GB844692A - Improvements in the formation of junctions in semiconductor bodies - Google Patents

Improvements in the formation of junctions in semiconductor bodies

Info

Publication number
GB844692A
GB844692A GB3215756A GB3215756A GB844692A GB 844692 A GB844692 A GB 844692A GB 3215756 A GB3215756 A GB 3215756A GB 3215756 A GB3215756 A GB 3215756A GB 844692 A GB844692 A GB 844692A
Authority
GB
United Kingdom
Prior art keywords
layer
impurity
depth
semi
vapour
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB3215756A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US542131A external-priority patent/US2898247A/en
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of GB844692A publication Critical patent/GB844692A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C12/00Solid state diffusion of at least one non-metal element other than silicon and at least one metal element or silicon into metallic material surfaces
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C8/00Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals
    • C23C8/80After-treatment
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B31/00Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor
    • C30B31/02Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor by contacting with diffusion materials in the solid state
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/22Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities
    • H01L21/225Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities using diffusion into or out of a solid from or into a solid phase, e.g. a doped oxide layer
    • H01L21/2251Diffusion into or out of group IV semiconductors
    • H01L21/2254Diffusion into or out of group IV semiconductors from or through or into an applied layer, e.g. photoresist, nitrides
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Materials Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Organic Chemistry (AREA)
  • Metallurgy (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Mechanical Engineering (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Ceramic Engineering (AREA)
  • Bipolar Transistors (AREA)
  • Weting (AREA)

Abstract

844,692. Semi-conductor devices. INTERNATIONAL BUSINESS MACHINES CORPORATION. Oct. 22, 1956 [Oct. 24, 1955], No. 32157/56. Class 37. A method of making a semi-conductor device comprises the following steps; coating a surface of a semi-conductor, body with a layer of material which reacts chemically or physically with an activator impurity; heating the coated body in a vapour containing the impurity to react the impurity and layer material and to diffuse the impurity into the body to a depth which is greater beneath the layer; and then removing material from the body to a depth exceeding the depth of penetration of impurity on areas not covered by the layer but less than the penetration depth under the layer. In the embodiment indium layers 2, 3 are deposited, e.g. by vacuum evaporation through a mask, on to opposite faces of a P type germanium wafer containing indium or gallium, and the wafer then heated for 10 hours at 800‹ C. in a reducing atmosphere containing 10<SP>16</SP>-10<SP>18</SP> atoms/cc. of arsenic. As a result of this treatment an N type arsenic doped layer of the form shown in Fig. 1 is produced. A surface layer of uniform thickness is then removed from the wafer by abrading or chemical or electolytic etching to expose the P type material as shown in Fig. 2 leaving islands 6, 5 of N type material which serve as emitter and collector zones in the finished transistor. Base emitter, and collector connections 8, 7, 9 are then soldered to the body as shown. A PNP transistor is made by a similar method but using an element from Group V for the layer, and a vapour comprising an element from Group III. The greater depth of diffusion beneath the layer is thought to be due to the fact that the concentration of impurity atoms is greater in the layer than in the surrounding atmosphere and to the intimate contact between the layer and semi-conductor. The impurity vapour pressure must be well below the equilibrium vapour pressure to prevent formation of a molten surface alloy in the uncoated regions which would increase the penetration in these regions. To permit accurate control of the junction areas the layer or the product of its reaction with the vapour should remains solid during the diffusion process.
GB3215756A 1955-10-24 1956-10-22 Improvements in the formation of junctions in semiconductor bodies Expired GB844692A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US542131A US2898247A (en) 1955-10-24 1955-10-24 Fabrication of diffused junction semi-conductor devices
US73984358A 1958-06-04 1958-06-04

Publications (1)

Publication Number Publication Date
GB844692A true GB844692A (en) 1960-08-17

Family

ID=27066925

Family Applications (2)

Application Number Title Priority Date Filing Date
GB3215756A Expired GB844692A (en) 1955-10-24 1956-10-22 Improvements in the formation of junctions in semiconductor bodies
GB733759A Expired GB843168A (en) 1955-10-24 1959-03-03 Improvements in methods of producing semiconductor bodies for transistors and the like

Family Applications After (1)

Application Number Title Priority Date Filing Date
GB733759A Expired GB843168A (en) 1955-10-24 1959-03-03 Improvements in methods of producing semiconductor bodies for transistors and the like

Country Status (4)

Country Link
DE (2) DE1163458B (en)
FR (2) FR1172044A (en)
GB (2) GB844692A (en)
NL (2) NL211606A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2937114A (en) * 1959-05-29 1960-05-17 Shockley Transistor Corp Semiconductive device and method

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL99536C (en) * 1951-03-07 1900-01-01
DE885756C (en) * 1951-10-08 1953-06-25 Telefunken Gmbh Process for the production of p- or n-conducting layers
US2823149A (en) * 1953-10-27 1958-02-11 Sprague Electric Co Process of forming barrier layers in crystalline bodies
DE1040697B (en) * 1955-03-30 1958-10-09 Siemens Ag Method for doping semiconductor bodies

Also Published As

Publication number Publication date
GB843168A (en) 1960-08-04
FR1172044A (en) 1959-02-04
NL211606A (en)
FR75143E (en) 1961-03-13
DE1223814B (en) 1966-09-01
NL109064C (en)
DE1163458B (en) 1964-02-20

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