GB9800596D0 - Spring probe and method for biasing - Google Patents

Spring probe and method for biasing

Info

Publication number
GB9800596D0
GB9800596D0 GBGB9800596.0A GB9800596A GB9800596D0 GB 9800596 D0 GB9800596 D0 GB 9800596D0 GB 9800596 A GB9800596 A GB 9800596A GB 9800596 D0 GB9800596 D0 GB 9800596D0
Authority
GB
United Kingdom
Prior art keywords
biasing
spring probe
probe
spring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GBGB9800596.0A
Other versions
GB2323222A (en
GB2323222B (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Everett Charles Technologies Inc
Original Assignee
Everett Charles Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Everett Charles Technologies Inc filed Critical Everett Charles Technologies Inc
Publication of GB9800596D0 publication Critical patent/GB9800596D0/en
Publication of GB2323222A publication Critical patent/GB2323222A/en
Application granted granted Critical
Publication of GB2323222B publication Critical patent/GB2323222B/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
GB9800596A 1997-01-16 1998-01-14 Spring probe and method for biasing Expired - Lifetime GB2323222B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/783,467 US5801544A (en) 1997-01-16 1997-01-16 Spring probe and method for biasing

Publications (3)

Publication Number Publication Date
GB9800596D0 true GB9800596D0 (en) 1998-03-11
GB2323222A GB2323222A (en) 1998-09-16
GB2323222B GB2323222B (en) 2001-04-18

Family

ID=25129341

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9800596A Expired - Lifetime GB2323222B (en) 1997-01-16 1998-01-14 Spring probe and method for biasing

Country Status (6)

Country Link
US (1) US5801544A (en)
JP (1) JP3104869B2 (en)
DE (1) DE19801269C2 (en)
FR (1) FR2758395B1 (en)
GB (1) GB2323222B (en)
TW (1) TW363127B (en)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6243655B1 (en) * 1998-08-05 2001-06-05 International Business Machines Corporation Circuit trace probe and method
US6377059B2 (en) 1999-02-19 2002-04-23 Delaware Capital Formation, Inc. Crown shaped contact barrel configuration for spring probe
US6570399B2 (en) 2000-05-18 2003-05-27 Qa Technology Company, Inc. Test probe and separable mating connector assembly
US6331836B1 (en) * 2000-08-24 2001-12-18 Fast Location.Net, Llc Method and apparatus for rapidly estimating the doppler-error and other receiver frequency errors of global positioning system satellite signals weakened by obstructions in the signal path
US6876530B2 (en) 2001-01-12 2005-04-05 Qa Technology Company, Inc. Test probe and connector
JP3899075B2 (en) * 2002-03-05 2007-03-28 リカ デンシ アメリカ， インコーポレイテッド Equipment for interfacing electronic packages with test equipment
US6696850B1 (en) 2002-10-02 2004-02-24 Interconnect Devices, Inc. Contact probe with off-centered back-drilled aperture
KR100449204B1 (en) * 2002-11-25 2004-09-18 리노공업주식회사 Air Interface Apparatus for Use in High Frequency Probe
WO2006007440A1 (en) * 2004-06-16 2006-01-19 Rika Denshi America, Inc. Electrical test probes, methods of making, and methods of using
US7161369B2 (en) * 2004-10-29 2007-01-09 Agilent Technologies, Inc. Method and apparatus for a wobble fixture probe for probing test access point structures
US7248065B2 (en) * 2005-04-22 2007-07-24 Hewlett-Packard Development Company, L.P. Arcuate blade probe
US8253430B2 (en) * 2005-04-22 2012-08-28 Hewlett-Packard Development Company Circuit board testing using a probe
US7453278B2 (en) * 2005-04-22 2008-11-18 Hewlett-Packard Development Company, L.P. Methods of using a blade probe for probing a node of a circuit
US7362118B2 (en) * 2006-08-25 2008-04-22 Interconnect Devices, Inc. Probe with contact ring
KR200449392Y1 (en) * 2007-09-11 2010-07-07 주식회사 파워트론 Probe pin structure, and it's assembling
FR2926242B1 (en) * 2008-01-16 2010-03-19 Eads Europ Aeronautic Defence METHOD AND DEVICE FOR MOLDING A HIGH-PERFORMANCE THERMOPLASTIC COMPOSITE PIECE
JP4900843B2 (en) 2008-12-26 2012-03-21 山一電機株式会社 Electrical connection device for semiconductor device and contact used therefor
US8905795B2 (en) 2011-10-12 2014-12-09 Apple Inc. Spring-loaded contacts
US8734189B2 (en) 2011-10-12 2014-05-27 Apple Inc. Spring-loaded contact having dome-shaped piston
US20130330983A1 (en) * 2012-06-10 2013-12-12 Apple Inc. Spring-loaded contacts having sloped backside with retention guide
JP2015169518A (en) * 2014-03-06 2015-09-28 株式会社ミタカ contact probe
JP2021072192A (en) * 2019-10-30 2021-05-06 株式会社ヨコオ Spring connector and manufacturing method thereof
US11437747B2 (en) 2020-09-25 2022-09-06 Apple Inc. Spring-loaded contacts having capsule intermediate object
US11942722B2 (en) 2020-09-25 2024-03-26 Apple Inc. Magnetic circuit for magnetic connector

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US566655A (en) * 1896-08-25 campbell
US3435168A (en) * 1968-03-28 1969-03-25 Pylon Co Inc Electrical contact
US4050762A (en) * 1976-11-10 1977-09-27 Everett/Charles, Inc. Telescoping spring probe having separate wiper contact member
CA1162243A (en) * 1979-12-26 1984-02-14 Jonathon H. Katz Test pin
US4397519A (en) * 1981-05-12 1983-08-09 Pylon Company, Inc. Electrical contact construction
DE3410093A1 (en) * 1984-03-20 1985-10-03 Feinmetall Gmbh, 7033 Herrenberg Spring contact pin and a method for its production
US4560223A (en) * 1984-06-29 1985-12-24 Pylon Company, Inc. Self-cleaning tri-cusp signal contact
JPS6285872A (en) * 1985-10-11 1987-04-20 Seiko Epson Corp Socketless pin probe
US4885533B1 (en) * 1988-09-09 1998-11-03 Qa Technology Co Inc Electrical circuit test probe having an elongate cylindrical retaining and sliding bearing region
US4904935A (en) * 1988-11-14 1990-02-27 Eaton Corporation Electrical circuit board text fixture having movable platens
DE3920850A1 (en) * 1989-06-24 1991-01-10 Feinmetall Gmbh SPRING CONTACT PIN
US5175493A (en) * 1991-10-11 1992-12-29 Interconnect Devices, Inc. Shielded electrical contact spring probe assembly
GB2276042A (en) * 1993-03-03 1994-09-14 Centalic Tech Dev Ltd Contact probe for testing electrical equipment
JP2558254Y2 (en) * 1993-03-31 1997-12-24 弘洋電子機器 株式会社 Inspection probe pin and its socket

Also Published As

Publication number Publication date
JPH10213592A (en) 1998-08-11
JP3104869B2 (en) 2000-10-30
GB2323222A (en) 1998-09-16
TW363127B (en) 1999-07-01
FR2758395A1 (en) 1998-07-17
DE19801269A1 (en) 1998-08-20
GB2323222B (en) 2001-04-18
US5801544A (en) 1998-09-01
DE19801269C2 (en) 1999-07-01
FR2758395B1 (en) 2000-06-23

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Legal Events

Date Code Title Description
PE20 Patent expired after termination of 20 years

Expiry date: 20180113