GB945046A - Improvements in or relating to a method of and means for measuring thicknesses of deposits - Google Patents
Improvements in or relating to a method of and means for measuring thicknesses of depositsInfo
- Publication number
- GB945046A GB945046A GB3230061A GB3230061A GB945046A GB 945046 A GB945046 A GB 945046A GB 3230061 A GB3230061 A GB 3230061A GB 3230061 A GB3230061 A GB 3230061A GB 945046 A GB945046 A GB 945046A
- Authority
- GB
- United Kingdom
- Prior art keywords
- chamber
- sample
- counter
- tube
- particles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Electromagnetism (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
945,046. Measuring thickness using beta particles. COMMISSARIAT A L'ENERGIE ATOMIQUE. Sept. 8,1961 [Sept. 8, 1960], No. 32300/61. Heading G1A. Apparatus for measuring the thickness of metallic deposits, of the type wherein # particles from source 11 bombard a sample deposit 2 and the X-rays, characteristic of the metal tested, emitted by the sample are detected by proportional counter 10, and wherein the retrodiffused # particles from the sample are deviated from the counter by a magnetic field, is characterized by the provision of a direct connection between the sample and the proportional counter chamber, comprising a non-magnetic tube 8, passing the X-rays and subjected to the magnetic field by magnet 9. Irradiation chamber 3, tube 8 and counter chamber 10 are hermetically sealed by rings 7, 14, 15 and 16 and filled with an innert gas mixture 90% argon, 10% methane. To enable the sample deposit to be removed and changed the source holder 12 can slide down through chamber 10, by means of screw 17 and clamp 18 and hermetically seal the tube 8 and counter chamber 10 by means of the sealing ring 9, engaging a flange on the inner wall of the irradiation chamber 3. The Specification describes the variation in resistivity of the apparatus with the pressure of the enclosed gas.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR838270A FR78659E (en) | 1955-04-12 | 1960-09-08 | New method of measuring the thicknesses of metal deposits using a beta ray source |
Publications (1)
Publication Number | Publication Date |
---|---|
GB945046A true GB945046A (en) | 1963-12-18 |
Family
ID=8738796
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB3230061A Expired GB945046A (en) | 1960-09-08 | 1961-09-08 | Improvements in or relating to a method of and means for measuring thicknesses of deposits |
Country Status (3)
Country | Link |
---|---|
BE (1) | BE607443A (en) |
GB (1) | GB945046A (en) |
LU (1) | LU40527A1 (en) |
-
1961
- 1961-08-21 LU LU40527D patent/LU40527A1/xx unknown
- 1961-08-23 BE BE607443A patent/BE607443A/en unknown
- 1961-09-08 GB GB3230061A patent/GB945046A/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
LU40527A1 (en) | 1961-10-21 |
BE607443A (en) | 1961-12-18 |
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