GB9710670D0 - Improvements in or relating to semiconductor devices - Google Patents

Improvements in or relating to semiconductor devices

Info

Publication number
GB9710670D0
GB9710670D0 GBGB9710670.2A GB9710670A GB9710670D0 GB 9710670 D0 GB9710670 D0 GB 9710670D0 GB 9710670 A GB9710670 A GB 9710670A GB 9710670 D0 GB9710670 D0 GB 9710670D0
Authority
GB
United Kingdom
Prior art keywords
relating
semiconductor devices
semiconductor
devices
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GBGB9710670.2A
Other versions
GB2325527B (en
GB2325527A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Ltd
Original Assignee
Texas Instruments Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Ltd filed Critical Texas Instruments Ltd
Priority to GB9710670A priority Critical patent/GB2325527B/en
Publication of GB9710670D0 publication Critical patent/GB9710670D0/en
Publication of GB2325527A publication Critical patent/GB2325527A/en
Application granted granted Critical
Publication of GB2325527B publication Critical patent/GB2325527B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/74—Testing of fuses
GB9710670A 1997-05-23 1997-05-23 Detecting the state of an electrical conductor Expired - Fee Related GB2325527B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB9710670A GB2325527B (en) 1997-05-23 1997-05-23 Detecting the state of an electrical conductor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB9710670A GB2325527B (en) 1997-05-23 1997-05-23 Detecting the state of an electrical conductor

Publications (3)

Publication Number Publication Date
GB9710670D0 true GB9710670D0 (en) 1997-07-16
GB2325527A GB2325527A (en) 1998-11-25
GB2325527B GB2325527B (en) 2002-03-27

Family

ID=10812945

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9710670A Expired - Fee Related GB2325527B (en) 1997-05-23 1997-05-23 Detecting the state of an electrical conductor

Country Status (1)

Country Link
GB (1) GB2325527B (en)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4837520A (en) * 1985-03-29 1989-06-06 Honeywell Inc. Fuse status detection circuit
KR0149259B1 (en) * 1995-06-30 1998-10-15 김광호 Fuse signature device for semiconductor memory

Also Published As

Publication number Publication date
GB2325527B (en) 2002-03-27
GB2325527A (en) 1998-11-25

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20130523