GB9804910D0 - Microprocessor debugging - Google Patents
Microprocessor debuggingInfo
- Publication number
- GB9804910D0 GB9804910D0 GBGB9804910.9A GB9804910A GB9804910D0 GB 9804910 D0 GB9804910 D0 GB 9804910D0 GB 9804910 A GB9804910 A GB 9804910A GB 9804910 D0 GB9804910 D0 GB 9804910D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- debugging
- microprocessor
- microprocessor debugging
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31705—Debugging aspects, e.g. using test circuits for debugging, using dedicated debugging test circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318555—Control logic
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Debugging And Monitoring (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB9804910A GB2337834B (en) | 1998-03-06 | 1998-03-06 | Microprocessor debugging |
GB9812512A GB2338320B (en) | 1998-03-06 | 1998-06-10 | Improvements in processor development systems |
US09/262,816 US6385742B1 (en) | 1998-03-06 | 1999-03-05 | Microprocessor debugging mechanism employing scan interface |
US09/262,817 US6473727B1 (en) | 1998-03-06 | 1999-03-05 | Processor development systems |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB9804910A GB2337834B (en) | 1998-03-06 | 1998-03-06 | Microprocessor debugging |
Publications (3)
Publication Number | Publication Date |
---|---|
GB9804910D0 true GB9804910D0 (en) | 1998-04-29 |
GB2337834A GB2337834A (en) | 1999-12-01 |
GB2337834B GB2337834B (en) | 2003-02-12 |
Family
ID=10828187
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB9804910A Expired - Fee Related GB2337834B (en) | 1998-03-06 | 1998-03-06 | Microprocessor debugging |
GB9812512A Expired - Fee Related GB2338320B (en) | 1998-03-06 | 1998-06-10 | Improvements in processor development systems |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB9812512A Expired - Fee Related GB2338320B (en) | 1998-03-06 | 1998-06-10 | Improvements in processor development systems |
Country Status (1)
Country | Link |
---|---|
GB (2) | GB2337834B (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6321329B1 (en) | 1999-05-19 | 2001-11-20 | Arm Limited | Executing debug instructions |
US6343358B1 (en) | 1999-05-19 | 2002-01-29 | Arm Limited | Executing multiple debug instructions |
US7055117B2 (en) | 2003-12-29 | 2006-05-30 | Agere Systems, Inc. | System and method for debugging system-on-chips using single or n-cycle stepping |
US10388393B2 (en) * | 2016-03-22 | 2019-08-20 | Micron Technology, Inc. | Apparatus and methods for debugging on a host and memory device |
US11074988B2 (en) | 2016-03-22 | 2021-07-27 | Micron Technology, Inc. | Apparatus and methods for debugging on a host and memory device |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE69728513T2 (en) * | 1996-12-20 | 2005-04-07 | Texas Instruments Inc., Dallas | Processor test connection with scan chains and data flow |
DE69728507T2 (en) * | 1996-12-20 | 2005-03-24 | Texas Instruments Inc., Dallas | Nonintrusive code holding points in a processor instruction execution pipeline |
-
1998
- 1998-03-06 GB GB9804910A patent/GB2337834B/en not_active Expired - Fee Related
- 1998-06-10 GB GB9812512A patent/GB2338320B/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
GB2337834B (en) | 2003-02-12 |
GB9812512D0 (en) | 1998-08-05 |
GB2337834A (en) | 1999-12-01 |
GB2338320B (en) | 2002-10-23 |
GB2338320A (en) | 1999-12-15 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20150306 |