置の位置誤差評価方法およびその評価結果に基づく移動精度向上方法 |
| GB0106245D0 (en) * | 2001-03-14 | 2001-05-02 | Renishaw Plc | Calibration of an analogue probe |
| GB0126232D0 (en) * | 2001-11-01 | 2002-01-02 | Renishaw Plc | Calibration of an analogue probe |
| DE10207228A1 (de) * | 2002-02-21 | 2003-09-04 | Bosch Gmbh Robert | Verfahren zur Kalibrierung eines Sensors und Schaltungsanordnung zum Betreiben eines Sensors |
| GB0205332D0 (en) * | 2002-03-06 | 2002-04-17 | Renishaw Plc | Dynamic artefact comparison |
| GB0215478D0 (en) * | 2002-07-04 | 2002-08-14 | Renishaw Plc | Method of scanning a calibrating system |
| US6895682B2 (en) * | 2002-11-08 | 2005-05-24 | North Carolina State University | Polar coordinate-based profilometer and methods |
| GB0228371D0 (en) * | 2002-12-05 | 2003-01-08 | Leland E C E | Workpiece inspection method |
| US6721675B1 (en) * | 2003-01-31 | 2004-04-13 | The Boeing Company | Machine capability verification and diagnostics (CAP/DIA) system, method and computer program product |
| EP1627203B1 (de) * | 2003-05-28 | 2014-11-26 | Carl Zeiss Industrielle Messtechnik GmbH | Verfahren zur kalibrierung eines tasters |
| DE10327867A1 (de) * | 2003-05-28 | 2004-12-16 | Carl Zeiss Industrielle Messtechnik Gmbh | Verfahren zur Kalibrierung eines Tasters |
| GB0322115D0 (en) * | 2003-09-22 | 2003-10-22 | Renishaw Plc | Method of error compensation |
| US6948254B2 (en) * | 2003-10-27 | 2005-09-27 | Micronic Laser Systems Ab | Method for calibration of a metrology stage |
| GB0329098D0 (en) | 2003-12-16 | 2004-01-21 | Renishaw Plc | Method of calibrating a scanning system |
| US7543393B2 (en) | 2003-12-16 | 2009-06-09 | Renishaw Plc | Method of calibrating a scanning system |
| GB0417536D0 (en) * | 2004-08-06 | 2004-09-08 | Renishaw Plc | The use of surface measurement probes |
| DE102006019382A1 (de) * | 2006-04-24 | 2007-10-25 | Carl Zeiss Industrielle Messtechnik Gmbh | Scanning einer Oberfläche mit einem Koordinatenmessgerät |
| GB0608235D0 (en) * | 2006-04-26 | 2006-06-07 | Renishaw Plc | Differential calibration |
| GB0611109D0 (en) * | 2006-06-06 | 2006-07-19 | Renishaw Plc | A method for measuring workpieces |
| CN101511529B (zh) * | 2006-08-31 | 2013-01-30 | 法罗技术股份有限公司 | 可去除智能探针、组合系统以及使用坐标测量机的方法 |
| GB0703423D0 (en) | 2007-02-22 | 2007-04-04 | Renishaw Plc | Calibration method and apparatus |
| GB0707720D0 (en) * | 2007-04-23 | 2007-05-30 | Renishaw Plc | Apparatus and method for controlling or programming a measurement routine |
| GB0707921D0 (en) | 2007-04-24 | 2007-05-30 | Renishaw Plc | Apparatus and method for surface measurement |
| GB0716218D0 (en) | 2007-08-20 | 2007-09-26 | Renishaw Plc | Measurement path generation |
| US7712224B2 (en) * | 2007-10-03 | 2010-05-11 | Hexagon Metrology Ab | Validating the error map of CMM using calibrated probe |
| JP4653824B2 (ja) * | 2008-07-29 | 2011-03-16 | ファナック株式会社 | 機上計測装置にて計測対象物の形状を計測する工作機械システム |
| DE102008049751A1 (de) * | 2008-10-01 | 2010-04-08 | Carl Zeiss Industrielle Messtechnik Gmbh | Verfahren zum Vermessen eines Werkstücks, Kalibrierverfahren sowie Koordinatenmessgerät |
| JP5684712B2 (ja) * | 2008-10-29 | 2015-03-18 | レニショウ パブリック リミテッド カンパニーRenishaw Public Limited Company | 座標測定システムのための方法 |
| GB0901040D0 (en) * | 2009-01-22 | 2009-03-11 | Renishaw Plc | Optical measuring method and system |
| GB201003599D0 (en) | 2010-03-04 | 2010-04-21 | Renishaw Plc | Measurement method and apparatus |
| EP2492635B1 (de) * | 2011-02-22 | 2013-05-29 | Siemens Aktiengesellschaft | Kalibrierverfahren für einen kugelförmigen Messtaster |
| GB201113715D0 (en) | 2011-08-09 | 2011-09-21 | Renishaw Plc | Method and apparatus for inspecting workpieces |
