GB9719697D0 - Atom probe - Google Patents

Atom probe

Info

Publication number
GB9719697D0
GB9719697D0 GBGB9719697.6A GB9719697A GB9719697D0 GB 9719697 D0 GB9719697 D0 GB 9719697D0 GB 9719697 A GB9719697 A GB 9719697A GB 9719697 D0 GB9719697 D0 GB 9719697D0
Authority
GB
United Kingdom
Prior art keywords
atom probe
probe
atom
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
GBGB9719697.6A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oxford University Innovation Ltd
Original Assignee
Oxford University Innovation Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oxford University Innovation Ltd filed Critical Oxford University Innovation Ltd
Priority to GBGB9719697.6A priority Critical patent/GB9719697D0/en
Publication of GB9719697D0 publication Critical patent/GB9719697D0/en
Priority to DE69822315T priority patent/DE69822315T2/de
Priority to PCT/GB1998/002678 priority patent/WO1999014793A1/en
Priority to US09/508,912 priority patent/US6580069B1/en
Priority to EP98941603A priority patent/EP1016123B1/en
Priority to JP2000512237A priority patent/JP2003510757A/ja
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/285—Emission microscopes, e.g. field-emission microscopes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
GBGB9719697.6A 1997-09-16 1997-09-16 Atom probe Ceased GB9719697D0 (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
GBGB9719697.6A GB9719697D0 (en) 1997-09-16 1997-09-16 Atom probe
DE69822315T DE69822315T2 (de) 1997-09-16 1998-09-04 Atomsonde
PCT/GB1998/002678 WO1999014793A1 (en) 1997-09-16 1998-09-04 Atom probe
US09/508,912 US6580069B1 (en) 1997-09-16 1998-09-04 Atom probe
EP98941603A EP1016123B1 (en) 1997-09-16 1998-09-04 Atom probe
JP2000512237A JP2003510757A (ja) 1997-09-16 1998-09-04 原子プローブ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB9719697.6A GB9719697D0 (en) 1997-09-16 1997-09-16 Atom probe

Publications (1)

Publication Number Publication Date
GB9719697D0 true GB9719697D0 (en) 1997-11-19

Family

ID=10819161

Family Applications (1)

Application Number Title Priority Date Filing Date
GBGB9719697.6A Ceased GB9719697D0 (en) 1997-09-16 1997-09-16 Atom probe

Country Status (6)

Country Link
US (1) US6580069B1 (https=)
EP (1) EP1016123B1 (https=)
JP (1) JP2003510757A (https=)
DE (1) DE69822315T2 (https=)
GB (1) GB9719697D0 (https=)
WO (1) WO1999014793A1 (https=)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4111501B2 (ja) 2001-03-26 2008-07-02 学校法人金沢工業大学 走査型アトムプローブおよび走査型アトムプローブを用いた分析方法
JP3902925B2 (ja) * 2001-07-31 2007-04-11 エスアイアイ・ナノテクノロジー株式会社 走査型アトムプローブ
CA2493212A1 (en) * 2002-07-24 2004-02-26 Jpk Instruments Ag Method for locally highly resolved, mass-spectroscopic characterization of surfaces using scanning probe technology
US6762415B1 (en) 2003-04-18 2004-07-13 Imago Scientific Instruments Corporation Vacuum chamber with recessed viewing tube and imaging device situated therein
US7157702B2 (en) * 2003-06-06 2007-01-02 Imago Scientific Instruments Corporation High resolution atom probe
US6956210B2 (en) 2003-10-15 2005-10-18 Micron Tchnology, Inc. Methods for preparing samples for atom probe analysis
KR20070033332A (ko) * 2004-03-24 2007-03-26 이메이고 사이언티픽 인스트루먼츠 코포레이션 레이저 원자 탐침기
WO2005122210A1 (en) * 2004-06-03 2005-12-22 Imago Scientific Instruments Corporation Laser atom probe methods
US7772552B2 (en) * 2004-06-21 2010-08-10 Cameca Instruments, Inc. Methods and devices for atom probe mass resolution enhancement
WO2006101558A2 (en) * 2004-12-21 2006-09-28 Imago Scientific Instruments Corporation Laser atom probes
GB0512411D0 (en) 2005-06-17 2005-07-27 Polaron Plc Atom probe
EP1913362A2 (en) * 2005-07-28 2008-04-23 Imago Scientific Instruments Corporation Atom probe evaporation processes
US20080083882A1 (en) * 2006-10-06 2008-04-10 Jian Bai Laser desorption assisted field ionization device and method
JP6541798B2 (ja) 2015-04-21 2019-07-10 カメカ インストゥルメンツ，インコーポレイテッド 広視野アトムプローブ

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6079658A (ja) * 1983-10-07 1985-05-07 Hitachi Ltd 大気圧イオン化質量分析計
AU6148986A (en) * 1985-07-23 1987-02-10 Alfred Cerezo Improvements in atom probes
JP3266995B2 (ja) 1993-07-30 2002-03-18 株式会社日立製作所 導電性部材の観察・計測方法及びその装置
US5440124A (en) * 1994-07-08 1995-08-08 Wisconsin Alumni Research Foundation High mass resolution local-electrode atom probe
US5614711A (en) * 1995-05-04 1997-03-25 Indiana University Foundation Time-of-flight mass spectrometer
US5625184A (en) * 1995-05-19 1997-04-29 Perseptive Biosystems, Inc. Time-of-flight mass spectrometry analysis of biomolecules
DE19547949C2 (de) * 1995-09-19 2000-04-06 Bruker Daltonik Gmbh Flugzeitmassenspektrometer
US5744797A (en) * 1995-11-22 1998-04-28 Bruker Analytical Instruments, Inc. Split-field interface
US5864137A (en) * 1996-10-01 1999-01-26 Genetrace Systems, Inc. Mass spectrometer
JP2939540B2 (ja) * 1998-01-30 1999-08-25 科学技術庁金属材料技術研究所長 パルス励起原子線とパルス紫外光の生成方法およびその装置

Also Published As

Publication number Publication date
EP1016123A1 (en) 2000-07-05
WO1999014793A1 (en) 1999-03-25
JP2003510757A (ja) 2003-03-18
US6580069B1 (en) 2003-06-17
DE69822315T2 (de) 2004-12-30
DE69822315D1 (de) 2004-04-15
EP1016123B1 (en) 2004-03-10

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Legal Events

Date Code Title Description
AT Applications terminated before publication under section 16(1)