GB8916075D0 - Vision system - Google Patents

Vision system

Info

Publication number
GB8916075D0
GB8916075D0 GB898916075A GB8916075A GB8916075D0 GB 8916075 D0 GB8916075 D0 GB 8916075D0 GB 898916075 A GB898916075 A GB 898916075A GB 8916075 A GB8916075 A GB 8916075A GB 8916075 D0 GB8916075 D0 GB 8916075D0
Authority
GB
United Kingdom
Prior art keywords
vision system
vision
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB898916075A
Other versions
GB2221297A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PA Consulting Services Ltd
Original Assignee
PA Consulting Services Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by PA Consulting Services Ltd filed Critical PA Consulting Services Ltd
Publication of GB8916075D0 publication Critical patent/GB8916075D0/en
Publication of GB2221297A publication Critical patent/GB2221297A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • H01L21/681—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment using optical controlling means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
GB8916075A 1988-07-14 1989-07-13 Vision system for inspecting objects Withdrawn GB2221297A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB888816730A GB8816730D0 (en) 1988-07-14 1988-07-14 Improved vision system

Publications (2)

Publication Number Publication Date
GB8916075D0 true GB8916075D0 (en) 1989-08-31
GB2221297A GB2221297A (en) 1990-01-31

Family

ID=10640418

Family Applications (2)

Application Number Title Priority Date Filing Date
GB888816730A Pending GB8816730D0 (en) 1988-07-14 1988-07-14 Improved vision system
GB8916075A Withdrawn GB2221297A (en) 1988-07-14 1989-07-13 Vision system for inspecting objects

Family Applications Before (1)

Application Number Title Priority Date Filing Date
GB888816730A Pending GB8816730D0 (en) 1988-07-14 1988-07-14 Improved vision system

Country Status (1)

Country Link
GB (2) GB8816730D0 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2258576A (en) * 1991-08-03 1993-02-10 British Aerospace Space & Comm A visible light detector assembly
DE4209524A1 (en) * 1992-03-24 1993-09-30 Siemens Ag Method for position detection and / or division check and / or coplanarity check of the connections of components and placement head for the automatic placement of components
HUP9800290A3 (en) * 1998-02-11 2000-03-28 77 Elektronika Mueszeripari Kf Device for automatically analyzing a test stripe
CN110987954B (en) * 2019-12-30 2021-10-22 江南大学 Method and system for eliminating leather surface defect detection blind area

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1521263A (en) * 1974-08-22 1978-08-16 Ti Ltd Electro-optical position monitoring and control means
GB1489181A (en) * 1974-10-07 1977-10-19 Shoe & Allied Trades Res Ass Measuring apparatus
GB2052734B (en) * 1979-05-21 1983-10-19 Daystrom Ltd Position and dimension measuring apparaus
GB2058344B (en) * 1979-09-07 1984-01-25 Diffracto Ltd Electro-optical inspection of workpieces
FR2522804B1 (en) * 1982-03-05 1986-10-10 Thomson Csf OCULOMETER APPARATUS AND ITS USE IN A HEAD SIGHT SYSTEM
IT1174127B (en) * 1983-06-14 1987-07-01 Hauni Werke Koerber & Co Kg OPTICAL CONTROL DEVICE FOR CIGARETTES
JPS6042606A (en) * 1983-08-04 1985-03-06 ナノメトリツクス・インコ−ポレ−テツド Optical size measuring device
US4664520A (en) * 1984-09-29 1987-05-12 Ngk Insulators, Ltd. Camera for visual inspection

Also Published As

Publication number Publication date
GB2221297A (en) 1990-01-31
GB8816730D0 (en) 1988-08-17

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)