GB9907868D0 - Method of calibrating a scanning system - Google Patents

Method of calibrating a scanning system

Info

Publication number
GB9907868D0
GB9907868D0 GBGB9907868.5A GB9907868A GB9907868D0 GB 9907868 D0 GB9907868 D0 GB 9907868D0 GB 9907868 A GB9907868 A GB 9907868A GB 9907868 D0 GB9907868 D0 GB 9907868D0
Authority
GB
United Kingdom
Prior art keywords
calibrating
scanning system
scanning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
GBGB9907868.5A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renishaw PLC
Original Assignee
Renishaw PLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renishaw PLC filed Critical Renishaw PLC
Priority to GBGB9907868.5A priority Critical patent/GB9907868D0/en
Publication of GB9907868D0 publication Critical patent/GB9907868D0/en
Priority to JP2000611030A priority patent/JP5042409B2/ja
Priority to PCT/GB2000/001315 priority patent/WO2000062015A1/en
Priority to EP00919028A priority patent/EP1086356B1/en
Priority to US09/701,735 priority patent/US6434846B1/en
Priority to DE60019219T priority patent/DE60019219T2/de
Priority to US10/191,460 priority patent/US6601311B2/en
Priority to US10/632,868 priority patent/US6810597B2/en
Ceased legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/042Calibration or calibration artifacts
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y15/00Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Molecular Biology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
GBGB9907868.5A 1999-04-08 1999-04-08 Method of calibrating a scanning system Ceased GB9907868D0 (en)

Priority Applications (8)

Application Number Priority Date Filing Date Title
GBGB9907868.5A GB9907868D0 (en) 1999-04-08 1999-04-08 Method of calibrating a scanning system
JP2000611030A JP5042409B2 (ja) 1999-04-08 2000-04-07 走査システムを校正する方法
PCT/GB2000/001315 WO2000062015A1 (en) 1999-04-08 2000-04-07 Method of calibrating a scanning system
EP00919028A EP1086356B1 (en) 1999-04-08 2000-04-07 Method of calibrating a scanning system
US09/701,735 US6434846B1 (en) 1999-04-08 2000-04-07 Method of calibrating a scanning system
DE60019219T DE60019219T2 (de) 1999-04-08 2000-04-07 Verfahren zur kalibrierung eines scan-systems
US10/191,460 US6601311B2 (en) 1999-04-08 2002-07-10 Method of calibrating a scanning system
US10/632,868 US6810597B2 (en) 1999-04-08 2003-08-04 Use of surface measuring probes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB9907868.5A GB9907868D0 (en) 1999-04-08 1999-04-08 Method of calibrating a scanning system

Publications (1)

Publication Number Publication Date
GB9907868D0 true GB9907868D0 (en) 1999-06-02

Family

ID=10851041

Family Applications (1)

Application Number Title Priority Date Filing Date
GBGB9907868.5A Ceased GB9907868D0 (en) 1999-04-08 1999-04-08 Method of calibrating a scanning system

Country Status (6)

Country Link
US (2) US6434846B1 (https=)
EP (1) EP1086356B1 (https=)
JP (1) JP5042409B2 (https=)
DE (1) DE60019219T2 (https=)
GB (1) GB9907868D0 (https=)
WO (1) WO2000062015A1 (https=)

