GB8612661D0 - Measuring quartz crystal frequency - Google Patents

Measuring quartz crystal frequency

Info

Publication number
GB8612661D0
GB8612661D0 GB868612661A GB8612661A GB8612661D0 GB 8612661 D0 GB8612661 D0 GB 8612661D0 GB 868612661 A GB868612661 A GB 868612661A GB 8612661 A GB8612661 A GB 8612661A GB 8612661 D0 GB8612661 D0 GB 8612661D0
Authority
GB
United Kingdom
Prior art keywords
quartz crystal
crystal frequency
measuring quartz
measuring
frequency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB868612661A
Other versions
GB2190753A (en
GB2190753B (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STC PLC
Original Assignee
STC PLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STC PLC filed Critical STC PLC
Priority to GB8612661A priority Critical patent/GB2190753B/en
Publication of GB8612661D0 publication Critical patent/GB8612661D0/en
Publication of GB2190753A publication Critical patent/GB2190753A/en
Application granted granted Critical
Publication of GB2190753B publication Critical patent/GB2190753B/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/02Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/22Measuring piezoelectric properties
GB8612661A 1986-05-23 1986-05-23 Measuring quartz crystal frequency Expired GB2190753B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB8612661A GB2190753B (en) 1986-05-23 1986-05-23 Measuring quartz crystal frequency

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB8612661A GB2190753B (en) 1986-05-23 1986-05-23 Measuring quartz crystal frequency

Publications (3)

Publication Number Publication Date
GB8612661D0 true GB8612661D0 (en) 1986-07-02
GB2190753A GB2190753A (en) 1987-11-25
GB2190753B GB2190753B (en) 1989-12-13

Family

ID=10598375

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8612661A Expired GB2190753B (en) 1986-05-23 1986-05-23 Measuring quartz crystal frequency

Country Status (1)

Country Link
GB (1) GB2190753B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111665392A (en) * 2018-05-16 2020-09-15 浙江大学台州研究院 High-precision frequency statistical calibration method for quartz wafer grinding

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4121411C1 (en) * 1991-06-28 1993-02-04 Wilfried Dr.-Ing. 6380 Bad Homburg De Schael Measuring resonance frequencies of piezoelectric components - generating pulse marking time point of resonance on basis characteristic signal change using HF wobbulator controlled by LF probe signals

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111665392A (en) * 2018-05-16 2020-09-15 浙江大学台州研究院 High-precision frequency statistical calibration method for quartz wafer grinding
CN111665392B (en) * 2018-05-16 2022-06-10 浙江大学台州研究院 High-precision frequency statistical calibration method for quartz wafer grinding

Also Published As

Publication number Publication date
GB2190753A (en) 1987-11-25
GB2190753B (en) 1989-12-13

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Legal Events

Date Code Title Description
746 Register noted 'licences of right' (sect. 46/1977)
732E Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977)
732E Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977)
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20040523