GB8727957D0 - Integrated circuit having patch array - Google Patents

Integrated circuit having patch array

Info

Publication number
GB8727957D0
GB8727957D0 GB878727957A GB8727957A GB8727957D0 GB 8727957 D0 GB8727957 D0 GB 8727957D0 GB 878727957 A GB878727957 A GB 878727957A GB 8727957 A GB8727957 A GB 8727957A GB 8727957 D0 GB8727957 D0 GB 8727957D0
Authority
GB
United Kingdom
Prior art keywords
integrated circuit
patch array
patch
array
integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB878727957A
Other versions
GB2212978A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Plessey Co Ltd
Original Assignee
Plessey Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Plessey Co Ltd filed Critical Plessey Co Ltd
Priority to GB8727957A priority Critical patent/GB2212978A/en
Publication of GB8727957D0 publication Critical patent/GB8727957D0/en
Publication of GB2212978A publication Critical patent/GB2212978A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
    • H01L22/34—Circuits for electrically characterising or monitoring manufacturing processes, e. g. whole test die, wafers filled with test structures, on-board-devices incorporated on each die, process control monitors or pad structures thereof, devices in scribe line
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
    • H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body
    • H01L27/10—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration
    • H01L27/118—Masterslice integrated circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Automation & Control Theory (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
GB8727957A 1987-11-30 1987-11-30 An integrated circuit having a patch array Withdrawn GB2212978A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB8727957A GB2212978A (en) 1987-11-30 1987-11-30 An integrated circuit having a patch array

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB8727957A GB2212978A (en) 1987-11-30 1987-11-30 An integrated circuit having a patch array

Publications (2)

Publication Number Publication Date
GB8727957D0 true GB8727957D0 (en) 1988-01-06
GB2212978A GB2212978A (en) 1989-08-02

Family

ID=10627744

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8727957A Withdrawn GB2212978A (en) 1987-11-30 1987-11-30 An integrated circuit having a patch array

Country Status (1)

Country Link
GB (1) GB2212978A (en)

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3634927A (en) * 1968-11-29 1972-01-18 Energy Conversion Devices Inc Method of selective wiring of integrated electronic circuits and the article formed thereby
US4281398A (en) * 1980-02-12 1981-07-28 Mostek Corporation Block redundancy for memory array
US4346459A (en) * 1980-06-30 1982-08-24 Inmos Corporation Redundancy scheme for an MOS memory
EP0089457A3 (en) * 1982-03-23 1986-01-22 Texas Instruments Incorporated Avalanche fuse element as programmable memory
US4494220A (en) * 1982-11-24 1985-01-15 At&T Bell Laboratories Folded bit line memory with one decoder per pair of spare rows
JPS59125640A (en) * 1982-12-28 1984-07-20 Fujitsu Ltd Manufacture of semiconductor device
JPH0670880B2 (en) * 1983-01-21 1994-09-07 株式会社日立マイコンシステム Semiconductor memory device
US4584682A (en) * 1983-09-02 1986-04-22 International Business Machines Corporation Reconfigurable memory using both address permutation and spare memory elements
JPS61264599A (en) * 1985-05-16 1986-11-22 Fujitsu Ltd Semiconductor memory device

Also Published As

Publication number Publication date
GB2212978A (en) 1989-08-02

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)