GB8518132D0 - Logic circuit - Google Patents

Logic circuit

Info

Publication number
GB8518132D0
GB8518132D0 GB858518132A GB8518132A GB8518132D0 GB 8518132 D0 GB8518132 D0 GB 8518132D0 GB 858518132 A GB858518132 A GB 858518132A GB 8518132 A GB8518132 A GB 8518132A GB 8518132 D0 GB8518132 D0 GB 8518132D0
Authority
GB
United Kingdom
Prior art keywords
logic circuit
logic
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB858518132A
Other versions
GB2178175A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
British Telecommunications PLC
Original Assignee
British Telecommunications PLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by British Telecommunications PLC filed Critical British Telecommunications PLC
Priority to GB08518132A priority Critical patent/GB2178175A/en
Publication of GB8518132D0 publication Critical patent/GB8518132D0/en
Publication of GB2178175A publication Critical patent/GB2178175A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns
    • G01R31/318547—Data generators or compressors
GB08518132A 1985-07-18 1985-07-18 Logic testing circuit Withdrawn GB2178175A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB08518132A GB2178175A (en) 1985-07-18 1985-07-18 Logic testing circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB08518132A GB2178175A (en) 1985-07-18 1985-07-18 Logic testing circuit

Publications (2)

Publication Number Publication Date
GB8518132D0 true GB8518132D0 (en) 1985-08-21
GB2178175A GB2178175A (en) 1987-02-04

Family

ID=10582459

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08518132A Withdrawn GB2178175A (en) 1985-07-18 1985-07-18 Logic testing circuit

Country Status (1)

Country Link
GB (1) GB2178175A (en)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL7010586A (en) * 1970-07-17 1972-01-19
JPS539501B2 (en) * 1972-02-29 1978-04-06
US4066882A (en) * 1976-08-16 1978-01-03 Grumman Aerospace Corporation Digital stimulus generating and response measuring means
GB1599157A (en) * 1976-12-24 1981-09-30 Indep Broadcasting Authority Digital recognition circuits
DE2902375C2 (en) * 1979-01-23 1984-05-17 Siemens AG, 1000 Berlin und 8000 München Logic module for integrated digital circuits
DE3176315D1 (en) * 1980-04-11 1987-08-20 Siemens Ag Device for testing a digital circuit with test circuits enclosed in this circuit

Also Published As

Publication number Publication date
GB2178175A (en) 1987-02-04

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)