Families Citing this family (46)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6810597B2 (en) * 1999-04-08 2004-11-02 Renishaw Plc Use of surface measuring probes
GB9907868D0 (en) * 1999-04-08 1999-06-02 Renishaw Plc Method of calibrating a scanning system
JP3473937B2 (ja) 1999-07-27 2003-12-08 日立建機株式会社 走査型プローブ顕微鏡とその走査方法
JP4660779B2 (ja) * 2000-08-18 2011-03-30 学校法人 中央大学 移動装置の位置誤差評価方法およびその評価結果に基づく移動精度向上方法
GB0106245D0 (en) * 2001-03-14 2001-05-02 Renishaw Plc Calibration of an analogue probe
GB0126232D0 (en) * 2001-11-01 2002-01-02 Renishaw Plc Calibration of an analogue probe
DE10207228A1 (de) * 2002-02-21 2003-09-04 Bosch Gmbh Robert Verfahren zur Kalibrierung eines Sensors und Schaltungsanordnung zum Betreiben eines Sensors
GB0205332D0 (en) * 2002-03-06 2002-04-17 Renishaw Plc Dynamic artefact comparison
GB0215478D0 (en) * 2002-07-04 2002-08-14 Renishaw Plc Method of scanning a calibrating system
US6895682B2 (en) * 2002-11-08 2005-05-24 North Carolina State University Polar coordinate-based profilometer and methods
GB0228371D0 (en) * 2002-12-05 2003-01-08 Leland E C E Workpiece inspection method
US6721675B1 (en) * 2003-01-31 2004-04-13 The Boeing Company Machine capability verification and diagnostics (CAP/DIA) system, method and computer program product
EP1627203B1 (de) * 2003-05-28 2014-11-26 Carl Zeiss Industrielle Messtechnik GmbH Verfahren zur kalibrierung eines tasters
DE10327867A1 (de) * 2003-05-28 2004-12-16 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren zur Kalibrierung eines Tasters
GB0322115D0 (en) * 2003-09-22 2003-10-22 Renishaw Plc Method of error compensation
US6948254B2 (en) * 2003-10-27 2005-09-27 Micronic Laser Systems Ab Method for calibration of a metrology stage
GB0329098D0 (en) 2003-12-16 2004-01-21 Renishaw Plc Method of calibrating a scanning system
US7543393B2 (en) 2003-12-16 2009-06-09 Renishaw Plc Method of calibrating a scanning system
GB0417536D0 (en) * 2004-08-06 2004-09-08 Renishaw Plc The use of surface measurement probes
DE102006019382A1 (de) * 2006-04-24 2007-10-25 Carl Zeiss Industrielle Messtechnik Gmbh Scanning einer Oberfläche mit einem Koordinatenmessgerät
GB0608235D0 (en) * 2006-04-26 2006-06-07 Renishaw Plc Differential calibration
GB0611109D0 (en) * 2006-06-06 2006-07-19 Renishaw Plc A method for measuring workpieces
CN101511529B (zh) * 2006-08-31 2013-01-30 法罗技术股份有限公司 可去除智能探针、组合系统以及使用坐标测量机的方法
GB0703423D0 (en) 2007-02-22 2007-04-04 Renishaw Plc Calibration method and apparatus
GB0707720D0 (en) * 2007-04-23 2007-05-30 Renishaw Plc Apparatus and method for controlling or programming a measurement routine
GB0707921D0 (en) 2007-04-24 2007-05-30 Renishaw Plc Apparatus and method for surface measurement
GB0716218D0 (en) 2007-08-20 2007-09-26 Renishaw Plc Measurement path generation
US7712224B2 (en) * 2007-10-03 2010-05-11 Hexagon Metrology Ab Validating the error map of CMM using calibrated probe
JP4653824B2 (ja) * 2008-07-29 2011-03-16 ファナック株式会社 機上計測装置にて計測対象物の形状を計測する工作機械システム
DE102008049751A1 (de) * 2008-10-01 2010-04-08 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren zum Vermessen eines Werkstücks, Kalibrierverfahren sowie Koordinatenmessgerät
JP5684712B2 (ja) * 2008-10-29 2015-03-18 レニショウ パブリック リミテッド カンパニーRenishaw Public Limited Company 座標測定システムのための方法
GB0901040D0 (en) * 2009-01-22 2009-03-11 Renishaw Plc Optical measuring method and system
GB201003599D0 (en) 2010-03-04 2010-04-21 Renishaw Plc Measurement method and apparatus
EP2492635B1 (de) * 2011-02-22 2013-05-29 Siemens Aktiengesellschaft Kalibrierverfahren für einen kugelförmigen Messtaster
GB201113715D0 (en) 2011-08-09 2011-09-21 Renishaw Plc Method and apparatus for inspecting workpieces
CN103175489A (zh) * 2011-12-21 2013-06-26 鸿富锦精密工业(深圳)有限公司 探针回弹方向确定系统及方法
GB201204947D0 (en) * 2012-03-21 2012-05-02 Renishaw Plc Method and apparatus for inspecting workpieces
JP2014130091A (ja) * 2012-12-28 2014-07-10 Canon Inc 測定装置および測定方法
US10955238B1 (en) * 2013-03-15 2021-03-23 Kerr Machine Co. In-process automatic recalibration
GB201308467D0 (en) 2013-05-10 2013-06-19 Renishaw Plc Method and Apparatus for Inspecting Workpieces
GB201311600D0 (en) * 2013-06-28 2013-08-14 Renishaw Plc Calibration of a contact probe
US9952044B2 (en) * 2015-02-02 2018-04-24 Rolls-Royce North American Technologies, Inc. Multi-axis calibration block
JP6484108B2 (ja) * 2015-05-22 2019-03-13 株式会社ミツトヨ 形状測定装置の制御方法
CN109964098B (zh) 2016-11-16 2022-10-14 瑞尼斯豪公司 坐标定位设备以及操作方法
CN113188493B (zh) * 2021-03-31 2022-04-08 成都飞机工业(集团)有限责任公司 一种确定在线测量点位的测量轨迹的方法
CN116242403A (zh) * 2022-12-30 2023-06-09 武汉理工大学 光栅阵列自适应寻峰校准方法、装置、系统及电子设备

