GB9403815D0 - Scanning electron microscope grain imaging - Google Patents
Scanning electron microscope grain imagingInfo
- Publication number
- GB9403815D0 GB9403815D0 GB9403815A GB9403815A GB9403815D0 GB 9403815 D0 GB9403815 D0 GB 9403815D0 GB 9403815 A GB9403815 A GB 9403815A GB 9403815 A GB9403815 A GB 9403815A GB 9403815 D0 GB9403815 D0 GB 9403815D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- electron microscope
- scanning electron
- grain imaging
- microscope grain
- imaging
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/244—Detectors; Associated components or circuits therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/22—Treatment of data
- H01J2237/221—Image processing
- H01J2237/225—Displaying image using synthesised colours
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/244—Detection characterized by the detecting means
- H01J2237/24475—Scattered electron detectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/244—Detection characterized by the detecting means
- H01J2237/24495—Signal processing, e.g. mixing of two or more signals
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB9403815A GB2285169A (en) | 1993-12-21 | 1994-02-28 | Scanning electron microscope grain imaging |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB939326053A GB9326053D0 (en) | 1993-12-21 | 1993-12-21 | Scanning electron microscopes |
GB9403815A GB2285169A (en) | 1993-12-21 | 1994-02-28 | Scanning electron microscope grain imaging |
Publications (2)
Publication Number | Publication Date |
---|---|
GB9403815D0 true GB9403815D0 (en) | 1994-04-20 |
GB2285169A GB2285169A (en) | 1995-06-28 |
Family
ID=26304056
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB9403815A Withdrawn GB2285169A (en) | 1993-12-21 | 1994-02-28 | Scanning electron microscope grain imaging |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB2285169A (en) |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1076857A (en) * | 1963-10-11 | 1967-07-26 | Jeol Ltd | Electron beam apparatus |
GB1195271A (en) * | 1967-02-16 | 1970-06-17 | Cambridge Instr Co Ltd | Electron Beam Apparatus |
US4041311A (en) * | 1976-07-12 | 1977-08-09 | Iowa State University Research Foundation, Inc. | Scanning electron microscope with color image display |
EP0443410B1 (en) * | 1990-02-23 | 1994-09-21 | International Business Machines Corporation | Multiple detector system for specimen inspection using high energy backscatter electrons |
EP0460305B1 (en) * | 1990-06-04 | 1995-12-27 | Nobuo Mikoshiba | Method for observing microscopic surface structure |
NL9001512A (en) * | 1990-07-03 | 1992-02-03 | Philips Nv | ELECTRON BUNDLE DEVICE FOR TOPOGRAPHIC DETECTION. |
US5212383A (en) * | 1991-07-29 | 1993-05-18 | David Scharf | Color synthesizing scanning electron microscope |
-
1994
- 1994-02-28 GB GB9403815A patent/GB2285169A/en not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
GB2285169A (en) | 1995-06-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
WAP | Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1) |