GB2338320B - Improvements in processor development systems - Google Patents

Improvements in processor development systems

Info

Publication number
GB2338320B
GB2338320B GB9812512A GB9812512A GB2338320B GB 2338320 B GB2338320 B GB 2338320B GB 9812512 A GB9812512 A GB 9812512A GB 9812512 A GB9812512 A GB 9812512A GB 2338320 B GB2338320 B GB 2338320B
Authority
GB
United Kingdom
Prior art keywords
development systems
processor development
processor
systems
development
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB9812512A
Other versions
GB9812512D0 (en
GB2338320A (en
Inventor
Simon Kershaw
Graham Kirsch
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
LSI Corp
Original Assignee
LSI Logic Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by LSI Logic Corp filed Critical LSI Logic Corp
Publication of GB9812512D0 publication Critical patent/GB9812512D0/en
Priority to US09/262,816 priority Critical patent/US6385742B1/en
Priority to US09/262,817 priority patent/US6473727B1/en
Publication of GB2338320A publication Critical patent/GB2338320A/en
Application granted granted Critical
Publication of GB2338320B publication Critical patent/GB2338320B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273—Test methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31705—Debugging aspects, e.g. using test circuits for debugging, using dedicated debugging test circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318555—Control logic

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Debugging And Monitoring (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
GB9812512A 1998-03-06 1998-06-10 Improvements in processor development systems Expired - Fee Related GB2338320B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US09/262,816 US6385742B1 (en) 1998-03-06 1999-03-05 Microprocessor debugging mechanism employing scan interface
US09/262,817 US6473727B1 (en) 1998-03-06 1999-03-05 Processor development systems

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB9804910A GB2337834B (en) 1998-03-06 1998-03-06 Microprocessor debugging

Publications (3)

Publication Number Publication Date
GB9812512D0 GB9812512D0 (en) 1998-08-05
GB2338320A GB2338320A (en) 1999-12-15
GB2338320B true GB2338320B (en) 2002-10-23

Family

ID=10828187

Family Applications (2)

Application Number Title Priority Date Filing Date
GB9804910A Expired - Fee Related GB2337834B (en) 1998-03-06 1998-03-06 Microprocessor debugging
GB9812512A Expired - Fee Related GB2338320B (en) 1998-03-06 1998-06-10 Improvements in processor development systems

Family Applications Before (1)

Application Number Title Priority Date Filing Date
GB9804910A Expired - Fee Related GB2337834B (en) 1998-03-06 1998-03-06 Microprocessor debugging

Country Status (1)

Country Link
GB (2) GB2337834B (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6321329B1 (en) 1999-05-19 2001-11-20 Arm Limited Executing debug instructions
US6343358B1 (en) 1999-05-19 2002-01-29 Arm Limited Executing multiple debug instructions
US7055117B2 (en) 2003-12-29 2006-05-30 Agere Systems, Inc. System and method for debugging system-on-chips using single or n-cycle stepping
US10388393B2 (en) * 2016-03-22 2019-08-20 Micron Technology, Inc. Apparatus and methods for debugging on a host and memory device
US11074988B2 (en) 2016-03-22 2021-07-27 Micron Technology, Inc. Apparatus and methods for debugging on a host and memory device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0854422A2 (en) * 1996-12-20 1998-07-22 Texas Instruments Incorporated A processor test port with scan chains and data streaming

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69728507T2 (en) * 1996-12-20 2005-03-24 Texas Instruments Inc., Dallas Nonintrusive code holding points in a processor instruction execution pipeline

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0854422A2 (en) * 1996-12-20 1998-07-22 Texas Instruments Incorporated A processor test port with scan chains and data streaming

Also Published As

Publication number Publication date
GB2337834B (en) 2003-02-12
GB9812512D0 (en) 1998-08-05
GB2337834A (en) 1999-12-01
GB2338320A (en) 1999-12-15
GB9804910D0 (en) 1998-04-29

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20150610