| CN103175489A (zh) * | 2011-12-21 | 2013-06-26 | 鸿富锦精密工业(深圳)有限公司 | 探针回弹方向确定系统及方法 |
| GB201204947D0 (en) * | 2012-03-21 | 2012-05-02 | Renishaw Plc | Method and apparatus for inspecting workpieces |
| JP2014130091A (ja) * | 2012-12-28 | 2014-07-10 | Canon Inc | 測定装置および測定方法 |
| US10955238B1 (en) * | 2013-03-15 | 2021-03-23 | Kerr Machine Co. | In-process automatic recalibration |
| GB201308467D0 (en) | 2013-05-10 | 2013-06-19 | Renishaw Plc | Method and Apparatus for Inspecting Workpieces |
| GB201311600D0 (en) * | 2013-06-28 | 2013-08-14 | Renishaw Plc | Calibration of a contact probe |
| US9952044B2 (en) * | 2015-02-02 | 2018-04-24 | Rolls-Royce North American Technologies, Inc. | Multi-axis calibration block |
| JP6484108B2 (ja) * | 2015-05-22 | 2019-03-13 | 株式会社ミツトヨ | 形状測定装置の制御方法 |
| CN109964098B (zh) | 2016-11-16 | 2022-10-14 | 瑞尼斯豪公司 | 坐标定位设备以及操作方法 |
| CN113188493B (zh) * | 2021-03-31 | 2022-04-08 | 成都飞机工业(集团)有限责任公司 | 一种确定在线测量点位的测量轨迹的方法 |
| CN116242403A (zh) * | 2022-12-30 | 2023-06-09 | 武汉理工大学 | 光栅阵列自适应寻峰校准方法、装置、系统及电子设备 |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3986007A (en) * | 1975-08-20 | 1976-10-12 | The Bendix Corporation | Method and apparatus for calibrating mechanical-visual part manipulating system |
| US4523450A (en) * | 1981-11-07 | 1985-06-18 | Carl-Zeiss-Stiftung, Heidenheim/Brenz | Method of calibrating probe pins on multicoordinate measurement machines |
| GB8713715D0 (en) * | 1987-06-11 | 1987-07-15 | Renishaw Plc | Workpiece inspection method |
| US4939678A (en) * | 1987-11-19 | 1990-07-03 | Brown & Sharpe Manufacturing Company | Method for calibration of coordinate measuring machine |
| EP0508686B1 (en) * | 1991-04-12 | 1996-06-05 | Renishaw Transducer Systems Limited | Calibration device for machine |
| GB9224335D0 (en) | 1992-11-20 | 1993-01-13 | Renishaw Metrology Ltd | A method of measuring workpieces using a surface contacting measuring probe |
| DE4326551C2 (de) * | 1993-08-07 | 1997-04-17 | Heidenhain Gmbh Dr Johannes | Kalibrier-Verfahren zum Ermitteln und Kompensieren unterschiedlicher Antastkraft-Verhältnisse bei Mehrkoordinaten-Tastsystemen |
| DE4436507A1 (de) | 1994-10-13 | 1996-04-18 | Zeiss Carl Fa | Verfahren zur Koordinatenmessung an Werkstücken |
| US6161079A (en) * | 1997-08-18 | 2000-12-12 | Giddings & Lewis, Llc | Method and apparatus for determining tolerance and nominal measurement values for a coordinate measuring machine |
| GB9907868D0 (en) * | 1999-04-08 | 1999-06-02 | Renishaw Plc | Method of calibrating a scanning system |
-
1999
- 1999-04-08 GB GBGB9907868.5A patent/GB9907868D0/en not_active Ceased
-
2000
- 2000-04-07 DE DE60019219T patent/DE60019219T2/de not_active Expired - Lifetime
- 2000-04-07 WO PCT/GB2000/001315 patent/WO2000062015A1/en not_active Ceased
- 2000-04-07 JP JP2000611030A patent/JP5042409B2/ja not_active Expired - Lifetime
- 2000-04-07 EP EP00919028A patent/EP1086356B1/en not_active Expired - Lifetime
- 2000-04-07 US US09/701,735 patent/US6434846B1/en not_active Expired - Fee Related
-
2002
- 2002-07-10 US US10/191,460 patent/US6601311B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| DE60019219D1 (de) | 2005-05-12 |
| JP2002541469A (ja) | 2002-12-03 |
| US6601311B2 (en) | 2003-08-05 |
| WO2000062015A1 (en) | 2000-10-19 |
| EP1086356A1 (en) | 2001-03-28 |
| EP1086356B1 (en) | 2005-04-06 |
| US20020174555A1 (en) | 2002-11-28 |
| US6434846B1 (en) | 2002-08-20 |
| DE60019219T2 (de) | 2005-09-22 |
| JP5042409B2 (ja) | 2012-10-03 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| AT | Applications terminated before publication under section 16(1) |