GB8816730D0 - Improved vision system - Google Patents

Improved vision system

Info

Publication number
GB8816730D0
GB8816730D0 GB888816730A GB8816730A GB8816730D0 GB 8816730 D0 GB8816730 D0 GB 8816730D0 GB 888816730 A GB888816730 A GB 888816730A GB 8816730 A GB8816730 A GB 8816730A GB 8816730 D0 GB8816730 D0 GB 8816730D0
Authority
GB
United Kingdom
Prior art keywords
vision system
improved vision
improved
vision
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
GB888816730A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PA Consulting Services Ltd
Original Assignee
PA Consulting Services Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by PA Consulting Services Ltd filed Critical PA Consulting Services Ltd
Priority to GB888816730A priority Critical patent/GB8816730D0/en
Publication of GB8816730D0 publication Critical patent/GB8816730D0/en
Priority to GB8916075A priority patent/GB2221297A/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • H01L21/681—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment using optical controlling means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques

Landscapes

  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Image Input (AREA)
GB888816730A 1988-07-14 1988-07-14 Improved vision system Pending GB8816730D0 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
GB888816730A GB8816730D0 (en) 1988-07-14 1988-07-14 Improved vision system
GB8916075A GB2221297A (en) 1988-07-14 1989-07-13 Vision system for inspecting objects

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB888816730A GB8816730D0 (en) 1988-07-14 1988-07-14 Improved vision system

Publications (1)

Publication Number Publication Date
GB8816730D0 true GB8816730D0 (en) 1988-08-17

Family

ID=10640418

Family Applications (2)

Application Number Title Priority Date Filing Date
GB888816730A Pending GB8816730D0 (en) 1988-07-14 1988-07-14 Improved vision system
GB8916075A Withdrawn GB2221297A (en) 1988-07-14 1989-07-13 Vision system for inspecting objects

Family Applications After (1)

Application Number Title Priority Date Filing Date
GB8916075A Withdrawn GB2221297A (en) 1988-07-14 1989-07-13 Vision system for inspecting objects

Country Status (1)

Country Link
GB (2) GB8816730D0 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110987954A (en) * 2019-12-30 2020-04-10 江南大学 Method and system for eliminating leather surface defect detection blind area

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2258576A (en) * 1991-08-03 1993-02-10 British Aerospace Space & Comm A visible light detector assembly
DE4209524A1 (en) * 1992-03-24 1993-09-30 Siemens Ag Method for position detection and / or division check and / or coplanarity check of the connections of components and placement head for the automatic placement of components
HUP9800290A3 (en) * 1998-02-11 2000-03-28 77 Elektronika Mueszeripari Kf Device for automatically analyzing a test stripe

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1521263A (en) * 1974-08-22 1978-08-16 Ti Ltd Electro-optical position monitoring and control means
GB1489181A (en) * 1974-10-07 1977-10-19 Shoe & Allied Trades Res Ass Measuring apparatus
GB2052734B (en) * 1979-05-21 1983-10-19 Daystrom Ltd Position and dimension measuring apparaus
GB2058344B (en) * 1979-09-07 1984-01-25 Diffracto Ltd Electro-optical inspection of workpieces
FR2522804B1 (en) * 1982-03-05 1986-10-10 Thomson Csf OCULOMETER APPARATUS AND ITS USE IN A HEAD SIGHT SYSTEM
IT1174127B (en) * 1983-06-14 1987-07-01 Hauni Werke Koerber & Co Kg OPTICAL CONTROL DEVICE FOR CIGARETTES
JPS6042606A (en) * 1983-08-04 1985-03-06 ナノメトリツクス・インコ−ポレ−テツド Optical size measuring device
US4664520A (en) * 1984-09-29 1987-05-12 Ngk Insulators, Ltd. Camera for visual inspection

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110987954A (en) * 2019-12-30 2020-04-10 江南大学 Method and system for eliminating leather surface defect detection blind area

Also Published As

Publication number Publication date
GB2221297A (en) 1990-01-31
GB8916075D0 (en) 1989-08-31

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