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3986007A (en) * 1975-08-20 1976-10-12 The Bendix Corporation Method and apparatus for calibrating mechanical-visual part manipulating system
US4523450A (en) * 1981-11-07 1985-06-18 Carl-Zeiss-Stiftung, Heidenheim/Brenz Method of calibrating probe pins on multicoordinate measurement machines
GB8713715D0 (en) * 1987-06-11 1987-07-15 Renishaw Plc Workpiece inspection method
US4939678A (en) * 1987-11-19 1990-07-03 Brown & Sharpe Manufacturing Company Method for calibration of coordinate measuring machine
EP0508686B1 (en) * 1991-04-12 1996-06-05 Renishaw Transducer Systems Limited Calibration device for machine
GB9224335D0 (en) 1992-11-20 1993-01-13 Renishaw Metrology Ltd A method of measuring workpieces using a surface contacting measuring probe
DE4326551C2 (de) * 1993-08-07 1997-04-17 Heidenhain Gmbh Dr Johannes Kalibrier-Verfahren zum Ermitteln und Kompensieren unterschiedlicher Antastkraft-Verhältnisse bei Mehrkoordinaten-Tastsystemen
DE4436507A1 (de) 1994-10-13 1996-04-18 Zeiss Carl Fa Verfahren zur Koordinatenmessung an Werkstücken
US6161079A (en) * 1997-08-18 2000-12-12 Giddings & Lewis, Llc Method and apparatus for determining tolerance and nominal measurement values for a coordinate measuring machine
GB9907868D0 (en) * 1999-04-08 1999-06-02 Renishaw Plc Method of calibrating a scanning system

Also Published As

Publication number Publication date
DE60019219D1 (de) 2005-05-12
JP2002541469A (ja) 2002-12-03
US6601311B2 (en) 2003-08-05
WO2000062015A1 (en) 2000-10-19
EP1086356A1 (en) 2001-03-28
EP1086356B1 (en) 2005-04-06
US20020174555A1 (en) 2002-11-28
US6434846B1 (en) 2002-08-20
DE60019219T2 (de) 2005-09-22
JP5042409B2 (ja) 2012-10-03

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Legal Events

Date Code Title Description
AT Applications terminated before publication under section 16(1)