GB8802937D0 - Timing generator - Google Patents

Timing generator

Info

Publication number
GB8802937D0
GB8802937D0 GB888802937A GB8802937A GB8802937D0 GB 8802937 D0 GB8802937 D0 GB 8802937D0 GB 888802937 A GB888802937 A GB 888802937A GB 8802937 A GB8802937 A GB 8802937A GB 8802937 D0 GB8802937 D0 GB 8802937D0
Authority
GB
United Kingdom
Prior art keywords
timing generator
timing
generator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB888802937A
Other versions
GB2200774B (en
GB2200774A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of GB8802937D0 publication Critical patent/GB8802937D0/en
Publication of GB2200774A publication Critical patent/GB2200774A/en
Application granted granted Critical
Publication of GB2200774B publication Critical patent/GB2200774B/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/13—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals
    • H03K5/135—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals by the use of time reference signals, e.g. clock signals
GB8802937A 1987-02-09 1988-02-09 Timing generator Expired - Lifetime GB2200774B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US1281587A 1987-02-09 1987-02-09

Publications (3)

Publication Number Publication Date
GB8802937D0 true GB8802937D0 (en) 1988-03-09
GB2200774A GB2200774A (en) 1988-08-10
GB2200774B GB2200774B (en) 1990-11-07

Family

ID=21756830

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8802937A Expired - Lifetime GB2200774B (en) 1987-02-09 1988-02-09 Timing generator

Country Status (5)

Country Link
JP (1) JPH06103832B2 (en)
CA (1) CA1281385C (en)
DE (1) DE3743434A1 (en)
FR (1) FR2610742B1 (en)
GB (1) GB2200774B (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2684209B1 (en) * 1990-10-30 1995-03-10 Teradyne Inc FAST TIME BASE GENERATOR.
EP0618677A1 (en) * 1993-03-31 1994-10-05 STMicroelectronics S.r.l. Programmable time-interval generator
CA2127192C (en) * 1993-07-01 1999-09-07 Alan Brent Hussey Shaping ate bursts, particularly in gallium arsenide
US5566188A (en) * 1995-03-29 1996-10-15 Teradyne, Inc. Low cost timing generator for automatic test equipment operating at high data rates
JP2909218B2 (en) * 1995-04-13 1999-06-23 株式会社アドバンテスト Period generator for semiconductor test equipment
FR2871963B1 (en) * 2004-06-22 2006-09-15 Thales Sa ELECTRONIC DEVICE FOR GENERATING SYNCHRONIZATION SIGNALS
CN112968691B (en) * 2021-02-10 2023-04-11 西南电子技术研究所（中国电子科技集团公司第十研究所） Pulse time delay precision self-adaptive synchronization method

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3633113A (en) * 1969-12-22 1972-01-04 Ibm Timed pulse train generating system
US4231104A (en) * 1978-04-26 1980-10-28 Teradyne, Inc. Generating timing signals
US4409564A (en) * 1981-03-20 1983-10-11 Wavetek Pulse delay compensation for frequency synthesizer
EP0080970B1 (en) * 1981-11-26 1985-12-18 Deutsche ITT Industries GmbH Frequency divider programmable for non-integer division
JPS59105123A (en) * 1982-12-08 1984-06-18 Fujitsu Ltd Clock circuit
JPS59174016A (en) * 1983-03-24 1984-10-02 Fujitsu Ltd Clock distributing system
JPS6089775A (en) * 1983-08-01 1985-05-20 フエアチアイルド　カメラ　アンド　インストルメント　コ−ポレ−シヨン Test period generator for automatic testing equipment
JP2539600B2 (en) * 1985-07-10 1996-10-02 株式会社アドバンテスト Timing generator

Also Published As

Publication number Publication date
FR2610742A1 (en) 1988-08-12
GB2200774B (en) 1990-11-07
DE3743434C2 (en) 1990-07-19
JPH06103832B2 (en) 1994-12-14
JPS63203005A (en) 1988-08-22
FR2610742B1 (en) 1994-05-20
CA1281385C (en) 1991-03-12
DE3743434A1 (en) 1988-08-18
GB2200774A (en) 1988-08-10

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20070209